JJF 1331-2011 English PDFUS$529.00 · In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email. JJF 1331-2011: Calibration Specification for Inductive Micrometers Status: Valid JJF 1331: Historical versions
Basic dataStandard ID: JJF 1331-2011 (JJF1331-2011)Description (Translated English): Calibration Specification for Inductive Micrometers Sector / Industry: Metrology & Measurement Industry Standard Classification of Chinese Standard: A52 Classification of International Standard: 17.040 Word Count Estimation: 23,268 Date of Issue: 2011-12-28 Date of Implementation: 2012-06-28 Older Standard (superseded by this standard): JJG 396-2002 Quoted Standard: GB/T 26094-2010; GB/T 26095-2010; GB/T 26097-2010 Regulation (derived from): AQSIQ Announcement No. 205 of 2011 Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine Summary: This standard applies to resolution (scale value) (0. 01 ~ 10) ��m, nominal range (-1 000 ~ +1000) ��m inductance micrometer calibration. JJF 1331-2011: Calibration Specification for Inductive Micrometers---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.Calibration Specification for Inductive Micrometers People's Republic of China National Metrology Technical Specifications Inductance Sensor Calibration Specification Issued on. 2011-12-28 2012-06-28 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Inductance Sensor Calibration Specification Instead of JJG396-2002 NFP. National Engineering Geometrical Parameters Measurement Technology Committee Main drafting unit. Henan Institute of Metrology Participated in the drafting unit. Meter Zhongyuan Ltd. Liaoning Provincial Institute of Metrology Shanghai Measurement and Testing Technology Research Institute This specification project commissioned by the National geometric parameter measurement technology committee responsible for the interpretation The main drafters of this specification. Huang Yuzhu (Henan Institute of Metrology) Gu Xiaojie (Henan Institute of Metrology) Fannai Yin (Henan Institute of Metrology) Drafters participate. YU Zhen River (Central China Measuring Instruments Co., Ltd.) Shizuo De (Liaoning Provincial Institute of Metrology) Advantages and Disadvantages (Shanghai Institute of Measurement and Testing) table of ContentsIntroduction (Ⅱ) 1 Scope (1) 2. References (1) 3 Terms (1) 4 Overview (1) 5 Metrological characteristics (2) 5.1 Zero balance (2) Drift 5.2 (2) 5.3 Indication variability (2) 5.4 Axial probe spindle influence the radial force of the indicated value (2) 5.5 load and load change (2) 5.6 Indication error (2) 5.7 "and" and "poor" calculation error indication (3) 6 calibration conditions (3) Environmental conditions 6.1 (3) 6.2 calibration equipment (3) 7 calibration items and calibration methods (3) 7.1 calibration items (3) 7.2 Calibration method (3) Expression 8 calibration results (8) 9 Recalibration interval (8) Appendix A pairing method calibration indication error calculation example (9) Evaluation of Uncertainty Appendix B 0.01μm digital gear inductors micrometer indication error measurement result (10) Appendix C 0.1μm gear number of explicit inductance micrometer Error in Measurement of Uncertainty Evaluation (13) Appendix D calibration certificate content and in-page format (16)IntroductionJJF 1071-2010 "National Calibration Specifications writing rules", JJF 1001-1998 "common terminology and measurement Definitions ", JJF 1059-1999" Evaluation and Expression of Uncertainty in Measurement ", JJF 1094-2002" measuring instrument characteristics Assessment ", JJG396-2002" inductance micrometer "constitute support calibration specification revision of the basic series specification. Compared with JJG396-2002 "inductance micrometer", in addition to editorial changes, the major technical changes to this specification as follows. --- The calibration specifications to test procedures be revised; --- Abolition of the "discrimination", "response time" metrological characteristics requirements; --- Calibration method "load" requirements of the metrological characteristics have been modified to increase the load changing requirements; --- Will "show the value of stability," the description to "drift", modified digital Inductance Sensor drift technology index; --- Original procedure with the same amount of 2 blocks pairing method or the direct method of calibration error indication to the amount of the block (or 2, etc. 3, etc.); --- Added Appendix B, C, D. The previous versions of the release JJG396-2002 case. --- JJG396-1985, JJG804-1993. Inductance Sensor Calibration Specification1 ScopeThis standard applies to the resolution (division value) (0.01 ~ 10) μm, nominal range (-1000 ~ 1000) μm Inductance Sensor Calibration. 2. References GB/T 26094-2010 inductance micrometer GB/T 26095-2010 electronic column inductance micrometer GB/T 26097-2010 Digital inductance micrometer For dated references, only the dated edition applies to this specification; undated reference documents Member, the latest edition (including any amendments) applies to this specification.3 Terms3.1 Zero balance zerobalance When converting inductance micrometer range gear, the consistency of each block shown zero value. 3.2 Indication variability thevariationindication Under the same measurement conditions, the measurement was performed on the same instrument repeatedly measuring the maximum difference between the results.4 OverviewInductance micrometer is a measure of the amount of displacement of small highly accurate measuring instruments, which consists of axial or next to the inductor sensing Is (probes) to convert the displacement amount into an electrical signal by the display means to be displayed measured. Press significant inductance micrometer The display device is divided into several different explicit, electronic pointer and column three types. Its shape shown in Figure 1, Figure 2, Figure 3. Figure 1 Digital inductors micrometer 1- digital meter; 2 - measurement function selection switch; 3 - Range selector switch; 4- magnification adjustment knob; 5- zero adjustment knob; 6- axial probe2 Analog inductance micrometer1- pointer; 2- indicator; 3- magnification adjustment knob; 4- range switch; 5- measurement function selection switch; 6- axial probe ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of JJF 1331-2011_English be delivered?Answer: Upon your order, we will start to translate JJF 1331-2011_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. 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Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.Question 5: Should I purchase the latest version JJF 1331-2011?Answer: Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJF 1331-2011 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically. |