GB/T 28634-2025 English PDFUS$379.00 · In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 28634-2025: Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy Status: Valid GB/T 28634: Historical versions
Basic dataStandard ID: GB/T 28634-2025 (GB/T28634-2025)Description (Translated English): Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: G04 Classification of International Standard: 71.040.99 Word Count Estimation: 18,131 Date of Issue: 2025-04-25 Date of Implementation: 2025-11-01 Older Standard (superseded by this standard): GB/T 28634-2012 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GB/T 28634-2025: Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. ICS 71.040.99 CCSG04 National Standard of the People's Republic of China Replace GB/T 28634-2012 Microbeam analysis Electron probe microscopy Quantitative point analysis of bulk samples by spectroscopy (ISO 22489.2016, IDT) Released on 2025-04-25 2025-11-01 Implementation State Administration for Market Regulation The National Standardization Administration issued Table of contentsPreface III Introduction IV 1 Scope 1 2 Normative references 1 3 Abbreviations 1 4 Quantitative process 2 5 Test report 7 Appendix A (Informative) Physical effects and corrections 8 Appendix B (Informative) Overview of different calibration methods 9 Appendix C (Informative) Measurement of k ratio with "chemical effect" 10 Reference 11ForewordThis document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting is required. This document replaces GB/T 28634-2012 "Microbeam analysis electron probe microanalysis of bulk samples spectroscopy quantitative point analysis" Compared with GB/T 28634-2012, in addition to structural adjustments and editorial changes, the main technical changes are as follows. a) Added the abbreviations for scanning electron microscope and energy dispersive spectrometer (see Chapter 3); b) The requirement for the analysis volume has been changed from "the analysis volume should be larger than the X-ray excitation volume" to "the analysis volume should be uniform and Larger than the X-ray excitation volume” (see 4.4.1, 4.4.1 of the.2012 edition); c) Changed the requirements for the selection of analytical crystals. "Analytical crystals should be selected based on the crystal materials of the instrument. The following sentence is changed to "The analysis crystal should be measured by the instrument" (Information provided by the manufacturer or selection of information obtained from reference books) (see 4.4.8, 4.4.8 of the.2012 edition); d) The nature of Appendix C is changed from normative to informative. This document is equivalent to ISO 22489.2016 "Microbeam analysis - Electron probe microanalysis of bulk samples - Quantitative point analysis by spectroscopy". Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document was proposed and coordinated by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38). This document was drafted by. Shanghai Institute of Ceramics, Chinese Academy of Sciences. The main drafters of this document. Zeng Yi, Li Xiangting and Peng Fan. This document was first published in.2012 and this is the first revision.IntroductionElectron probe microanalysis has been widely used in the quantitative analysis of material composition elements. The ease of use of sub-probe microanalyzers has been greatly improved. To obtain accurate quantitative results with this powerful tool, To obtain reliable data, the instrument must be used correctly. Optimal operating procedures are also required, such as sample preparation, characteristic X-ray intensity measurement, This document gives the standard operating procedures for the measurement of mass and calculation of mass fraction from X-ray intensity. Microbeam analysis Electron probe microscopy Quantitative point analysis of bulk samples by spectroscopy1 ScopeThis document specifies the use of electron probe microanalyzers or wavelength spectrometers (WDS) mounted on scanning electron microscopes (SEMs) to analyze the The requirement for quantitative analysis of elements within the micrometer-scale volume of the sample by X-rays generated by interaction with the sample. This document also includes the following. ---Principles of quantitative analysis; --- General range of elements, mass fractions and reference materials involved in this method; --- General requirements for instruments; ---Basic processes such as sample preparation, experimental condition selection, analysis, measurement and reporting. This document is applicable to the quantitative analysis of block samples with smooth and uniform surface when the electron beam is incident vertically. There are no special requirements. Users should obtain information such as instrument installation conditions, detailed operating procedures and instrument specifications from the instrument manufacturer.2 Normative referencesThe contents of the following documents constitute essential clauses of this document through normative references in this document. For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document. GB/T 27025-2019 General requirements for the competence of testing and calibration laboratories (ISO /IEC 17025.2017, IDT) Note. There is no technical difference between the referenced content of GB/T 27025-2019 and the referenced content of ISO /IEC 17025.2005. ISO 14594 Microbeam analysis - Electron probe microanalysis spectroscopy - Guidelines for the determination of experimental parameters Note. GB/T 30705-2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters (ISO 14594.2009, MOD) ISO 14595 Microbeam analysis Electron probe microanalysis standard sample technical conditions guide Note. GB/T 4930-2021 Microbeam analysis - Guidelines for the technical conditions of standard samples for electron probe microanalysis (ISO 14595.2014, IDT)3 Abbreviations......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 28634-2025_English be delivered?Answer: Upon your order, we will start to translate GB/T 28634-2025_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of GB/T 28634-2025_English with my colleagues?Answer: Yes. 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