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Delivery: <= 7 days. True-PDF full-copy in English will be manually translated and delivered via email. GBZ17626.33-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters Status: Valid
Basic dataStandard ID: GB/Z 17626.33-2023 (GB/Z17626.33-2023)Description (Translated English): Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters Sector / Industry: National Standard Classification of Chinese Standard: L06 Classification of International Standard: 33.100.10, 33.100.20 Word Count Estimation: 56,523 Date of Issue: 2023-05-23 Date of Implementation: 2024-06-01 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GBZ17626.33-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. GB /Z 17626:33-2023: Electromagnetic Compatibility Test and Measurement Techniques Part 33: Measurement Methods of High Power Transient Parameters ICS 33:100:01;33:100:20 CCSL06 National Standardization Guidance Technical Document of the People's Republic of China Electromagnetic Compatibility Test and Measurement Technology Part 33: Measurement methods of high power transient parameters Released on 2023-05-23 2024-06-01 Implementation State Administration for Market Regulation Released by the National Standardization Management Committee table of contentsPreface III Introduction V 1 Scope 1 2 Normative references 1 3 Terms and Definitions 2 4 Measurement of High Power Transient Response 3 4:1 Overall measurement concept and requirements 3 4:2 Expression of measured responses5 4:3 Measuring instruments 5 4:4 Measurement procedure 16 5 Measurement of low frequency response 16 6 Calibration procedure 16 6:1 Calibration of the entire measuring channel 16 6:2 Individual calibration of measuring channel units 18 6:3 Approximate Calibration Techniques 22 Appendix A (Normative) Description of Measured Response Characteristics 25 Appendix B (Informative) Characteristics of Measuring Sensors 29 Appendix C (Normative) HPEM measurement procedure 40 Appendix D (informative) Two-port representation of measurement link unit 42 Reference 47 Figure 1 Example of a typical measurement chain for measuring high power transient response4 Figure 2 Example of a balanced sensor and cable connected to an unbalanced (coaxial) line8 Figure 3 Examples of several simple baluns9 Figure 4 Typical circuit for measuring in-line attenuators in a link9 Figure 5 Example of typical attenuation (as a function of frequency) of an attenuator rated at 20dB for a 50Ω system 10 Figure 6 Typical circuit diagram of series integrator 10 Figure 7 Transfer function of the integrating circuit11 Figure 8 Example of signal transmission characteristics per unit length of standard and semi-refined coaxial cables as a function of frequency12 Figure 9 Example of sensor cable routing in an area free of electromagnetic fields13 Fig: 10 Handling of sensor cables in areas with electromagnetic fields 14 Figure 11 Topology for adapting cables to partial shielding of the system15 Figure 12 Right and wrong way to route cables15 Figure 13 A double-ended TEM cell for sensor calibration providing uniform field illumination17 Figure 14 Schematic diagram of a single-ended TEM cell and its connected equipment 17 Figure 15 Dimensions of small-scale test equipment used to calibrate sensors Figure 18 Figure 16 Electrical schematic diagram of the measuring chain 19 Figure 17 Schematic diagram of a simple electric field sensor 20 Figure 18 The characteristic curve 21 of the real and imaginary parts of the input impedance of the electric field sensor given in Figure 17 Figure 19 The amplitude-frequency characteristic curves of the short-circuit current flowing into the sensor terminal for different incident angles calculated according to the antenna analysis program 21 Figure 20 The change curve of the amplitude of the equivalent height of the sensor to different incident angles 22 Figure 21 High frequency equivalent circuit of the attenuator 24 Figure A:1 Schematic diagram of different parameters used to define the impulse part of the transient response waveform R(t) 25 Figure A:2 Schematic diagram of oscillatory waves appearing in high-power transient electromagnetic measurements 26 Figure A:3 Calculated spectral magnitude of the waveform in Figure A:228 Figure B:1 Schematic diagram of a simple electric field sensor and its Norton equivalent circuit 29 Figure B:2 Amplitude-frequency phase-frequency characteristics of the normalized frequency function of the field sensor 30 Figure B:3 Schematic diagram of a simple magnetic field sensor and its Thevenin equivalent circuit 31 Figure B:4 Schematic diagram of an electric field sensor placed on the ground to measure the vertical electric field or surface charge density 33 Figure B:5 Schematic diagram of the sensor for measuring the tangential component of the magnetic field or the surface current density semi-ring magnetic induction intensity sensor 33 Figure B:6 Simplified schematic diagram for measuring line current 35 Figure B:7 Detailed construction of the current sensor 35 Figure B:8 Impedance amplitude characteristic curve of nominal 1Ω current sensor 36 Figure B:9 Geometry of embedded differential current sensors 37 Figure B:10 Coaxial cable current sensor design concept 37 Figure B:11 Shape and Dimensions of CIP-10 Coaxial Cable Current Sensor 38 Figure B:12 Schematic diagram of the structure of the differential coaxial cable current sensor 38 Figure D:1 The voltage-current relationship of a general two-port network 42 Figure D:2 Voltage and current definition of chain parameters 43 Figure D:3 Cascading of two two-port networks 43 Figure D:4 Simple measurement link represented by a matrix of link parameters44 Figure D:5 Simple equivalent circuit of the measurement chain 44 Figure D:6 Simple two-port network modeled by chain parameters44 Table A:1 Example of waveform P norm 26 Table A:2 Time-domain waveform norms for high-power transient waveforms 26 Table D:1 Chain parameters for simple circuits 45forewordThis document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules for Standardization Documents" drafting: This document is part 33 of GB/T (Z) 17626 "Electromagnetic Compatibility Test and Measurement Technology": GB/T (Z) 17626 has been issued the following sections: ---GB/T 17626:1-2006 Electromagnetic Compatibility Test and Measurement Technology Immunity Test General; ---GB/T 17626:2-2018 Electromagnetic Compatibility Test and Measurement Technology Electrostatic Discharge Immunity Test; ---GB/T 17626:3-2016 Electromagnetic Compatibility Test and Measurement Technology Radio Frequency Electromagnetic Field Radiation Immunity Test; ---GB/T 17626:4-2018 Electromagnetic Compatibility Test and Measurement Technology Electrical Fast Transient Burst Immunity Test; ---GB/T 17626:5-2019 Electromagnetic compatibility test and measurement technology surge (shock) immunity test; ---GB/T 17626:6-2017 Electromagnetic Compatibility Test and Measurement Technology Conducted Disturbance Immunity of Radio Frequency Field Induction; ---GB/T 17626:7-2017 Electromagnetic Compatibility Test and Measurement Technology Power Supply System and Connected Equipment Harmonics and Interharmonics Measurement Guidelines for quantities and measuring instruments; ---GB/T 17626:8-2006 Electromagnetic Compatibility Test and Measurement Technology Power Frequency Magnetic Field Immunity Test; ---GB/T 17626:9-2011 Electromagnetic Compatibility Test and Measurement Technology Pulse Magnetic Field Immunity Test; ---GB/T 17626:10-2017 Electromagnetic Compatibility Test and Measurement Technology Damped Oscillating Magnetic Field Immunity Test; ---GB/T 17626:11-2023 Electromagnetic Compatibility Test and Measurement Technology Part 11: For each phase input current less than or equal Immunity tests for voltage dips, short interruptions and voltage changes for 16A equipment; ---GB/T 17626:12-2023 Electromagnetic compatibility test and measurement technology Part 12: Ring wave immunity test; ---GB/T 17626:13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and power grid signal No: low frequency immunity test; ---GB/T 17626:14-2005 Electromagnetic Compatibility Test and Measurement Technology Voltage Fluctuation Immunity Test; ---GB/T 17626:15-2011 Electromagnetic compatibility test and measurement technology scintillator function and design specifications; ---GB/T 17626:16-2007 Electromagnetic Compatibility Test and Measurement Technology 0Hz~150kHz Common Mode Conducted Disturbance Immunity test; ---GB/T 17626:17-2005 Electromagnetic compatibility test and measurement technology DC power input port ripple immunity test; ---GB/T 17626:18-2016 Electromagnetic Compatibility Test and Measurement Technology Damped Oscillatory Wave Immunity Test; ---GB/T 17626:19-2022 Electromagnetic Compatibility Test and Measurement Technology Part 19: AC Power Port 2kHz~ 150kHz differential mode conduction disturbance and communication signal immunity test ---GB/T 17626:20-2014 Electromagnetic Compatibility Test and Measurement Technique Transverse Electromagnetic (TEM) Waveguide Emission and Immunity degree test; ---GB/T 17626:21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method; ---GB/T 17626:22-2017 Electromagnetic Compatibility Test and Measurement Technology Radiated Emission and Immunity in Fully Anechoic Chamber Measurement; ---GB/T 17626:24-2012 Electromagnetic Compatibility Test and Measurement Technology HEMP Conducted Disturbance Protection Device Test method; ---GB/T 17626:27-2006 Electromagnetic Compatibility Test and Measurement Technology Three-phase Voltage Unbalance Immunity Test; ---GB/T 17626:28-2006 Electromagnetic Compatibility Test and Measurement Technology Power Frequency Frequency Change Immunity Test; ---GB/T 17626:29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage sag, short-term Immunity test for interruption and voltage change; ---GB/T 17626:30-2012 Electromagnetic compatibility test and measurement technology power quality measurement method; ---GB/T 17626:31-2021 Electromagnetic Compatibility Test and Measurement Technology Part 31: AC Power Port Broadband Conduction Disturbance immunity test; ---GB/T 17626:34-2012 Electromagnetic compatibility test and measurement technology for equipment with main power supply current greater than 16A per phase Voltage dips, short interruptions and voltage variations immunity tests: This document is equivalent to IEC 61000-4-33:2005 "Electromagnetic Compatibility (EMC) Part 4-33: Test and measurement techniques for high power Transient Parameter Measurement Methods”: The document type is adjusted from the IEC standard to the national standardization guiding technical document of our country: The following minimal editorial changes have been made to this document: --- In order to maintain unity with the name of the standard system, the name of the standard is changed to "Electromagnetic Compatibility Testing and Measurement Technology Part 33: High Power Transient Parameter Measurement Method”: Please note that some contents of this document may refer to patents: The issuing agency of this document assumes no responsibility for identifying patents: This document is proposed and managed by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246): This document is drafted by: China Electric Power Research Institute Co:, Ltd:, State Grid Jiangsu Electric Power Co:, Ltd:, State Grid Co:, Ltd: High Voltage Construction Branch, Shenzhen Power Supply Bureau Co:, Ltd:, North China Electric Power University: The main drafters of this document: Zhang Jiangong, Gan Zheyuan, Xie Huichun, Zhao Jun, Li Ni, Zhao Zhibin, Liu Hao, Zheng Shuhai, Yu Peng, Zhou Bing, He Wei, Wu Yongkang, Yang Bo, Miao Jin:IntroductionElectromagnetic compatibility is the ability of electrical and electronic equipment or systems to function properly in their electromagnetic environment without causing adverse effects to anything in that environment: Ability to withstand electromagnetic disturbances: Electromagnetic compatibility is one of the important factors affecting the environment and product quality, and its standardization work has aroused widespread attention at home and abroad: In this regard, the IEC 61000 series of publications developed by the International Electrotechnical Commission (IEC ) Common standards in the fields of industry, electrical engineering and energy, transportation, social undertakings and health, quality and safety of consumer goods, etc:, divided into There are 6 categories: generalization, environment, limit values, testing and measurement techniques, installation and mitigation guidelines, and general standards: my country has launched a series of publications The domestic transformation work has been carried out, and the corresponding national standard system has been established: In this standard system, GB/T (Z) 17626 "Electromagnetic Compatibility Test and Measurement Technology" is about the field of electromagnetic compatibility test and measurement The basic standard in terms of technology, which aims to describe the immunity test of electromagnetic compatibility phenomena such as conduction disturbance and radiation disturbance, etc:, is proposed to be composed of 39 Partial composition: --- Part 1: General remarks on immunity test: The purpose is to provide usability guidelines for testing and measurement techniques in EMC standards guide and provide general advice on the selection of relevant tests: --- Part 2: Electrostatic discharge immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic devices performance of equipment subjected to electrostatic discharge: --- Part 3: RF electromagnetic field radiation immunity test: The purpose is to establish when electrical and electronic equipment is radiated by radio frequency electromagnetic fields Basis for immunity evaluation: --- Part 4: Electrical fast transient burst immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical Immunity of power supply ports, signal, control and ground ports of electronic equipment and electronic equipment when disturbed by electrical fast transient bursts performance: --- Part 5: Surge (shock) immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic The immunity performance of the equipment when it is subjected to surge (shock): --- Part 6: Immunity to conducted disturbances induced by radio frequency fields: The purpose is to establish a common and reproducible benchmark for evaluating electrical and the immunity performance of electronic equipment when receiving conducted disturbances induced by radio frequency fields: --- Part 7: Guidelines for measuring and measuring instruments for harmonics and interharmonics of power supply systems and connected equipment: The purpose is to specify the root Test the equipment item by item according to the emission limits given by some standards, and measure the harmonic current and voltage in the actual power supply system instrument: --- Part 8: Power frequency magnetic field immunity test: The purpose is to establish a common and reproducible benchmark for evaluating household, commercial and Immunity performance of industrial electrical and electronic equipment exposed to power frequency (continuous and short-duration) magnetic fields: --- Part 9: Pulse magnetic field immunity test: The purpose is to establish common and reproducible benchmarks for evaluating residential, commercial and Immunity of electrical and electronic equipment for industrial use in pulsed magnetic fields: --- Part 10: Damped oscillating magnetic field immunity test: The purpose is to establish a general and reproducible benchmark for evaluating medium and high pressure Immunity performance of electrical and electronic equipment in substations in damped oscillating magnetic fields: --- Part 11: Immunity to voltage dips, short interruptions and voltage changes for devices with an input current of less than or equal to 16A per phase test: The purpose is to establish a general and reproducible benchmark for evaluating the performance of electrical and electronic equipment subjected to voltage dips, short-term Immunity performance against interruptions and voltage variations: --- Part 12: Ring wave immunity test: The purpose is to establish a general and reproducible benchmark for evaluating The immunity performance of residential, commercial and industrial electrical and electronic equipment is also applicable to equipment in power stations and substations: --- Part 13: Low frequency immunity test of AC port harmonics, interharmonics and grid signals: The purpose is to establish a general and Reproducible benchmark to evaluate the low frequency immunity performance of electrical and electronic equipment to harmonics, interharmonics and grid signal frequencies: --- Part 14: Voltage fluctuation immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic Immunity of equipment when subjected to positive and negative voltage fluctuations of low magnitude: --- Part 15: Scintillator function and design specifications: The goal is to show the correct flicker for all actual voltage fluctuation waveforms perceived level: --- Part 16: 0Hz~150kHz common mode conducted disturbance immunity test: The purpose is to establish electrical and electronic equipment to withstand common Generic and repeatable guidelines for mode-conducted disturbance testing: --- Part 17: DC power input port ripple immunity test: The purpose is to establish a general and reproducible benchmark for Superimposed on direct current when charging electrical and electronic equipment under laboratory conditions from e:g: Immunity test for ripple voltage on source: --- Part 18: Damped oscillatory wave immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electrical Immunity performance of sub-equipment when subjected to damped oscillatory waves: --- Part 19: AC power port 2kHz~150kHz differential mode conducted disturbance and communication signal immunity test: purpose is Confirm that electrical and electronic equipment can withstand the power from power electronics and power line communication systems (PLC) when operating on the utility grid: and other differential mode conducted disturbances: --- Part 20: Emission and immunity tests in transverse electromagnetic (TEM) waveguides: The purpose is to give the performance of TEM waveguide, Confirmation method of TEM waveguide for electromagnetic compatibility test, test for radiated emission and immunity test in TEM waveguide Test layout, steps and requirements: --- Part 21: Mixing chamber test methods: The purpose is to establish the use of mixing chambers to evaluate electrical and electronic equipment in radio frequency electromagnetic fields General specification for the performance and determination of radiated emission levels for electrical and electronic equipment: --- Part 22: Radiated emission and immunity measurements in a fully anechoic chamber: The purpose is to stipulate that in the same fully anechoic chamber General confirmation procedures for radiated emission and radiated immunity, test layout requirements for equipment under test and full anechoic chamber measurement methods: --- Part 23: Test methods for HEMP and other radiation disturbance protection devices: The purpose is to describe the HEMP test by Basic principles, as well as the theoretical basis (test concept), test configuration, required equipment, test procedures, data processing and other important concepts: --- Part 24: Test methods for H......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GBZ17626.33-2023_English be delivered?Answer: Upon your order, we will start to translate GBZ17626.33-2023_English as soon as possible, and keep you informed of the progress. 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