GB/T 37131-2018 English PDF

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GB/T 37131-2018: Nanotechnologies -- Test method of semiconductor nano powder using UV-Vis diffuse reflectance spectroscopy
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 37131-2018	319	Add to Cart	4 days	Nanotechnologies -- Test method of semiconductor nano powder using UV-Vis diffuse reflectance spectroscopy	Valid

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Basic data

Standard ID: GB/T 37131-2018 (GB/T37131-2018)
Description (Translated English): Nanotechnologies -- Test method of semiconductor nano powder using UV-Vis diffuse reflectance spectroscopy
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: G10
Classification of International Standard: 17.180
Word Count Estimation: 16,167
Date of Issue: 2018-12-28
Date of Implementation: 2018-12-28
Regulation (derived from): National Standard Announcement No. 17 of 2018
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 37131-2018: Nanotechnologies -- Test method of semiconductor nano powder using UV-Vis diffuse reflectance spectroscopy

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Nanotechnologies--Test method of semiconductor nanopowder using UV--Vis diffuse reflectance spectroscopy ICS 17.180 G10 National Standards of People's Republic of China Nanotechnology semiconductor nano powder material UV-visible diffuse reflectance spectroscopy test method Published on.2018-12-28 2018-12-28 implementation State market supervision and administration China National Standardization Administration issued

Content

Foreword III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 Principle of the method 2 5 Instrument 3 5.1 UV-Vis Spectrophotometer 3 5.2 Integrating sphere 3 5.3 Sample Cell 4 5.4 Reference Whiteboard 4 5.5 Instrument Calibration 4 6 Sample Preparation 4 7 Test Method 4 7.1 Test Conditions 4 7.2 Test Step 4 7.3 Main influencing factors 5 8 Data Processing and Results Analysis 5 9 test report 5 Appendix A (informative) Calculation of the band gap width of rutile nano-titanium oxide 6 Appendix B (informative) Effects of operating parameters on UV-visible diffuse reflectance spectra of nano-zinc oxides 8 Appendix C (informative) Test Report 11 Reference 12

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard was proposed by the Chinese Academy of Sciences. This standard is under the jurisdiction of the National Nanotechnology Standardization Technical Committee (SAC/TC279). This standard was drafted. National Nanoscience Center, Beijing Weikang Environmental Protection Technology Co., Ltd., Guangzhou Special Pressure Equipment Testing and Research Institute, Beijing Physical and Chemical Analysis and Testing Center, Beijing University of Science and Technology, Beijing Powder Technology Association. The main drafters of this standard. Park Lingxi, Wu Zhijiao, Cao Wenbin, Yang Lin, Gao Xia, Chang Huaiqiu, Liu Wenxiu, Yin Zongjie, Plateau.

Introduction

Compared with traditional semiconductor materials, semiconductor nano-powder materials exhibit special optical and electrical properties and have excellent photoelectric conversion. Chemical properties are widely used in new energy preparation, environmental protection, chemical, pharmaceutical, aerospace and military fields. UV-visible diffuse reflectance spectroscopy is an important characterization method for studying the optical properties of semiconductor nano-powder materials. It can be used for band gap and color difference. Analysis, surface adsorption, reaction between powders, and other important properties. UV-visible diffuse in semiconductor nanopowder materials In the reflection spectrum, the position of the characteristic diffuse reflection peak is directly related to its band gap. Bandgap is a very important physical property of semiconductor nanopowder materials. Directly affect the optical properties of the material and the field of application and scope. Combined with UV-visible diffuse reflectance spectroscopy and Kubelka~ The Munk) equation calculates the band gap of a semiconductor nanopowder material. In order to meet the needs of China's research and production departments, the tester is required. The law regulates and standardizes. Nanotechnology semiconductor nano powder material UV-visible diffuse reflectance spectroscopy test method

1 Scope

This standard specifies the UV-visible diffuse reflectance spectroscopy test method for semiconductor nano-powder materials. This standard is applicable to the test of diffuse reflectance spectra of opaque semiconductor nano-powder materials.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. JJF1232 reflectivity meter calibration specification JJG178 UV, visible, near-infrared spectrophotometer verification procedures

3 Terms and definitions

The following terms and definitions apply to this document. 3.1 Semiconductor semiconductor A solid material having a resistivity between the conductor and the insulator and ranging from 10 to 3 Ω·cm to 1010 Ω·cm. Current is taken by the belt The directional transmission of positively charged holes and negatively charged electrons is achieved. [GB/T 14264-2009, definition 3.218] 3.2 Nano powder nanopowder A collection of discrete nanoparticles. Note. Rewritten from GB/T 19619-2004, definition 3.2.1.1. 3.3 Diffuse reflection The dispersion process caused by reflection when there is no regular reflection on the macroscopic scale. [JJF1032-2005, definition 4.5] 3.4 Reflectivity The thickness of the material layer is such that the reflectance does not change as the thickness increases, and is dimensionless. [JJF1032-2005, definition 4.42] 3.5 Integrating sphere integratingsphere A hollow sphere used as a component of a radiometer, photometer, or spectrophotometer, whose inner surface is covered with almost no spectrum in the spectral region of use. Selective diffuse reflective material. [JJF1032-2005, definition 3.52] ......

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