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JJF 1763-2019 English PDF

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US$579.00 · In stock
Delivery: <= 5 days. True-PDF full-copy in English will be manually translated and delivered via email.
JJF 1763-2019: Program of Pattern Evaluation of Low Background α, β Measuring Instruments
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
JJF 1763-2019	579	Add to Cart	5 days	Program of Pattern Evaluation of Low Background α, β Measuring Instruments	Valid

Similar standards

GB/T 3222.1 JJG 188 JJF 1396 JJF 2017 JJF 1927 JJF 1762

Basic data

Standard ID: JJF 1763-2019 (JJF1763-2019)
Description (Translated English): Program of Pattern Evaluation of Low Background ��, �� Measuring Instruments
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: A58
Classification of International Standard: 17.240
Word Count Estimation: 25,265
Date of Issue: 2019
Date of Implementation: 2019-12-27
Issuing agency(ies): State Administration for Market Regulation

JJF 1763-2019: Program of Pattern Evaluation of Low Background α, β Measuring Instruments

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
(Low-level α, β measuring instrument type evaluation outline) National Measurement Technical Specification of the People's Republic of China Low-level α, β measuring instrument type evaluation outline 2019-09-27 release 2019-12-27 Implementation Issued by the State Administration of Market Supervision and Administration Low-level α, β measuring instrument type evaluation outline Centralized unit. National Technical Committee on Ionizing Radiation Measurement Main drafting unit. China Institute of Testing Technology Shanghai Institute of Metrology and Testing Technology Chinese Academy of Metrology Participated in the drafting unit. Hubei Institute of Metrology and Testing Technology This specification entrusts the National Ionizing Radiation Measurement Technical Committee to interpret The main drafters of this specification. Yu Bing (China Institute of Testing Technology) Tang Fangdong (Shanghai Institute of Metrology and Testing Technology) Liang Juncheng (Chinese Academy of Metrology) Participating drafters. Shi Shuguang (Hubei Institute of Metrology and Testing Technology) He Linfeng (Shanghai Institute of Metrology and Testing Technology) Wang Wei (China Institute of Testing Technology) Dan Yujuan (China Institute of Testing Technology)

Introduction (Ⅱ) 1 Scope (1) 2 References (1) 3 Terminology (1) 3.1 Sensitive area of the detector (1) 4 Overview (1) 5 Legal management requirements (2) 5.1 Unit of measurement (2) 5.2 Requirements for measurement legal signs and measurement appliance labels (2) 6 Measurement requirements (2) 6.1 Instrument background (2) 6.2 Detection efficiency (2) 6.3 Repeatability (2) 6.4 Cross-channel ratio (2) 7 General technical requirements (2) 7.1 Appearance and structure (2) 7.2 Functional requirements (3) 7.3 Environmental adaptability (3) 8 Type evaluation item table (3) 9 Provide the number of prototypes and how to use them (4) 9.1 Number of prototypes provided (4) 9.2 How to use the prototype (4) 10 Test methods and conditions of test items, data processing and qualification criteria (4) 10.1 Measurement performance inspection (4) 10.2 Appearance, structure and functional requirements (7) 10.3 Environmental adaptability (7) 11 Table of measuring instruments and equipment used in the test project (10) 12 Judgment of type evaluation results (10) 13 Type evaluation record format (10) Appendix A Type Evaluation Record Format (11)

Introduction

This type evaluation outline is based on JJF 1015 "General Specification for Type Evaluation of Measuring Instruments" and JJF 1016 "Measuring Apparatus "Guidelines for the preparation of a typed evaluation outline" and JJF 1001 "General Measurement Terms and Definitions". The technical indicators and test methods of this type evaluation outline refer to JJG853-2013 "Low Background α, β Measurement Instrument ”, GB/T 11682“ Low Background α and/or β Measuring Instrument ”and other technical regulations. This type evaluation outline is released for the first time. Low-level α, β measuring instrument type evaluation outline

1 Scope

This type evaluation outline is applicable to the type of low background alpha and beta measuring instruments with the classification code of measuring instruments 37061500 Evaluation. This type of evaluation outline does not apply to the model of the total α and total β measuring instruments and the α and β energy spectrum measuring instruments of the proportional gas counter Evaluation.

2 Reference documents

The following documents are cited in this type evaluation outline. JJG853-2013 low background α, β measuring instrument JJF 1001 General Measurement Terms and Definitions GB/T 6587 General Specification for Electronic Measuring Instruments GB/T 11682 Low background alpha and/or beta measuring instrument GB/T 19661.1 Safety Requirements for Nuclear Instruments and Systems Part 1. General Requirements For dated reference documents, only the dated version is applicable to this type of evaluation outline; those that are not dated The latest version (including all amendments) of the cited documents is applicable to this type evaluation outline.

3 Terminology

The terms and definitions defined in JJF 1001 and JJG853-2013 and the following terms and definitions are applicable to this type review Price outline. 3.1 Sensitive areaofadetector The area of the detector that is sensitive to radiation and used for detection.

4 Overview

Low background alpha and beta measuring instruments are mainly used for measuring alpha and beta radioactivity in various samples. The instrument uses quality, The larger lead shield is used in the laboratory. The low background alpha and beta measuring instruments are mainly composed of detector unit, shielding unit, measurement and data processing unit. The detector usually uses a scintillation detector. The measurement principle is that after the alpha and beta particles in the sample enter the detector scintillator, they will All the energy is lost on the scintillation substance, causing the scintillation to glow, and the scintillation photons are accepted by the photomultiplier tube and converted to generate electricity Pressure pulse signal. The number of α and β particles entering the detector is proportional to the voltage pulse signal. When measuring, in count (rate) It is mainly displayed, and the count (rate) is directly proportional to the activity in the sample. The degree value shows the measurement result. The key components that affect the metering performance of the instrument are shown in Table 1. ......

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Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of JJF 1763-2019_English be delivered?

Answer: Upon your order, we will start to translate JJF 1763-2019_English as soon as possible, and keep you informed of the progress. The lead time is typically 3 ~ 5 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of JJF 1763-2019_English with my colleagues?

Answer: Yes. The purchased PDF of JJF 1763-2019_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.