Home Cart Quotation Policy About-Us
www.ChineseStandard.net
SEARCH

GB/T 26065-2010 English PDF

Q: How long will the true-PDF of English version of GB/T 26065-2010 be delivered?

Upon your order, we will start to translate GB/T 26065-2010_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.

Q: Can I share the purchased PDF of GB/T 26065-2010_English with my colleagues?

Yes. The purchased PDF of GB/T 26065-2010_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Q: Does the price include tax/VAT?

Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries). Avoidance of Double Taxation Agreements (DTAs) between Singapore and 100+ Countries: https://www.iras.gov.sg/taxes/international-tax

Q: Do you accept my currency other than USD?

Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.

US$419.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 26065-2010: Specification for polished test silicon wafers
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 26065-2010	419	Add to Cart	3 days	Specification for polished test silicon wafers	Valid

Similar standards

GB/T 16595 GB/T 29055 GB/T 16596 GB/T 14264 GB/T 29057 GB/T 26066

Basic data

Standard ID: GB/T 26065-2010 (GB/T26065-2010)
Description (Translated English): Specification for polished test silicon wafers
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: H80
Classification of International Standard: 29.045
Word Count Estimation: 18,196
Date of Issue: 1/10/2011
Date of Implementation: 10/1/2011
Quoted Standard: GB/T 1550; GB/T 1554; GB/T 1555; GB/T 1557; GB/T 2828.1; GB/T 4058; GB/T 6616; GB/T 6618; GB/T 6619; GB/T 6620; GB/T 6621; GB/T 6624; GB/T 11073; GB/T 12964; GB/T 13387; GB/T 13388; GB/T 14140; GB/T 14264; YS/T 26; SEMI 24; ASTM F1526
Regulation (derived from): Announcement of Newly Approved National Standards 2011 No. (No. 166 overall) 1
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This Standard specifies preparing a semiconductor device used as the technical requirements of the inspection and process control of a silicon single crystal test piece. This standard covers the sizes of crystal orientation and surface defects such as performance requirements. This Standard is applicable to all standards of 50. 8mm ~ 300mm diameter silicon polishing test piece technical requirements. For more demanding specifications polished silicon single crystal, such as: particle testing wafers, silicon lithography resolution testing and monitoring of films such as metal ions, see SEMI24 "polished silicon single crystal quality norms. "

GB/T 26065-2010: Specification for polished test silicon wafers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Specification for polished test silicon wafers ICS 29.045 H80 National Standards of People's Republic of China Polished silicon single standardized test pieces Issued on. 2011-01-10 2011-10-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

The standard equipment by the National Standardization Technical Committee and the Technical Committee material of the semiconductor material (SAC/TC203/SC2) centralized. This standard was drafted. Ningbo, Li Li Electronics Co., Ltd., Hangzhou Haina Semiconductor Co., Ltd. Drafters of this standard. Gong Fei, He Liangen, Xu Feng, Huang Xiaorong, Liupei Dong, Wang Feiyao. Polished silicon single standardized test pieces

1 Scope

1.1 standard specifies the technical requirements for preparing a semiconductor device used for inspection and process control in the silicon single crystal of the test piece. 1.2 This standard covers the sizes of crystal orientation and surface defects characteristic requirements. This standard covers all 50.8mm ~ 300mm Nominal diameter silicon test piece was polished technical requirements. 1.3 For more demanding specifications polished silicon single crystal, such as. particle testing wafers, test wafers resolution lithography and metal ions most Tablets, see SEMI24 "monocrystalline silicon polished wafer quality specifications."

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 1550 extrinsic conductivity type semiconductor material testing methods GB/T 1554 crystallographic perfection of silicon by preferential etch test methods GB/T 1555 to the measurement method of a semiconductor single crystal GB/T 1557 interstitial oxygen content in the silicon crystal infrared absorption measurement method GB/T 2828.1 Sampling procedures for inspection - Part 1. by acceptance quality limit (AQL) retrieval batch inspection sampling plan GB/T 4058 Test Method polished silicon oxide induced defects GB/T 6616 resistivity of semiconductor silicon and silicon thin film sheet resistance test method of non-contact eddy current method GB/T 6618 wafer thickness and total thickness variation of test methods GB/T 6619 wafer curvature testing methods GB/T 6620 wafer warpage non-contact test method GB/T 6621 Test Method for wafer surface flatness GB/T 6624 polished silicon surface quality by visual inspection Methods of measurement GB/T 11073 radial resistivity variation on silicon GB/T 12964 monocrystalline silicon polished wafer GB/T 13387 and other electronic materials silicon wafer reference surface length measurement method GB/T 13388 wafer reference surface crystallographic orientation of the X-ray test method GB/T 14140 wafer diameter measuring method GB/T 14264 semiconductor material terms YS/T 26 wafer edge profile test methods SEMI24 quality monocrystalline silicon polished wafer specification ASTMF1526 surface of the metal content measurement

3 Terms and Definitions

Terms and definitions GB/T 14264 apply as defined in this document. ......

Image

Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of GB/T 26065-2010_English be delivered?

Answer: Upon your order, we will start to translate GB/T 26065-2010_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of GB/T 26065-2010_English with my colleagues?

Answer: Yes. The purchased PDF of GB/T 26065-2010_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.