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JJG 77-2006 English PDF

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Upon your order, we will start to translate JJG 77-2006_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. The lengthier the document the longer the lead time.

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Q: Should I purchase the latest version JJG 77-2006?

Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJG 77-2006 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically.

US$549.00 · In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email.
JJG 77-2006: Verification Regulation of Interference Microscopes
Status: Valid

JJG 77: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
JJG 77-2006	549	Add to Cart	4 days	Verification Regulation of Interference Microscopes	Valid
JJG 77-1983	279	Add to Cart	3 days	Verification Regulation of Interference Microscope	Obsolete
JJG 77-1976	RFQ	ASK	3 days	(Chinese Industry Standard)	Obsolete

Similar standards

JJG 517 JJG 5 JJG 0061 JJG 59 JJG 34 JJG 82

Basic data

Standard ID: JJG 77-2006 (JJG77-2006)
Description (Translated English): Verification Regulation of Interference Microscopes
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: A52
Classification of International Standard: 11.040
Word Count Estimation: 21,275
Date of Issue: 2006-05-23
Date of Implementation: 2006-11-23
Older Standard (superseded by this standard): JJG 77-1983
Quoted Standard: JJF 1001-1998; JJF 1059-1999; JJF 1094-2002; JJG 812-1993
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine
Summary: This standard applies to two-beam interference microscope initial verification, testing and use of follow-up inspection.

JJG 77-2006: Verification Regulation of Interference Microscopes

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Verification Regulation of Interference Microscopes National Metrology Verification Regulations of the People's Republic Interference microscope Released on.2006-05-23 Implementation of.2006-11-23 The General Administration of Quality Supervision, Inspection and Quarantine issued Interferometric microscopy procedure Es Replace JJG 77-1983 This regulation was approved by the General Administration of Quality Supervision, Inspection and Quarantine on May 23,.2006, and Implemented on November 23,.2006. Focal Point. National Geometric Quantity Engineering Measurement Technology Committee Drafted by. China Institute of Metrology This regulation entrusts the National Geometric Quantity Engineering Parametric Measurement Technical Committee to explain The main drafters of this procedure. Du Hua (China Institute of Metrology) Gao Sitian (China Institute of Metrology) Participate in the drafters. Zhao Youxiang (China Institute of Metrology) Zhu Xiaoping (China Institute of Metrology)

1 Scope (1) 2 Citations (1) 3 Overview (1) 4 Metrological performance requirements (3) 4.1 Characteristics of interference filters (3) 4.2 The distance between the inner edge of the micro-drum differential tube engraved cone surface and the fixed casing engraved surface (3) 4.3 Measuring the relative position of the index line of the micro eyepiece crosshair reticle and the millimeter reticle engraving line (3) 4.4 Measure the conformity of the micrometer eyepiece micro-drum engraving line with the millimeter reticle engraving line (3) 4.5 Measuring error of micrometer eyepiece (3) 4.6 Optical System Imaging Quality (3) 4.7 Mutual position between the table and the main optical axis (4) 4.8 Characteristics of auxiliary imaging devices (4) 4.9 Instrument indication error (4) 5 General technical requirements (4) 6 measuring instrument control (5) 6.1 Verification conditions (5) 6.2 Verification project (6) 6.3 Verification method (6) 6.4 Processing of verification results (10) 6.5 Verification cycle (10) Appendix A Evaluation of Uncertainty of Interference Microscopy Indication Error Verification Results (11) Appendix B Verification Certificate and Verification Result Notice (inside page) format (16) Interferometric microscopy procedure

1 Scope

This procedure applies to the first verification, subsequent verification, and in-use inspection of a two-beam interference microscope.

2 Citations

This procedure refers to the following documents. JJF1001-1998 General measurement terms and definitions JJF1059-1999 Measurement Uncertainty Evaluation and Representation JJF1094-2002 Technical Specifications for Measuring Instrument Characteristics JJG 812-1993 Interference Filter Verification Procedure When using this procedure, care should be taken to use the current valid version of the above cited documents.

3 Overview

The interference microscope consists of an interference and microscopy system that uses the principle of light wave interference to measure surface roughness parameters. it The wavelength of the light wave in the range of (530~600) nm is used as a scale, and the measured surface is compared with a standard optical mirror. The microscopic geometry of the surface to be measured is observed and measured after high magnification of the microscope. Double beam interference display The micromirror is mainly used for the measurement of the surface roughness evaluation parameter Rz. This instrument can be used to measure the surface of precision machined parts For example, the outer surface such as plane or cylindrical surface can also be used to measure the depth of the surface of the part, such as the marking and plating. Currently used instruments The appearance is shown in Figures 1 and 2. 1-focusing drum; 2-light screen; 3-interference belt width, direction adjustment screw; 4-reference mirror fine adjustment screw; 5,6-Working table moves the micrometer in the vertical and horizontal direction; 7-Workbench; 8-light source; 9-changeable filter; 10-light; 11-micrometer eyepiece; 12-micrometer drum; 13-camera or monitor device Figure 1 Outline drawing of a commonly used interference microscope (1) ......

Image

Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of JJG 77-2006_English be delivered?

Answer: Upon your order, we will start to translate JJG 77-2006_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of JJG 77-2006_English with my colleagues?

Answer: Yes. The purchased PDF of JJG 77-2006_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.

Question 5: Should I purchase the latest version JJG 77-2006?

Answer: Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJG 77-2006 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically.