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GB/T 17473-2025 English PDF

GB/T 17473: Historical versions

Standard IDUSDBUY PDFLead-DaysStandard Title (Description)Status
GB/T 17473-2025RFQ ASK 3 days (Performance test method for electronic pastes - Conductor pastes test) Valid
GB/T 17473.1-200870 Add to Cart Auto, < 3 mins Test methods of precious metals pastes used for microelectronics -- Determination of solids content Valid
GB/T 17473.1-1998199 Add to Cart 2 days Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content Obsolete


Basic data

Standard ID: GB/T 17473-2025 (GB/T17473-2025)
Description (Translated English): (Performance test method for electronic pastes - Conductor pastes test)
Sector / Industry: National Standard (Recommended)
Date of Implementation: 2026-05-01
Older Standard (superseded by this standard): GB/T 17473.1-2008, GB/T 17473.2-2008, GB/T 17473.3-2008, GB/T 17473.4-2008, GB/T 17473.5-2008, GB/T 17473.6-2008, GB/T 17473.7-2022
Issuing agency(ies): State Administration for Market Regulation; Standardization Administration of China

GB/T 17473.1-2008: Test methods of precious metals pastes used for microelectronics -- Determination of solids content


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test methods of precious metals pastes used for microelectronics - Determination of solids content ICS 77.120.99 H68 National Standards of People's Republic of China GB/T 17473.1-2008 Replace GB/T 17473.1-1998 Precious metal paste test method for microelectronics technology Solid content determination 2008-0331 released 2008-09-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China Issued by the National Standardization Administration of China Precious metal paste test method for microelectronics technology Solid content determination

1 Scope

This section specifies the test method for the solid content in the precious metal slurry for microelectronics technology. This section applies to the determination of the solid content of precious metal pastes for various sintered and solidified microelectronics technologies.

2 Reference documents

The clauses in the following documents have become clauses of this part after being quoted in this part. For dated reference documents, all subsequent Amendments (not including errata content) or revisions do not apply to this section. However, all parties who have reached an agreement based on this section are encouraged to study Is the latest version of these files available? For undated reference documents, the latest version is applicable to this section. GB/T 8170 Numerical rounding rules

3 Principles of the method

The precious metal slurry is heated at a certain temperature for a certain period of time, and its solid content is determined according to the quality difference before and after heating.

4 Instruments and equipment

4.1 Balance. Sensitivity is 0.0001g. 4.2 Box-type resistance furnace. the highest operating temperature is 1,000°C, and the temperature control accuracy is ±20°C. 4.3 Blast-type constant temperature oven. the highest operating temperature is 300°C, and the temperature control accuracy is ±5°C. 4.4 Dryer. Color-changing silica gel is used as a desiccant.

5 Sample

Stir the sample evenly without introducing impurities.

6 Test steps

Experimental environment. ambient temperature 15℃~35℃, relative humidity 45%~75%, atmospheric pressure 86kPa~106kPa. 6.1 Sample 6.1.1 Sintered slurry. Weigh three 1g samples, accurate to 0.0001g, and place them in a 2ml porcelain crucible of constant weight. 6.1.2 Curing paste. Weigh three samples of 0.2g~0.3g, accurate to 0.0001g, and place them on the polyester PET film. Spread out appropriately. 6.2 Experimental temperature and operation 6.2.1 Sintered slurry. Place the crucible with the sample in the box-type resistance furnace, slightly open the furnace door, heat up to 150°C, and keep the temperature for 30 minutes. close Put on the furnace door, continue to heat up to 850 ℃, keep warm for 30 min. After sintering, turn off the power, open the furnace door and cool to 80℃~100℃, take out the crucible The crucible is placed in a desiccator, cooled to room temperature, and weighed. 6.2.2 Curing type slurry. Place the polyester PET film loaded with the sample in a blast-type constant temperature oven, heat it to the curing temperature of the slurry, and keep it warm. After 60 minutes, take out the film, put it in a desiccator to cool to room temperature, and weigh it.

7 Calculation of test results

7.1 Calculated according to formula (1), the mass fraction of solids in the slurry is, and the value is expressed in %. GB/T 17473.1-2008 100 (1) Where. ---The mass fraction of solids in the slurry, %; 7.2 The test results are expressed to two decimal places, and the mantissa of the significant digits shall be carried out in accordance with the rules of GB/T 8170 value rounding. 7.3 Take the arithmetic average of the test results of three samples as the measurement result. 7.4 The difference between the absolute values of the three samples tested with each other is not more than 1% of the average value. The measurement result is valid, otherwise another sample is taken and the measurement is repeated.

8 Test report

The test report should include the following. a) Sample number; b) Sample name, brand and specification; c) Product batch number; d) Test results and the seal of the inspection department; e) Number of this standard; f) Tester and test date. GB/T 17473.1-2008
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