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JJF 1252-2010 English PDF

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Upon your order, we will start to translate JJF 1252-2010_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. The lengthier the document the longer the lead time.

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Q: Should I purchase the latest version JJF 1252-2010?

Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJF 1252-2010 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically.

US$489.00 · In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email.
JJF 1252-2010: Calibration specification for measuring instrument for laser paralleism of micrometers
Status: Valid

JJF 1252: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
JJF 1252-2010	489	Add to Cart	4 days	Calibration specification for measuring instrument for laser paralleism of micrometers	Valid
JJF 1252-1990	199	Add to Cart	2 days	O.T.C. of the Primary Standard for the Micro-hardness	Obsolete

Similar standards

JJG 1114 JJF 1280 JJF 1126 JJF 1258 JJF 1251 JJF 1242

Basic data

Standard ID: JJF 1252-2010 (JJF1252-2010)
Description (Translated English): Calibration specification for measuring instrument for laser paralleism of micrometers
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: A52
Classification of International Standard: 17.040
Word Count Estimation: 21,249
Date of Issue: 2010-05-11
Date of Implementation: 2010-11-11
Older Standard (superseded by this standard): JJG 828-1993
Quoted Standard: JJF 1001-1998; JJF 1094-2002; JJF 1088-2002; JJF 1130-2005; JJG 21-2008
Regulation (derived from): AQSIQ Announcement No. 50 of 2010
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine
Summary: This standard applies to parallel laser micrometer inspection instrument calibration.

JJF 1252-2010: Calibration specification for measuring instrument for laser paralleism of micrometers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration specification for measuring instrument for laser paralleism of micrometers People's Republic of China National Metrology Technical Specifications Laser micrometer parallel tester calibration specification Issued on. 2010-05-11 2010-11-11 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Laser micrometer parallel tester calibration specification Instead of JJG828-1993 This specification by the State Administration of Quality Supervision, Inspection and Quarantine approved on May 11, 2010, and from From November 11, 2010 into effect. NFP. National Engineering Geometrical Parameters Measurement Technology Committee Main drafting unit. Tianjin Institute of Metrological Supervision Inspection Participated in the drafting. Zigong Dongfang Boiler (Group) Co., Ltd. China Shipbuilding Industry Wuhan Integrated Metrology and Inspection Station This specification by the National Engineering Geometrical parameter measurement technology committee responsible for the interpretation The main drafters of this specification. Liu Jiali (Tianjin Supervision and Inspection Institute of Metrology) Luray Jun (Tianjin Supervision and Inspection Institute of Metrology) Tian Yong (Tianjin Supervision and Inspection Institute of Metrology) Drafters participate. Chen Yongling (Zigong Dongfang Boiler (Group) Co., Ltd.) Mei Lijiang (China Shipbuilding Industry Wuhan Integrated Metrology and Inspection Station)

1 Scope (1) 2. Referenced Documents (1) 3 Overview (1) 4 Metrological characteristics (2) 4.1 Indication error activity scale (2) 4.2 scale activity center of rotation and offset tolerances center of the circle (2) 4.3 Indication error (2) 4.4 Measurement repeatability (2) Calibration Condition 5 (2) 5.1 environmental conditions (2) 5.2 Calibration standard device and other equipment (3) 6 calibration items and calibration methods (3) 6.1 Indication error activity scale (3) 6.2 Activity ruler rotational center of the center of the circle tolerance offset (3) 6.3 Indication Error (4) 6.4 Measurement repeatability (5) 7 Calibration Results The expression (6) 8 recalibration intervals (6) Appendix A laser micrometer parallel tester indication error measurement Uncertainty Evaluation (7) Appendix B with indexing is 1 "from the collimator test parallelism Calibrator indication error example of data processing (13) Appendix CD, d value and the mask at the event scale conversion table (14) Appendix D calibration certificate contents (16) Laser micrometer parallel tester calibration specification

1 Scope

This instruction applies to parallel laser micrometer to check the calibration.

2 Citations

This specification references the following documents. JJF 1001-1998 common measurement terms and definitions JJF 1094-2002 measuring instrument characteristics evaluation JJF 1088-2002 outside micrometer (measuring range 500mm ~ 3000mm) calibration specification JJF 1130-2005 geometric measurement equipment calibration Uncertainty Evaluation Guide JJG21-2008 micrometer When using this specification it should be noted that using the currently valid version of the documents cited.

3 Overview

Laser micrometer parallel tester (referred to as the parallel tester) is the use of laser interference principle, outside micrometer measurements Micrometer (measuring range 150mm ~ 2000mm) measured parallel to the surface of the two special instruments. Instrument through an optical system The laser emits light irradiation were measured in two micrometer measuring surface successively formed on the mask at two interference Ring, two sets of interference by measuring the distance from the center of the ring to determine the measured two micrometer measuring surface parallelism. Instruments schematic outline Figure 1, the optical instrument system diagram shown in Figure 2. Figure 1 a schematic outline parallel tester 1- fixed mirrors; 2- mask at; 3-D feet; 4- movable mirror; 5- table; 6-d feet; 7- standard prisms; 8- measured outside micrometer; 9- Laser ......

Image

Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of JJF 1252-2010_English be delivered?

Answer: Upon your order, we will start to translate JJF 1252-2010_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of JJF 1252-2010_English with my colleagues?

Answer: Yes. The purchased PDF of JJF 1252-2010_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.

Question 5: Should I purchase the latest version JJF 1252-2010?

Answer: Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version JJF 1252-2010 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically.