JJF 1762-2019 English PDF

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JJF 1762-2019: Program of Pattern Evaluation of α, β Surface Contamination Monitors
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Basic data

Standard ID: JJF 1762-2019 (JJF1762-2019)
Description (Translated English): Program of Pattern Evaluation of ��, �� Surface Contamination Monitors
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: A58
Classification of International Standard: 17.240
Word Count Estimation: 26,264
Date of Issue: 2019
Date of Implementation: 2019-12-27
Issuing agency(ies): State Administration for Market Regulation

JJF 1762-2019: Program of Pattern Evaluation of α, β Surface Contamination Monitors

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Program of Pattern Evaluation of α, β Surface Contamination Monitors National Measurement Technical Specification of the People's Republic of China Outline of Type Evaluation of α and β Surface Pollution Meters 2019-09-27 release 2019-12-27 Implementation Issued by the State Administration of Market Supervision and Administration Outline of Type Evaluation of α and β Surface Pollution Meters Centralized unit. National Technical Committee on Ionizing Radiation Measurement Drafting unit. Shanghai Institute of Metrology and Testing Technology Beijing Academy of Metrology and Testing Science Shenzhen Institute of Metrology and Quality Inspection This specification entrusts the National Ionizing Radiation Measurement Technical Committee to interpret Drafters of this specification. Tang Fangdong (Shanghai Institute of Metrology and Testing Technology) He Linfeng (Shanghai Institute of Metrology and Testing Technology) Luo Chen (Beijing Institute of Metrology and Testing Science) Zhou Yingchun (Shenzhen Institute of Metrology and Quality Inspection) Xu Yihe (Shanghai Institute of Metrology and Testing Technology)

table of Contents

Introduction (Ⅱ) 1 Scope (1) 2 References (1) 3 Terms and definitions (1) 4 Overview (2) 5 Legal management requirements (2) 5.1 Unit of measurement (2) 5.2 Requirements for measurement legal signs and measurement appliance labels (2) 6 Measurement requirements (2) 6.1 Background count rate (2) 6.2 Surface emissivity response (2) 6.3 Relative inherent error (2) 6.4 Repeatability (3) 7 General technical requirements (3) 7.1 Appearance and structure (3) 7.2 Function check (3) 7.3 Environmental adaptability (3) 8 Type evaluation items (3) 9 Provide the number of prototypes and how to use them (4) 9.1 Number of prototypes provided (4) 9.2 How to use the prototype (4) 10 Test methods and conditions of test items, data processing and qualification criteria (4) 10.1 Measurement performance inspection (4) 10.2 Appearance, structure and functional requirements (7) 10.3 Environmental adaptability (7) 11 Table of measuring instruments and equipment used in the test project (8) 12 Principles for processing and judgment of type evaluation results (9) Appendix A Type Evaluation Record Format (10)

Introduction

This type evaluation outline is based on JJF 1015-2014 "General Specification for Type Evaluation of Measuring Instruments" and JJF 1016- 2014 "Guidelines for the Preparation of Outlines for Measuring Apparatus Type Evaluation", and JJF 1001-2011 "General Measurement Terms and Definitions" Written. The technical indicators and test methods of this type of evaluation outline refer to JJG478-2016 "α, β Surface Pollution Meter", GB/T 5202-2008 "radiation protection instruments α, β and α/β (β energy greater than 60keV) pollution measuring instrument and monitoring Standards and other standards. This type evaluation outline is released for the first time. Outline of Type Evaluation of α and β Surface Pollution Meters

1 Scope

This type evaluation program is applicable to the type evaluation of α, β surface contamination meters with the classification code of measuring instruments 37062000 Price test. This type of evaluation outline does not apply to fixed α, β personal surface pollution monitoring devices, and the maximum energy is less than Or equal to 60keV beta particle measuring or monitoring equipment type evaluation test.

2 Reference documents

The following documents are cited in this type evaluation outline. JJG478-2016 α, β surface pollution meter JJF 1001-2011 General Measurement Terms and Definitions JJF 1015-2014 General Specification for Type Evaluation of Measuring Instruments JJF 1016-2014 Compilation Rules for Type Evaluation Outline of Measuring Instruments GB/T 5202-2008 Radiation protection instruments α, β and α/β (β energy greater than 60keV) pollution measuring instruments and Monitor GB/T 6587-2012 General specification for electronic measuring instruments GB/T 19661.1-2005 Safety requirements for nuclear instruments and systems Part 1.General requirements For dated reference documents, only the dated version is applicable to this type of evaluation outline; those that are not dated The latest version (including all amendments) of the cited documents is applicable to this type evaluation outline.

3 Terms and definitions

The terms and definitions defined in JJF 1001-2011 and the following apply to this type of evaluation outline. 3.1 background Signals not due to the physical quantity to be measured. 3.2 backgroundcountrate In the absence of the measured sample, the unit counts per unit time. Note. These counts come from cosmic rays, radioactive material in the surrounding environment, and electronic noise. 3.3 [Source] surface emission rate In a unit time, the specific type and energy emitted from the source front surface (2π · sr spherical degree) exceed a specific value Number of particles. 3.4 surface emissivity response Under certain conditions, the response characteristic of the measuring instrument or device (system) to the excitation is called the response. The quotient of the indicator value and the excitation quantity. When the magnitude of the radioactive source is expressed as surface emissivity, it is called surface emissivity response. 3.5 relative intrinsic error Under the specified reference conditions, when exposed to the specified reference radiation, the relative error of the instrument's indicated value. ......

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