YS/T 27-1992 English PDF

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YS/T 27-1992: (Particulate contamination on the wafer surface and the measurement method of counting)
Status: Obsolete

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
YS/T 27-1992	199	Add to Cart	2 days	(Particulate contamination on the wafer surface and the measurement method of counting)	Obsolete

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Basic data

Standard ID: YS/T 27-1992 (YS/T27-1992)
Description (Translated English): (Particulate contamination on the wafer surface and the measurement method of counting)
Sector / Industry: Nonferrous Metallurgy Industry Standard (Recommended)
Classification of Chinese Standard: H21
Word Count Estimation: 3,357
Date of Issue: 3/9/1992
Date of Implementation: 1/1/1993
Regulation (derived from): Development & Reform Commission Notice 2005 No. 45

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