GB/T 39227-2020 English PDF

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GB/T 39227-2020: Immunity time testing method under voltage dip for sensitive process rated less than 1000 V
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 39227-2020	279	Add to Cart	3 days	Immunity time testing method under voltage dip for sensitive process rated less than 1000 V	Valid

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Basic data

Standard ID: GB/T 39227-2020 (GB/T39227-2020)
Description (Translated English): Immunity time testing method under voltage dip for sensitive process rated less than 1000 V
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: K04
Classification of International Standard: 29.020
Word Count Estimation: 15,122
Date of Issue: 2020-11-19
Date of Implementation: 2021-06-01
Quoted Standard: GB/T 17626.11-2008; GB/T 17626.34-2012; GB/T 30137-2013; GB/T 32507-2016
Regulation (derived from): National Standard Announcement No. 26 of 2020
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration
Summary: This standard specifies the test equipment, test content, test layout, test method, test process, test results and test report requirements for voltage sag immunity time test for sensitive processes below 1,000 V. This standard applies to industrial processes that are sensitive to voltage sags and are connected to a 50 Hz public grid with a voltage lower than 1,000 V. The test methods specified in this standard are also applicable to short-term interrupt events.

GB/T 39227-2020: Immunity time testing method under voltage dip for sensitive process rated less than 1000 V

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
(Voltage sag immunity time test method for sensitive processes below 1000 V) ICS 29.020 K04 National Standards of People's Republic of China Voltage sag immunity time test method for sensitive processes below 1000V 2020-11-19 released 2021-06-01 implementation State Administration for Market Regulation Issued by the National Standardization Management Committee

Table of contents

Preface Ⅲ 1 Scope 1 2 Normative references 1 3 Terms and definitions 1 4 Test equipment 2 4.1 Voltage sag generator 2 4.2 Data Acquisition System 2 5 Test content 3 6 Test arrangement 3 7 Test method 4 7.1 Test method for gradual immunity time of industrial sub-process 4 7.2 Calculation method of sag immunity time in industrial process 4 8 Test process 4 8.1 Test plan 4 8.2 Test implementation 5 9 Test results and test report 5 9.1 Test results 5 9.2 Test report 5 Appendix A (normative appendix) Three-phase system voltage sag test phasor 7 Appendix B (Informative Appendix) Process Immunization Time 8 Appendix C (informative appendix) Typical structure of equipment connection in industrial process 9 Appendix D (informative appendix) Process immunity time test case 10 Reference 12

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. Please note that certain contents of this document may involve patents. The issuing agency of this document is not responsible for identifying these patents. This standard was proposed and managed by the National Standardization Technical Committee for Voltage, Current Rating and Frequency (SAC/TC1). Drafting organizations of this standard. Guangdong Power Grid Co., Ltd. Guangzhou Power Supply Bureau Electric Power Test Research Institute, Sichuan University, China Machinery Productivity Promotion Center, South China University of Technology, North China Electric Power University, State Grid Jiangsu Electric Power Research Institute, Guangdong Power Grid Co., Ltd. Electric Power Research Institute, State Grid Shanghai Electric Power Research Institute, Global Energy Internet Research Institute Co., Ltd., Xi'an Boyu Power Gas Co., Ltd., State Grid Henan Electric Power Research Institute, State Grid Shanxi Electric Power Research Institute, Yunnan Power Grid Limited Liability Company Electric Power Research Institute, State Grid Fujian Electric Power Co., Ltd. Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd. Wuxi Power Supply Branch, Shanghai Jiaotong University, Anhui University, State Grid Beijing Electric Power Research Institute, Wuhan Keliyuan Electric Co., Ltd. Company, Nanjing Guochen DC Power Distribution Technology Co., Ltd., Shenzhen China Power Technology Co., Ltd., State Grid Anhui Electric Power Co., Ltd. Power Research Institute, Shenzhen Power Supply Bureau Co., Ltd. Electric Power Research Institute, Fuzhou University. The main drafters of this standard. Wang Yong, Wang Ying, Xu Zhong, Zhang Ping, Ma Zhiyuan, Zhong Qing, Mo Wenxiong, Xu Yonghai, Fei Juntao, Xu Baiyu, Feng Qian, Liu Yingying, Liu Juncheng, Wang Yi, Chang Xiao, Xu Zhi, Huang Daoshan, Miao Jin, Li Rui, Zhu Mingxing, Guo Qianwen, Wang Wei, Qu Lifeng, Mei Zhonghua, Wang Xin, Xu Bin, Zhang Huaying, Zhang Yi. Voltage sag immunity time for sensitive processes below 1000V testing method

1 Scope

This standard specifies the test equipment, test content, test layout, test method, and test method for voltage sag immunity time test for sensitive processes below 1000V. Test process, test results and test report requirements. This standard applies to industrial processes that are sensitive to voltage sags with a voltage lower than 1000V connected to a 50Hz public grid. This standard The prescribed test method is also applicable to short-term interrupt events.

2 Normative references

The following documents are indispensable for the application of this document. For dated reference documents, only the dated version applies to this article Pieces. For undated references, the latest version (including all amendments) applies to this document. GB/T 17626.11-2008 Electromagnetic compatibility test and measurement technology Voltage sag, short-term interruption and voltage change immunity test GB/T 17626.34-2012 Electromagnetic compatibility test and measurement technology The voltage of equipment with main power supply current greater than 16A per phase Immunity test for dips, short interruptions and voltage changes GB/T 30137-2013 Power quality voltage sag and short-term interruption GB/T 32507-2016 Power quality terminology

3 Terms and definitions

The following terms and definitions defined in GB/T 30137-2013 and GB/T 32507-2016 apply to this document. For convenience Used, the following repeatedly lists some terms and definitions of GB/T 30137-2013 and GB/T 32507-2016. 3.1 Power Quality The electrical characteristics at a designated point in the power system are related to the degree to which various indicators of the voltage and current of the power supply equipment work (or run) from the benchmark technical parameters. Note. The benchmark technical parameters are generally the index values under the ideal power supply state, and these parameters may involve the compatibility between the power supply and the load. [GB/T 32507-2016, definition 2.1.1] 3.2 Voltage dip The root mean square value of the power frequency voltage at a certain point in the power system suddenly drops to 0.1pu~0.9pu, and returns to normal after a short duration of 10ms~1min. [GB/T 30137-2013, definition 3.1] 3.3 Short interruption The root mean square value of the power frequency voltage at a certain point in the power system suddenly drops below 0.1 pu, and it returns to normal after a short duration of 10ms~1min. [GB/T 30137-2013, definition 3.2] ......

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