GB/T 31093-2014 English PDF

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GB/T 31093-2014: Test method for stress of monocrystalline sapphire ingot
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 31093-2014	169	Add to Cart	3 days	Test method for stress of monocrystalline sapphire ingot	Valid

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Basic data

Standard ID: GB/T 31093-2014 (GB/T31093-2014)
Description (Translated English): Test method for stress of monocrystalline sapphire ingot
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: H22
Classification of International Standard: 77.040.10
Word Count Estimation: 7,770
Date of Issue: 12/12/2014
Date of Implementation: 9/1/2015
Regulation (derived from): National Standards Bulletin 2014 No. 30
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

GB/T 31093-2014: Test method for stress of monocrystalline sapphire ingot

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test method for stress of monocrystalline sapphire ingot ICS 77.040.10 H22 National Standards of People's Republic of China Sapphire ingot stress testing methods Issued on. 2014-12-22 2015-09-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. The standard equipment by the National Standardization Technical Committee and the semiconductor material (SAC/TC203) and National Semiconductor Equipment and Materials Standards Materials Branch of the Technical Committee (SAC/TC203/SC2) jointly proposed and managed. This standard was drafted. GCL Optoelectronics Technology (Jiangsu) Co., Ltd., Shanghai Institute of Optics and Fine Mechanics, Beijing can be Sunshine New Energy Technology Co., Ltd. The main drafters of this standard. Liu Yifeng, Wei Mingde, Xu Yang Yi, Hang Yin, Xiao Zongjie. Sapphire ingot stress testing methods

1 Scope

This standard specifies the sapphire single crystal ingot stress testing methods. This standard applies to processed through the diameter of 50.8mm ~ 200mm c-sapphire ingot to stress tests, other sizes blue Gem ingot (hereinafter referred to as ingot) can refer to the use of stress tests.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 14264 semiconductor material terms

3 Terms and Definitions

Terms and definitions GB/T 14264 apply to this document defined.

4 Method summary

Sapphire is a uniaxial crystal, c-axis to the optical axis. Typical convergence plane polarized light interference test device, the optical axis of the crystal vertical section Straight and parallel to the optical axis of the instrument, in the case of convergent light, will produce interference light cone is formed in FIG. Conoscopic plot by a black cross and concentric Interference color circle composed of interference color circle with black cross an intersection as the center (the optical axis of the dew point), concentric ring, how much interference color circle, depending on the grain Birefringence body size and thickness. When the crystal structure is destroyed the local rules, the stress generated in the optical axis direction so that the position changes, the light beam passes through this position , The resulting conoscopic figure black cross distortion, so you can observe the position of each crystal light cone diagram to detect stress crystals.

5 disturbances

5.1 ingot inside bubbles, inclusions, etc. will influence the judgment stresses. Analyzing internal cracks will affect the stress of 5.2 ingot process caused.

6 Test Equipment

Strain gauge, the typical optical path shown in Figure 1. The optical instruments the speed of light by an insulating sheet from the light source (1) (2), a condenser Mirror (3), a mirror (4) and the polarizer (5) of plane galvanometer, by diverging lens (7), a glass table (8) projected onto the sample being tested, the most After the adoption of the analyzer (10) will see the light cone pattern with stress characteristics. ......

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