JJF 1160-2006 English PDF

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JJF 1160-2006: Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
JJF 1160-2006	369	Add to Cart	3 days	Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System	Valid

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Basic data

Standard ID: JJF 1160-2006 (JJF1160-2006)
Description (Translated English): Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: A56
Classification of International Standard: 17.220
Word Count Estimation: 14,182
Date of Issue: 12/8/2006
Date of Implementation: 2007-03-08
Quoted Standard: JJF 1059-1999
Regulation (derived from): AQSIQ Announcement No. 187 of 2006
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine
Summary: This standard applies to test clock frequencies less than 10MHz, no time measuring unit small and medium scale digital integrated circuit test equipment calibration.

JJF 1160-2006: Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System National Metrology Technical Specification of the People's Republic Small and medium scale digital integrated circuits Test equipment calibration specification Released on.2006-12-08 2007-03-08 implementation The General Administration of Quality Supervision, Inspection and Quarantine issued Small and medium scale digital integrated circuits Test equipment calibration specification This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on December 8,.2006, and Implemented on March 8,.2007. Focal Point. National Radio Measurement Technology Committee Drafting unit. Institute of Electronics Industry Standardization, Ministry of Information Industry This specification is interpreted by the National Radiometric Technical Committee. The main drafters of this specification. Chen Dawei (Institute of Electronics Industry Standardization, Ministry of Information Industry) Wu Jingyan (Institute of Electronics Industry Standardization, Ministry of Information Industry) Participate in the drafters. Zhou Xu (Institute of Electronics Industry Standardization, Ministry of Information Industry) Wang Wei (Institute of Electronics Industry Standardization, Ministry of Information Industry)

table of Contents

1 Scope (1) 2 Citations (1) 3 Overview (1) 4 Measurement characteristics (1) 4.1 Device Power (1) 4.2 Precision Measurement Unit (1) 4.3 drive unit (2) 4.4 Comparison unit (2) 5 Calibration conditions (2) 5.1 Environmental conditions (2) 5.2 Measurement standards and other equipment (2) 6 Calibration items and calibration methods (2) 6.1 Equipment normality and device logic test functional check (2) 6.2 Device Power (DPS) Setting Voltage Parameter Calibration (2) 6.3 Device Power (DPS) Current Measurement Parameter Calibration (3) 6.4 Precision Measurement Unit (PMU) plus voltage measurement current parameter calibration (4) 6.5 Precision Measurement Unit (PMU) plus current measurement voltage parameter calibration (5) 6.6 Drive unit voltage setting parameter calibration (6) 6.7 Comparison unit voltage measurement parameter calibration (6) 7 Expression of calibration results (7) 8 re-study interval (7) Appendix A Format of Internal and Small-Scale Digital Integrated Circuit Test Equipment Calibration Certificate (8) Small and medium-sized digital integrated circuit test equipment calibration specification

1 Scope

This specification applies to small and medium-sized digital integration with a test clock frequency of less than 10 MHz and no time measurement unit. Circuit test equipment calibration.

2 Citations

JJF 1059-1999 "Measurement and Expression of Measurement Uncertainty" Note. When using this specification, care should be taken to use the current valid version of the above cited documents.

3 Overview

Small and medium-sized digital integrated circuit test equipment test objects are small and medium-sized digital integrated circuit devices. Simple Logic function check and general DC parameter test capability. Device structure is relatively large-scale digital integrated circuit test equipment The statement is relatively simple and does not have the ability to measure time parameters. Its main structure consists of device power supply, precision measurement unit, drive/comparison unit and control unit. Its structure The schematic is shown in Figure 1. Figure 1 Schematic diagram of the structure of small-scale digital integrated circuit test equipment This specification examines small and medium-sized digital integrated circuit test equipment through sub-parameter calibration and standard sample comparison check. Line calibration to ensure traceability of its magnitude.

4 Measurement characteristics

4.1 Device Power Supply 4.1.1 Device Power Supply Voltage Setting Range. -40V~ 40V 4.1.2 Device Power Current Measurement Range. -500mA~ 500mA 4.2 Precision Measurement Unit 4.2.1 PMU pressurized flow measurement range. -20V~ 20V; -100mA~ 100mA ......

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