GB/T 15651.4-2017 English PDF

US$534.00 · In stock
Delivery: <= 5 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 15651.4-2017: Semiconductor devices -- Discrete devices -- Part 5-4: Optoelectronic devices -- Semiconductor lasers
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 15651.4-2017	534	Add to Cart	5 days	Semiconductor devices -- Discrete devices -- Part 5-4: Optoelectronic devices -- Semiconductor lasers	Valid

Similar standards

GB/T 7247.1   GB/T 18490.1   GB/T 30117.2   GB/T 18462   GB/T 15651.5   GB/T 15651.7   

Basic data

Standard ID: GB/T 15651.4-2017 (GB/T15651.4-2017)
Description (Translated English): Semiconductor devices -- Discrete devices -- Part 5-4: Optoelectronic devices -- Semiconductor lasers
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L51
Classification of International Standard: 31.260
Word Count Estimation: 28,212
Date of Issue: 2017-05-31
Date of Implementation: 2017-12-01
Quoted Standard: IEC 60747-1; IEC 62007-1; IEC 62007-2; ISO 11145; ISO 11146-1; ISO 11146-2; ISO 11146-3; ISO 11554; ISO 11670; ISO 12005; ISO 13694; ISO 13695; ISO 17526
Adopted Standard: IEC 60747-5-4-2006, IDT
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard specifies the basic ratings, characteristics and test methods of semiconductor lasers.

GB/T 15651.4-2017: Semiconductor devices -- Discrete devices -- Part 5-4: Optoelectronic devices -- Semiconductor lasers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Semiconductor devices - Discrete devices - Part 5-4. Optoelectronic devices - Semiconductor lasers ICS 31.260 L51 National Standards of People's Republic of China Semiconductor devices Discrete devices Part 5-4. optoelectronic devices A semiconductor laser Semiconductordevices-Discretedevices-Part 5-4. Optoelectronicdevices- (IEC 60747-5-4..2006, IDT) 2017-05-31 released 2017-12-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People 's Republic of China China National Standardization Management Committee released Directory Preface III 1 Scope 1 2 normative reference document 1 3 Terms and definitions 2 3.1 Physical Concepts 2 3.2 Device Type --- Semiconductor Laser (Laser Diode) 2 3.3 General terms 2 3.4 Terms related to ratings and characteristics 3 Basic rating and characteristics 4.1 Type 7 4.2 Semiconductor 7 4.3 Outline and package details 7 4.4 Limits (Absolute Maximum Ratings) 7 4.5 Optoelectronic properties 8 4.6 Supplementary information - the effect of temperature on wavelengths 5 Test Method 10 5.1 Power Test 10 5.2 Output power stability 10 5.3 Time domain distribution 12 5.4 Life 14 5.5 Optical properties of laser beam 14 Appendix A (informative) Spatial definitions and spectral characteristics Related terms and definitions Reference Table 18 Appendix B (informative) Spatial correlation and spectral characteristics of the relevant test methods refer to Table 22 Appendix C (informative) Power Test and Life-Related Terms, Definitions and Test Methods Refer to Table 23 Reference 24 Figure 1 with a portless lens device 3 Figure 2 switch time 4 Figure 3 Laser diode threshold current 5 Figure 4 basic circuit Figure 10 Figure 5 basic circuit Figure 12 Figure 6 Typical Impulse Response Figure 13 Figure 7 Basic circuit Figure 14 Figure 8 Semi-strength angle 15 Figure 9 specifies the relationship between the plane and the mechanical reference plane Figure 10 basic measurement device Figure 16 Figure 11 D1/2 and D1/e2 measuring device 17 Table 1 Photoelectric properties 8

Foreword

GB/T 15651 "Semiconductor Devices Discrete Devices and Integrated Circuits Part 5. Optoelectronic Devices" consists of the following components. - Part 5-2. Basic ratings and characteristics of optoelectronic devices; - Part 5-3. Testing methods for optoelectronic devices; - Part 5-4. Optoelectronic devices - Semiconductor lasers. This part is part 5-4 of GB/T 15651. This part is drafted in accordance with the rules given in GB/T 1.1-2009. This part uses the translation method equivalent to IEC 60747-5-4..2006 "Semiconductor devices Discrete devices Part 5-4. Optoelectronic devices A semiconductor laser". In this part of the normative reference to the international documents have a consistent correspondence between the following documents. Test method for laser radiated power and power instability (ISO 11554..2006, MOD); GB/T 13863-2011; GB/T 15313-2008 Laser terminology (ISO 11145..2006, MOD); Semiconductor devices and integrated circuits - Part 1. General principles (IEC 747-1. 1983, IDT); GB/T 17573-1998. Test method for laser beam width, divergence angle and beam transmission ratio for laser and laser related equipment GB/T 26599.1-2011 Part 1. No astigmatic and simple astigmatism beams (ISO 11146-1..2005, IDT); Laser beam pointing and position stability testing methods (ISO 11670..2003, IDT) GB/T 27662-2011. This section makes the following editorial changes. In the normative reference document in Chapter 2, "IEC 60747-1" has been added; --- Figure 1 in the receiving angle or beam angle α corresponds to the full angle; --- 3.4.1 switch time "(see Figure 3)" to "(see Figure 2)"; --- 3.4.3 Note 3 in the differential output (radiation) power quantum efficiency "ηed" to "ηd"; --- 3.4.7 "Optical light beam" (see ISO 1146-3) "to" (see ISO 11146-3) "; --- "4.2.1.1" to "4.2.1"; --- Table 1, 4.5.12 side mode suppression than "SMS" to "SMSR"; --- 5.5.4a) Note "After determining the specified plane according to φ, determine" after adding "as shown in Figure 8." In Appendix A, the term "coherence to pulse repetition frequency" is referenced by ISO 11145 from "3.14 to 3.51" to "3.15 to 3.52" The term "quantum efficiency to unsteady cavity" refers to ISO 11145 from "3.52 to 3.56" to "3.54 to 3.58", the term "polarization" ISO 11145 changed from "3.36" to "3.37"; - In Appendix A, remove the "3.54" ISO 11145 referenced by the terms "peak emission wavelength", "spectral radiation bandwidth" - In Appendix C, the "opening delay time" is referenced by IEC 60747-5-4 from "3.4.1.4" to "3.4.1.3", "life" ISO 11145 changed from "3.33" to "3.34". This part is made by the Ministry of Industry and Information Technology of the People's Republic of China. This part of the National Semiconductor Device Standardization Technical Committee (SAC/TC78) centralized. This part of the drafting unit. China Electronics Technology Group Corporation thirteenth research institute. The main drafters of this part. Liu Xiaowen, Chen Hairong, An Zhenfeng, Niu Jiangli, Wang Xiaoyan, Ren Hao. Semiconductor devices Discrete devices Part 5-4. optoelectronic devices A semiconductor laser

1 Scope

This part of GB/T 15651 specifies the basic ratings, characteristics and test methods of semiconductor lasers.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. IEC 60747-1 Semiconductor devices - Discrete devices and integrated circuits - Part 1. General principles (Semiconductordevices - Dis - cretedevicesandintegratedcircuits-Part 1. General) IEC 62007-1 Semiconductor optoelectronic devices for optical fiber optics systems - Part 1. Basic ratings and characteristics (Semiconductor optoelectricdevicesforfibreopticsystemapplications-Part 1. Essentialratingsandcharacteristics) IEC 62007-2 Semiconductor optoelectronic devices for optical fiber optics systems - Part 2. Test methods (Semiconductoroptoelectric devicesforfibreopticsystemapplications-Part 2. Measuringmethods) ISO 11145 Optical and optical instruments Laser and laser related equipment Terms and symbols (Opticsandoptical instruments-Lasersandlaserrelatedequipment-Vocabularyandsymbols) ISO 11146-1 Laser and laser-related equipment Test methods for laser beam width, divergence angle and beam transmission ratio Test method 1 Part. no astigmatism and simple astigmatism (Lasersandlaser-relatedequipment-Testmethodsforlaserbeam widths, divergenceanglesandbeam propagationratios-Part 1. Stigmaticandsimpleastigmatic beams) ISO 11146-2 Laser and laser-related equipment - Test methods for laser beam width, beam divergence angle and beam transmission ratio - Part 2 . Lasersandlaser-relatedequipment-Test methods for laserbeam widths, divergenceanglesandbeampropagationratios-Part 2. Generalastigmaticbeams) ISO 11146-3 Laser and laser-related equipment - Test method for laser beam width, beam divergence angle and beam transmission ratio Part 3 Points. the essence and geometry of the laser beam classification, transmission and test method details (Lasersandlaser-relatedequipment-Test methodsforlaserbeamwidths, divergenceanglesandbeampropagratratios-Part 3. Intrinsicand geometricallaserbeamclassification, propagationanddetailsoftestmethods) ISO 11554 optical and optical instruments - Laser and laser - related equipment - Laser beam power, energy and time characteristics - Test methods (Opticsandopticalinstruments-Lasersandlaser-relatedequipment-Testmethodsforlaserbeam power, energyandtemporalcharacteristics ISO 11670 Laser and laser-related equipment Laser beam parameters Test method Beam position stability (Lasersandlaser-re- latedequipment-Testmethodsforlaserbeamparameters-Beampositionalstability) ISO 12005 Laser and laser-related equipment Laser beam parameters Test method Polarization (Lasersandlaser-relatedequip- ment-testmethodsforlaserbeamparameters-Polarization) ISO 13694 Optics and optics - Laser and laser related equipment - Laser beam power (energy) - Density distribution test method ......

Image     

Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of GB/T 15651.4-2017_English be delivered?

Answer: Upon your order, we will start to translate GB/T 15651.4-2017_English as soon as possible, and keep you informed of the progress. The lead time is typically 3 ~ 5 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of GB/T 15651.4-2017_English with my colleagues?

Answer: Yes. The purchased PDF of GB/T 15651.4-2017_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.