JJF 1254-2010 English PDFUS$299.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. JJF 1254-2010: Calibration specification for height measuring instrument with digital display Status: Valid JJF 1254: Historical versions
Basic dataStandard ID: JJF 1254-2010 (JJF1254-2010)Description (Translated English): Calibration specification for height measuring instrument with digital display Sector / Industry: Metrology & Measurement Industry Standard Classification of Chinese Standard: A52 Classification of International Standard: 17.040 Word Count Estimation: 13,198 Date of Issue: 2010-05-11 Date of Implementation: 2010-11-11 Older Standard (superseded by this standard): JJG 929-1998 Quoted Standard: JJF 1001-1998; JJF 1094-2002; JJF 1130-2005; GB/T 22094-2008 Regulation (derived from): AQSIQ Announcement No. 50 of 2010 Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine Summary: This standard applies to resolution 0. 1��m, 0. 2��m, 0. 5��m and 1��m, range 0 mm to 1000 mm of digital altimeter calibration. JJF 1254-2010: Calibration specification for height measuring instrument with digital display---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.Calibration specification for height measuring instrument with digital display People's Republic of China National Metrology Technical Specifications Digital altimeter calibration specification Issued on. 2010-05-11 2010-11-11 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Digital altimeter calibration specification Instead of JJG929-1998 This specification by the State Administration of Quality Supervision, Inspection and Quarantine approved on May 11, 2010, and from From November 11, 2010 into effect. NFP. National Engineering Geometrical Parameters Measurement Technology Committee Main drafting unit. Institute of Optoelectronics Research Institute Participated in the drafting unit. China Testing Technology Research Institute This specification by the National Engineering Geometrical parameter measurement technology committee responsible for the interpretation The main drafters of this specification. Kuang Long (Institute of Optoelectronic Technology Institute) Geng Lihong (Chinese Academy of Sciences photoelectric Institute of Technology) Caoxue Dong (Institute of Optoelectronic Technology Institute) Drafters participate. Ran Qing (China Testing Technology Research Institute) table of Contents1 Scope (1) 2. Referenced Documents (1) 3 Overview (1) 4 Metrological characteristics (2) Measuring force 4.1 (2) 4.2 verticality (2) 4.3 Indication variability (2) 4.4 Indication error (2) Calibration Condition 5 (2) 5.1 environmental conditions (2) 5.2 Measurement standard device and other equipment (3) 6 calibration items and calibration methods (3) Measuring force 6.1 (3) 6.2 verticality (3) 6.3 Indication variability (4) 6.4 Indication Error (4) 7 Calibration Results The expression (4) 8 Recalibration interval (4) Appendix A digital altimeter indication error of measurement Uncertainty Evaluation (5) Appendix B calibration certificate contents (8) Digital altimeter calibration specification1 ScopeThis instruction applies to resolution of 0.1μm, 0.2μm, 0.5μm and 1μm, Range 0mm to 1000mm The digital altimeter calibration.2 CitationsThis specification references the following documents. JJF 1001-1998 common measurement terms and definitions JJF 1094-2002 measuring instrument characteristics evaluation JJF 1130-2005 geometric measurement equipment calibration Uncertainty Evaluation Guide GB/T 22094-2008 electronic digital altimeter When using this specification it should be noted that using the currently valid version of the documents cited.3 OverviewDigital altimeter is based on a single vertical coordinate digital geometric precision machinery, modern sensor technology and electronic technology Measuring instruments, used to measure the distance between the parallel plane, bore and shaft diameter, center distance and the related form and position errors. its Shape structure shown in Figure 1.1 digital altimeter shape structure schematic diagram1- column; 2 - control and monitor; 3- measuring carriage; 4- probe; 5- base ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of JJF 1254-2010_English be delivered?Answer: Upon your order, we will start to translate JJF 1254-2010_English as soon as possible, and keep you informed of the progress. 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Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.Question 5: Should I purchase the latest version JJF 1254-2010?Answer: Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJF 1254-2010 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically. |
