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GB/T 17626.36-2024 English PDF

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GB/T 17626.36-2024: Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems
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Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 17626.36-2024	1874	Add to Cart	10 days	Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems	Valid

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Basic data

Standard ID: GB/T 17626.36-2024 (GB/T17626.36-2024)
Description (Translated English): Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L06
Classification of International Standard: 33.100.20
Word Count Estimation: 94,951
Date of Issue: 2024-11-28
Date of Implementation: 2025-06-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 17626.36-2024: Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 33.100.20 CCSL06 National Standard of the People's Republic of China Electromagnetic compatibility test and measurement technology Part 36.Intentional electromagnetic disturbances in equipment and systems Immunity test method Published on 2024-11-28 Implemented on 2025-06-01 State Administration for Market Regulation The National Standardization Administration issued

Preface V Introduction VII 1 Scope 1 2 Normative references 1 3 Terms, definitions and abbreviations 1 3.1 Terms and Definitions 1 3.2 Abbreviations 4 4 Overview 5 5 IEMI environment and role 6 5.1 Overview 6 5.2 IEMI Environment 6 5.2.1 Technical capability grouping 6 5.2.2 IEMI deployment plan 6 5.2.3 Radiated IEMI Environment Summary 7 5.2.4 Published Conducted IEMI Environment 7 5.3 Effects on disturbed equipment, systems and devices 8 5.3.1 Overview 8 5.3.2 Protection level 8 6 Test methods 9 6.1 Derivation of applicable test methods 9 6.2 Derivation of transfer function 10 6.3 Radiation testing using IEMI simulator 10 6.4 Radiation test using a mixing chamber 10 6.5 Complex Waveform Injection (CWI) 11 6.6 Damped Sine Wave Injection (DSI) 11 6.7 Electrostatic Discharge (ESD) 11 6.8 Electrical Fast Transient (EFT) 11 6.9 Antenna Port Injection 11 7 Test parameters 12 7.1 Derivation of immunity test parameters 12 7.2 Radiation test parameters 12 7.2.1 General UWB test parameters (for skilled personnel) 12 7.2.2 General broadband test parameters (for skilled personnel) 13 7.2.3 General narrowband test parameters (for skilled personnel) 15 7.3 General Conducted IEMI Test Parameters 16 7.3.1 General requirements 16 7.3.2 Characteristics and performance of fast damped oscillatory wave generator 17 7.4 Derivation of specific test levels 18 7.5 Relevance of EMC Immunity Data 19 Appendix A (Informative) Failure mechanism and performance criteria 20 A.1 Overview 20 A.2 Failure mechanism 20 A.2.1 Overview 20 A.2.2 Noise 20 A.2.3 Parameter offset and drift 21 A.2.4 System failure or crash 21 A.2.5 Component damage 21 A.3 Effect of pulse width 22 A.4 Performance criteria 23 A.5 References 23 Appendix B (Informative) Development of IEMI Source Environment 25 B.1 Overview 25 B.2 IEMI Environment 26 B.3 IEMI Sources 27 B.4 Published Radiated IEMI Environment 30 B.4.1 IEC 61000-2-13[B.14] 30 B.4.2 Mil-Std-464C 30 B.4.3 Parameter selection for broadband immunity test 31 B.4.4 International Telecommunication Union (ITU) 33 B.5 Summary 33 B.6 References 34 Appendix C (Informative) Interaction with Buildings 36 C.1 Attenuation of buildings 36 C.2 Coupling with cables 37 C.3 Low voltage cable attenuation 38 C.4 References 38 Appendix D (Informative) Relationship between plane wave immunity test and reverberation chamber immunity test 40 D.1 Overview 40 D.2 Relationship between shielding effectiveness measurements in two environments 40 D.3 Relationship between immunity tests in two environments 42 D.4 Supplementary content 43 D.5 References 44 Appendix E (Informative) Complex waveform injection-test method 46 E.1 Overview 46 E.2 Prediction 46 E.2.1 Overview 46 E.2.2 Example 49 E.3 Structure 51 E.4 Injection test 54 E.5 Summary 56 E.6 References 56 Appendix F (Informative) Importance of test method margin 57 F.1 Overview 57 F.2 Example 57 F.2.1 Overview 57 F.2.2 Negative Contribution 57 F.2.3 Positive contribution 60 F.2.4 Summary 61 F.3 References 61 Appendix G (Informative) Intentional EMI---The Problem of Jammers 62 G.1 Overview 62 G.2 Effect 62 G.3 Public reports of interference62 G.4 Risk Assessment63 G.5 Mitigation measures63 G.6 References 63 Appendix H (Normative) Ultra-wideband and broadband radiated transient immunity test method 65 H.1 Overview 65 H.2 Test equipment 65 H.2.1 Overview 65 H.2.2 Test facilities 65 H.2.3 Ultra-wideband transient pulse radiation test system 65 H.2.4 Broadband transient pulse radiation test system 66 H.2.5 Measurement chain 66 H.3 Field uniformity assessment 67 H.3.1 Field uniformity assessment in a darkroom 67 H.3.2 Field uniformity in a GTEM waveguide 69 H.4 Test Arrangement 69 H.4.1 General 69 H.4.2 Desktop equipment layout 70 H.4.3 Floor-standing equipment layout 71 H.4.4 Cable layout 71 H.5 Test procedures 71 H.5.1 Overview 71 H.5.2 Laboratory reference conditions 71 H.5.3 Execution of the test 72 H.5.4 Evaluation of test results 73 H.6 Test report 73 H.7 References 73 Appendix I (Informative) Sensor calibration methods and measurement uncertainties for measuring ultra-wideband and broadband radiated transient fields 74 I.1 Overview 74 I.2 IEC 61000-4-20.2010, Annex E [I.1] Calibration methods in TEM waveguides 74 I.2.1 Overview 74 I.2.2 Probe calibration requirements 74 I.2.3 Field strength probe calibration procedure for single-port TEM waveguide 76 I.3 D-dot sensor time domain calibration procedure 76 I.3.1 Overview 76 I.4 Measurement uncertainty 77 I.5 References 78 References 79

Foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting. This document is part 36 of GB/T (Z) 17626 "Electromagnetic compatibility test and measurement technology". GB/T (Z) 17626 has been published The following parts. ---GB /Z 17626.1-2024 Electromagnetic compatibility test and measurement technology Part 1.General introduction to immunity test; ---GB/T 17626.2-2018 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test; ---GB/T 17626.3-2023 Electromagnetic compatibility test and measurement technology Part 3.Radio frequency electromagnetic field radiated immunity test; ---GB/T 17626.4-2018 Electromagnetic compatibility test and measurement technology Electrical fast transient pulse group immunity test; ---GB/T 17626.5-2019 Electromagnetic compatibility test and measurement technology surge (impact) immunity test; ---GB/T 17626.6-2017 Electromagnetic compatibility test and measurement technology Radio frequency field induced conducted disturbance immunity; ---GB/T 17626.7-2017 Electromagnetic compatibility test and measurement technology Power supply system and connected equipment harmonic and interharmonic measurement Guidelines for volume and measuring instruments; ---GB/T 17626.8-2006 Electromagnetic compatibility test and measurement technology Power frequency magnetic field immunity test; ---GB/T 17626.9-2011 Electromagnetic compatibility test and measurement technology pulse magnetic field immunity test; ---GB/T 17626.10-2017 Electromagnetic compatibility test and measurement technology Damped oscillating magnetic field immunity test; ---GB/T 17626.11-2023 Electromagnetic compatibility test and measurement technology Part 11.For each phase input current less than or equal to Voltage sag, short interruption and voltage variation immunity test for 16A equipment; ---GB/T 17626.12-2023 Electromagnetic compatibility test and measurement techniques Part 12.Ringing wave immunity test; ---GB/T 17626.13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and power grid signal Low frequency immunity test of signal; ---GB/T 17626.14-2005 Electromagnetic compatibility test and measurement technology Voltage fluctuation immunity test; ---GB/T 17626.15-2011 Electromagnetic compatibility test and measurement technology Flicker meter function and design specification; ---GB/T 17626.16-2007 Electromagnetic compatibility test and measurement technology 0Hz~150kHz common mode conducted disturbance immunity test; ---GB/T 17626.17-2005 Electromagnetic compatibility test and measurement technology DC power supply input port ripple immunity test; ---GB/T 17626.18-2016 Electromagnetic compatibility test and measurement technology Damped oscillation wave immunity test; ---GB/T 17626.19-2022 Electromagnetic compatibility test and measurement technology Part 19.AC power port 2kHz~ 150kHz differential mode conducted disturbance and communication signal immunity test; ---GB/T 17626.20-2014 Electromagnetic compatibility test and measurement technology Transverse electromagnetic wave (TEM) emission and immunity in waveguide Degree test; ---GB/T 17626.21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method; ---GB/T 17626.22-2017 Electromagnetic compatibility test and measurement technology Radiated emission and immunity in full anechoic chamber Measurement; ---GB/T 17626.24-2012 Electromagnetic compatibility test and measurement technology Test of HEMP conducted disturbance protection device method; ---GB/T 17626.27-2006 Electromagnetic compatibility test and measurement technology Three-phase voltage unbalance immunity test; ---GB/T 17626.28-2006 Electromagnetic compatibility test and measurement technology Power frequency change immunity test; ---GB/T 17626.29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage drop, short-term Interference immunity test of interruption and voltage variation; ---GB/T 17626.30-2023 Electromagnetic compatibility test and measurement technology Part 30.Power quality measurement method; ---GB/T 17626.31-2021 Electromagnetic compatibility test and measurement technology Part 31.Broadband conducted harassment of AC power ports Interference immunity test; ---GB /Z 17626.33-2023 Electromagnetic compatibility test and measurement technology Part 33.High power transient parameter measurement method; ---GB/T 17626.34-2012 Electromagnetic compatibility test and measurement technology Equipment with main power supply current greater than 16A per phase Voltage sag, short interruption and voltage variation immunity test; Interference immunity test method; ---GB/T 17626.39-2023 Electromagnetic compatibility test and measurement technology Part 39.Close-range radiated field immunity test. This document is equivalent to IEC 61000-4-36.2020 "Electromagnetic compatibility (EMC) Part 4-36.Test and measurement technology equipment and "Test method for immunity to intentional electromagnetic disturbance of systems". The following minimal editorial changes were made to this document. --- In order to coordinate with the existing standards, the name of the standard is changed to "Electromagnetic compatibility test and measurement technology Part 36.Equipment and system Intentional electromagnetic interference immunity test method"; --- To be consistent with the references, the reference to IEC 60050-161.2018 in Chapter 3 is corrected to IEC 60050-161. 1990, the international standard is wrong. Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document is proposed and coordinated by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246). This document was drafted by. China Electronics Standardization Institute, China Electric Power Research Institute Co., Ltd., Xiamen Hainoda Scientific Instrument Co., Ltd., Zhejiang Qianjiang Robot Co., Ltd., Shenzhen Taolue Technology Co., Ltd., Suzhou Test Electronic Technology Co., Ltd., Industrial The Fifth Institute of Electronics of the Ministry of Information Technology, China Institute of Metrology, China Automotive Engineering Research Institute Co., Ltd., Beijing University of Posts and Telecommunications, China Automotive Technology and Research Center Co., Ltd., Shanghai Electrical Equipment Testing Institute Co., Ltd., Zhejiang Nuoyi Technology Co., Ltd., Guangzhou Chengzhen Electronic Technology Co., Ltd., China National Accreditation Service for Conformity Assessment, Shanghai Institute of Metrology and Testing Technology, Southeast University, Hangke Quality Inspection (Xi'an) Technology Co., Ltd., State Grid Zhejiang Electric Power Co., Ltd. Electric Power Research Institute, Beijing University of Chemical Technology, Jiangsu Electronic Information Products Quality Supervision and Inspection Institute (Jiangsu Information Security Evaluation Center), Daming Electronics Co., Ltd., Chongqing Qingshan Industrial Co., Ltd. Shanghai Aircraft Design and Research Institute of Commercial Aircraft Corporation of China, Guangdong Hanwei Information Technology Co., Ltd., Shenzhen Xiangfan Technology Co., Ltd. Limited company. The main drafters of this document are. Cui Qiang, Chen Zhengyu, Xie Huichun, Fu Jun, Zhang Jiangong, Zhu Wenli, Huang Pan, Huang Xuemei, Li Zhipeng, Shi Dan, Ji Guotian, Hu Xiaojun, Xing Lin, Zheng Yimin, Li Nan, Jin Dong, Liang Jiming, Liu Chang, Kang Yaqiang, Li Jinlong, Zhou Zhongyuan, Li Haiyang, Yang Zhichao, Wang Yifan, Han Yunan, Meng Fanjun, Zhou Yuan, Wu Xing, Hu Yueyun, Yan Hanliang, Zeng Xumin.

Introduction

Electromagnetic compatibility refers to the ability of electrical and electronic equipment or systems to work properly in their electromagnetic environment and not cause any adverse effects on anything in the environment. The electromagnetic compatibility problem is one of the important factors affecting the environment and product quality. Its standardization work has attracted In this regard, the IEC 61000 series of standards developed by the International Electrotechnical Commission (IEC) is a key standard for the manufacturing and information industries. General standards in the fields of industry, electrical engineering and energy, transportation, social services and health, consumer product quality and safety, etc. There are six categories. description, environment, limit, test and measurement technology, installation and mitigation guidelines, and general standards. my country has carried out research on this series of standards. Domestic transformation work has been carried out and a corresponding national standard system has been established. In this standard system, GB/T (Z) 17626 "Electromagnetic compatibility test and measurement technology" is about the test and measurement in the field of electromagnetic compatibility. The basic technical standards are intended to describe the immunity test of electromagnetic compatibility phenomena such as conducted disturbance and radiated disturbance, etc., and are planned to be composed of 39 Partial composition. --- Part 1.General introduction to immunity test. The purpose is to provide usability guidance on the test and measurement techniques in the electromagnetic compatibility standard. guidance and provides general advice on the selection of relevant tests. --- Part 2.Electrostatic discharge immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic devices. The performance of the device when subjected to electrostatic discharge. --- Part 3.Radio frequency electromagnetic field radiation immunity test. The purpose is to establish the electrical and electronic equipment when it is subjected to radio frequency electromagnetic field radiation. The basis for immunity assessment. --- Part 4.Electrical fast transient burst immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical Immunity of power supply ports, signal, control and ground ports of electronic equipment when subjected to electrical fast transient pulse group interference performance. --- Part 5.Surge (impact) immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic The immunity performance of the equipment when subjected to surge (impact). --- Part 6.Immunity to conducted disturbances induced by radio-frequency fields. The purpose is to establish a common and reproducible benchmark to evaluate electrical And the immunity performance of electronic equipment when it receives conducted disturbances induced by radio frequency fields. --- Part 7.Measurement and measurement instruments for harmonics and interharmonics of power supply systems and connected equipment. The purpose is to specify The equipment is tested item by item according to the emission limits given in certain standards, and the harmonic current and voltage in the actual power supply system are tested. Instrument for measuring. --- Part 8.Power frequency magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate household, commercial and Immunity performance of industrial electrical and electronic equipment in power frequency (continuous and short-term) magnetic fields. --- Part 9.Pulse magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate residential, commercial and Immunity performance of industrial electrical and electronic equipment in pulsed magnetic fields. --- Part 10.Damped oscillatory magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate medium and high voltage Immunity performance of electrical and electronic equipment in substations exposed to damped oscillating magnetic fields. --- Part 11.Voltage dips, short interruptions and voltage variations immunity test for equipment with input current less than or equal to 16A per phase The purpose is to establish a common and reproducible benchmark for evaluating the performance of electrical and electronic equipment when subjected to voltage dips, short interruptions, and voltage variation immunity performance. --- Part 12.Ring wave immunity test. The purpose is to establish a common and reproducible benchmark to evaluate the The immunity performance of electrical and electronic equipment for residential, commercial and industrial use also applies to equipment in power stations and substations. --- Part 13.Low frequency immunity test for harmonics, interharmonics and power grid signals at AC power ports. The purpose is to establish a common and reproducible benchmark to evaluate the low frequency immunity performance of electrical and electronic equipment to harmonics, interharmonics and mains signal frequencies. --- Part 14.Voltage fluctuation immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic The immunity of a device when subjected to positive and negative low amplitude voltage fluctuations. --- Part 15.Flicker meter function and design specifications. The purpose is to display the correct flicker for all practical voltage fluctuation waveforms Perception level. --- Part 16.0Hz~150kHz common mode conducted disturbance immunity test. The purpose is to establish electrical and electronic equipment to withstand common General and repeatability criteria for mode conducted disturbance testing. --- Part 17.DC power input port ripple immunity test. The purpose is to establish a common and reproducible benchmark for Under laboratory conditions, electrical and electronic equipment are tested on a DC power supply when the self-rectifying system and/or battery charging is superimposed Ripple voltage immunity test on the --- Part 18.Damped oscillatory wave immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic The immunity performance of a sub-device when subjected to a damp......

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Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.