Home Cart Quotation About-Us
www.ChineseStandard.net
SEARCH

JJF 1351-2012 English PDF

Q: How long will the true-PDF of English version of JJF 1351-2012 be delivered?

Upon your order, we will start to translate JJF 1351-2012_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.

Q: Can I share the purchased PDF of JJF 1351-2012_English with my colleagues?

Yes. The purchased PDF of JJF 1351-2012_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Q: Does the price include tax/VAT?

Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries). Avoidance of Double Taxation Agreements (DTAs) between Singapore and 100+ Countries: https://www.iras.gov.sg/taxes/international-tax

Q: Do you accept my currency other than USD?

Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.

Q: Should I purchase the latest version JJF 1351-2012?

Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJF 1351-2012 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically.

US$399.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email.
JJF 1351-2012: Calibration Specification for Scanning Probe Microscopes
Status: Valid

JJF 1351: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
JJF 1351-2012	399	Add to Cart	3 days	Calibration Specification for Scanning Probe Microscopes	Valid
JJF 1351-1990	199	Add to Cart	2 days	O.T.N. or Primary Standard for 14.8MeV Neutron Absorbed Dose	Obsolete

Similar standards

JJF 1561 JJF 1406 JJF 1280 JJF 1347 JJF 1349 JJF 1345

Basic data

Standard ID: JJF 1351-2012 (JJF1351-2012)
Description (Translated English): Calibration Specification for Scanning Probe Microscopes
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: A52
Classification of International Standard: 17.040
Word Count Estimation: 17,127
Quoted Standard: JJF 1001-2011; GB/T 19067.1-2003
Regulation (derived from): AQSIQ Announcement No. 96 of 2012
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine
Summary: This standard applies to the geometric surface morphology of the measurement object scanning probe microscope calibration. Scanning probe microscope according to its design principles are different, according to the actual situation calibration select the

JJF 1351-2012: Calibration Specification for Scanning Probe Microscopes

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Scanning Probe Microscopes People's Republic of China National Metrology Technical Specifications Scanning probe microscope calibration specification Issued on. 2012-06-18 2012-09-18 implementation The State Administration of Quality Supervision, Inspection and Quarantine released SPM Calibration Specification es Focal point. the National Technical Committee of length measuring geometry The main drafting units. China Aviation Industry Corporation Beijing Great Wall Measurement and Testing Technology Research Institute Shanghai Measurement and Testing Technology Research Institute Guizhou Academy of Metrology Participated in the drafting unit. China Institute of Metrology This specification length measuring geometry commissioned the National Technical Committee is responsible for interpretation The main drafters of this specification. Zhu Zhenyu (China Aviation Industry Corporation Beijing Great Wall Measurement and Testing Technology Institute The study) Ren Dongmei (China Aviation Industry Corporation Beijing Great Wall Measurement and Testing Technology Institute The study) Fuyun Xia (Shanghai Institute of Measurement and Testing) Li Yuan (Shanghai Institute of Measurement and Testing) Lv Xiaojie (Guizhou Metrology Institute) Drafters participate. Luming Zhen (China Institute of Metrology) Lihua Feng (China Aviation Industry Corporation Beijing Great Wall Measurement and Testing Technology Institute The study)

Introduction (Ⅱ) 1 Scope (1) 2. References (1) 3 Terms and Definitions (1) 3.1 a scanning probe microscope (1) 3.2 SPM Z drift (1) 4 Overview (1) 5 Metrological characteristics (2) 5.1 Z drift scanning probe microscope (2) 5.2 X, Y-axis displacement measurement error (2) 5.3 Z-axis displacement measurement error (2) 5.4 scanning probe microscope measurement repeatability (2) 5.5 X, Y coordinates of the orthogonality errors (2) Calibration Condition 6 (2) 6.1 environmental conditions (2) 6.2 Standard (2) 7 calibration items and calibration methods (3) 7.1 Z drift scanning probe microscope (3) 7.2 X, Y-axis displacement measurement error (4) 7.3 Z-axis displacement measurement errors (5) 7.4 scanning probe microscope measurement repeatability (6) 7.4.1 X, Y-axis measurement repeatability (6) 7.4.2 Z-axis measurement repeatability (6) 7.5 X, Y coordinates of the orthogonality errors (6) 8 calibration results expression (7) 9 Recalibration interval (7) Measurement Uncertainty Appendix A scanning probe microscope calibration results assessment (8)

Introduction

The specification for the initial release. Development of this specification is intended primarily to solve the industrial calibration in scanning probe microscopy ask question. Specifications prepared in reference to some theoretical research on nano-metrology in the field of international and measured actual nano Work some experimental data as a basis for developing this specification. Scanning probe microscope calibration specification

1 Scope

This specification is applicable to the geometric surface topography measurement object scanning probe microscope calibration. Scanning probe microscope according to its different design principles need to select the particular measurement calibration according to the actual situation Sex. There are special requirements for measuring tasks, such as high measurement traceability requirements, the scope of the calibration is not standardized. 2. References This specification references the following documents. JJF 1001-2011 common measurement terms and definitions GB/T 19067.1-2003 Geometrical product specifications (GPS) Surface texture measurement standard outline Associate - Part 1. Physical measurement standards For dated references, only the dated edition applies to this specification; undated reference documents Member, the latest edition (including any amendments) applies to this specification.

3 Terms and Definitions

3.1 scanning probe microscopy scanningprobemicroscope (SPM) Having a scanning probe microscope measurement function collectively. Mainly containing an atomic force microscope (AFM), scanning tunneling Road microscope (STM) and the like. 3.2 SPM Z drift SPMZ-directiondrift Z scanning probe microscope to measure the drift point measurement.

4 Overview

Scanning probe microscope with high resolution, real-time, in-situ imaging features. The samples without special requirements, without Drying of the sample, shape, hardness, purity and other restrictions, in the atmosphere, the environment and even the solution at room temperature imaging. wide Pan used in nanotechnology, materials science, physics, chemistry and life sciences fields. 1 SPM typical structure example of FIG. 1- probe; 2- measurement sample; 3- Workbench ......

Image

Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of JJF 1351-2012_English be delivered?

Answer: Upon your order, we will start to translate JJF 1351-2012_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of JJF 1351-2012_English with my colleagues?

Answer: Yes. The purchased PDF of JJF 1351-2012_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.

Question 5: Should I purchase the latest version JJF 1351-2012?

Answer: Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJF 1351-2012 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically.