GB/T 43040-2023 English PDF

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GB/T 43040-2023: Semiconductor integrated circuits - Test method of AC/DC converters
Status: Valid

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Basic data

Standard ID: GB/T 43040-2023 (GB/T43040-2023)
Description (Translated English): Semiconductor integrated circuits - Test method of AC/DC converters
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L55
Classification of International Standard: 31.200
Word Count Estimation: 42,492
Date of Issue: 2023-09-07
Date of Implementation: 2024-04-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 43040-2023: Semiconductor integrated circuits - Test method of AC/DC converters

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 31.200 CCSL55 National Standards of People's Republic of China Semiconductor integrated circuit AC/DC converter test method Published on 2023-09-07 2024-04-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration Committee

Table of contents

Preface III 1 Scope 1 2 Normative reference documents 1 3 Terms and Definitions 1 4 General test requirements 3 4.1 Test environment requirements 3 4.2 Test Notes 3 4.3 Test instruments and equipment 4 5 Test conditions and test procedures 4 5.1 Input voltage range (VIN_R) 4 5.2 Input frequency range (fIN_R) 5 5.3 No-load input current (IIN_NULL) 6 5.4 Full load input current (IIN_FULL) 7 5.5 Off-state input current (IIN_SD) 7 5.6 Output voltage accuracy (α) 8 5.7 Output voltage temperature coefficient (αTC) 9 5.8 Output ripple voltage (Vo_RIPPLE) 11 5.9 Voltage regulation (SV) 12 5.10 Current Regulation (SI) 13 5.11 Cross adjustment rate (SC) 14 5.12 Output voltage adjustment range (VOR_TRIM) 15 5.13 Efficiency (η) 17 5.14 Leakage current (ICASE) 18 5.15 Input surge current (IINRUSH) 19 5.16 Output limiting current (IOPRO) 20 5.17 Startup output overshoot voltage (VOT) 21 5.18 Load change transient overshoot voltage (VLOR) 22 5.19 Load change transient response time (tROR) 23 5.20 Isolation impedance (RISO) 25 5.21 Switching frequency (fC) 26 5.22 Start-up delay time (tTR) 27 5.23 Output holding time (tH) 28 5.24 Enable turn-on voltage (VON) 29 5.25 Enable shutdown voltage (VOFF) 30 5.26 Enable input current (IEN) 31 5.27 Enable delay time (tEN) 32 5.28 Electrical strength (SD) 34

Foreword

This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents" Drafting. Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents. This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Semiconductor Device Standardization Technical Committee (SAC/TC78). This document was drafted by. 771st Research Institute of the Ninth Research Institute of China Aerospace Science and Technology Corporation, China Electronics Technology Group Corporation Fifty-eighth Research Institute. The main drafters of this document. Wang Fuqiang, Liu Bin, Li Lei, Deng Xepeng, Ma Baofeng, Chen Zhipei, Liu Qiang, Han Xinfeng, and Hu Qiaoyu. Semiconductor integrated circuit AC/DC converter test method

1 Scope

This document describes the parametric testing methods for semiconductor integrated circuit AC to DC (AC/DC) converters (hereinafter referred to as devices). This document is suitable for testing the parameters of AC/DC converters of semiconductor integrated circuits.

2 Normative reference documents

This document has no normative references.

3 Terms and definitions

The following terms and definitions apply to this document. 3.1 input voltage range inputvoltagerange During normal operation, the AC voltage range (effective value) allowed to be applied to the input terminal of the device. 3.2 inputfrequencyrangeinputfrequencyrange During normal operation, the frequency range of the AC voltage applied to the input terminal of the device. 3.3 No-load input current nul-loadinputcurrent Under the specified input voltage, input frequency and no load, the AC current (effective value) flowing through the input terminal of the device. 3.4 Full load input current ful-loadinputcurrent Under the specified input voltage, input frequency and full load, the AC current (effective value) flowing through the input terminal of the device. 3.5 Shut-downinputcurrent Under the specified input voltage and input frequency, when the device output is in the off state, the AC current (effective value) flows through the input terminal. 3.6 The deviation of the device output voltage value from the nominal value under the specified input voltage, input frequency and output load. Note. Usually expressed as a percentage. 3.7 During normal operation, the relative change rate of the device output voltage with temperature. 3.8 output ripple voltageoutputripplevoltage Under the specified input voltage, input frequency and output load, the peak-peak value of the AC component contained in the DC output voltage of the device. ......

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