GB/T 32988-2016 English PDF

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GB/T 32988-2016: Synthetic quartz crystal wafer for optical low pass filter (OLPF)
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 32988-2016	279	Add to Cart	3 days	Synthetic quartz crystal wafer for optical low pass filter (OLPF)	Valid

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Basic data

Standard ID: GB/T 32988-2016 (GB/T32988-2016)
Description (Translated English): Synthetic quartz crystal wafer for optical low pass filter (OLPF)
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L21
Classification of International Standard: 31.160
Word Count Estimation: 14,134
Date of Issue: 2016-10-13
Date of Implementation: 2017-09-01
Regulation (derived from): National Standard Notice No.1716 of 2016
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

GB/T 32988-2016: Synthetic quartz crystal wafer for optical low pass filter (OLPF)

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Synthetic quartz crystal wafer for optical low pass filter (OLPF) ICS 31.160 L21 National Standards of People's Republic of China Artificial quartz optical low - pass filter chip 2016-10-13 released 2017-09-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released Directory Preface III 1 Scope 1 2 normative reference document 1 3 Terms and definitions 1 4 grading 3 5 requirements 4 5.1 chip 4 5.2 Size and angle 4 5.3 Chip surface flaws 5 5.4 Chip face deviation 6 6 Test Method 6 6.1 Inclusions and cracks 6 6.2 Stripes 6 6.3 Size 6 6.4 tangential and angular deviation 6 6.5 chamfer and chamfer 6 6.6 verticality 7 6.7 TV5 7 6.8 Surface flaws 7 6.9 Face deviation 7 7 Inspection rules 8 7.1 Sampling plan 8 7.2 Judgment Rule 8 7.3 Type test 8 8 Packaging, marking, delivery conditions 8 8.1 Packaging 8 8.2 Identification 8 8.3 Delivery conditions 8 Reference 9

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents. This standard is proposed by the China Building Materials Federation. This standard is under the jurisdiction of the National Committee for Standardization of Artificial Crystals (SAC/TC461). This standard drafting unit. Shuo light special crystal Technology Co., Ltd., Zhejiang Crystal Optoelectronics Technology Co., Ltd. The main drafters of this standard. Zhang Shaofeng, Zhang Xuan, Sun Zhiwen, Wang Baoxin, Shang Jiwu, Qiu Huan, Hua Dachen. Artificial quartz optical low - pass filter chip

1 Scope

This standard specifies the artificial quartz optical low-pass filter chip terminology and definition, classification, requirements, test methods, inspection rules and packaging, Logo, delivery conditions. This standard applies to artificial quartz optical low-pass filter chips.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. GB/T 1185 Optical parts surface flaws GB/T 2828.1-2012 Count Sampling Inspection Procedures Part 1. Inspection by batch (AQL) Plan (ISO 2859-1..1999) GB/T 2831 Surface deviation of optical parts Test method for thickness and total thickness variation of silicon wafers GB/T GB/T 7895 artificial optics quartz crystal Test method for artificial optics quartz crystal GB/T 7896-2008

3 terms and definitions

GB/T 7895, GB/T 1185 and GB/T 2831 and the following terms and definitions apply to this document. In order to facilitate Use the following to repeat some of the above terms and definitions. 3.1 Optical low-pass filter chip opticallow-passfilterwafer; OLPFwafer Made of quartz crystal and other materials, the monolithic or multi-chip combination and coating, so that a certain frequency below the optical signal components through, and inhibition The frequency of the optical signal component above the optical substrate. 3.2 Effective area fixedqualityarea; FQA Removing the crystal surface area of the wafer edge at a specific distance X. Refer to the area included in the dotted line in Figure 1. Note. The boundary of the FQA usually refers to all points that are spaced from the edge of the wafer (including the reference edge). [IEC 62276-2005, definition 3.7.1] 3.3 Inclusions The crystal is immersed in the refractive index matching liquid, and the scattered light from the light source is used to observe the foreign matter visible in the artificial quartz crystal. The most common The inclusions are pyroxene. [GB/T 7895-2008, definition 3.6] 3.4 Stripe striae In the artificial quartz crystal, the stripe-like defects observed in the local area of the crystal due to the change in the refractive index. ......

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