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GB/T 34986-2017: Methods for product accelerated testing Delivery: 9 seconds. True-PDF full-copy in English & invoice will be downloaded + auto-delivered via email. See step-by-step procedure Status: Valid
Similar standardsGB/T 34986-2017: Methods for product accelerated testing---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT34986-2017NATIONAL STANDARD OF THE PEOPLE’S REPUBLIC OF CHINA ICS 03.120.01;03.120.30 L 05 GB/T 34986-2017 / IEC 62506.2013 Methods for product accelerated testing (IEC 62506.2013, IDT) Issued on. NOVEMBER 01, 2017 Implemented on. MAY 01, 2018 Issued by. General Administration of Quality Supervision, Inspection and Quarantine; Standardization Administration of the People’s Republic of China. Table of ContentsForeword... 4 Introduction... 6 1 Scope... 8 2 Normative references... 8 3 Terms, definitions, symbols and abbreviations... 9 3.1 Terms and definitions... 9 3.2 Symbols and abbreviated terms... 11 4 General description of the accelerated test methods... 13 4.1 Cumulative damage model... 13 4.2 Classification, methods and types of test acceleration... 15 5 Accelerated test models... 19 5.1 Type A. qualitative accelerated tests... 19 5.2 Type B and C. Quantitative accelerated test methods... 27 5.3 Failure mechanisms and test design... 32 5.4 Determination of stress levels, profiles and combinations in use and test – stress modelling... 33 5.5 Multiple stress acceleration methodology – Type B tests... 33 5.6 Single and multiple stress acceleration for Type B tests... 36 5.7 Acceleration of quantitative reliability tests... 48 5.8 Accelerated reliability compliance or evaluation tests... 57 5.9 Accelerated reliability growth testing... 59 5.10 Guidelines for accelerated testing... 60 6 Accelerated testing strategy in product development... 61 6.1 Accelerated testing sampling plan... 61 6.2 General discussion about test stresses and durations... 62 6.3 Testing components for multiple stresses... 63 6.4 Accelerated testing of assemblies... 63 6.5 Accelerated testing of systems... 63 6.6 Analysis of test results... 64 7 Limitations of accelerated testing methodology... 64 Annex A (informative) Highly accelerated limit test (HALT)... 66 Annex B (informative) Accelerated reliability compliance and growth test design... 71 Annex C (informative) Comparison between HALT and conventional accelerated testing... 88 Annex D (informative) Estimating the activation energy, Ea... 89 Annex E (informative) Calibrated accelerated life testing (CALT)... 91 Annex F (informative) Example on how to estimate empirical factors... 94 Annex G (informative) Determination of acceleration factors by testing to failure... 99 Bibliography... 103ForewordThis Standard was drafted in accordance with the rules given in GB/T 1.1-2009. This Standard uses the translation method to equivalently adopt IEC 62506.2013 “Methods for product accelerated testing”. The documents of our country that have a consistent correspondence with the international documents that are referenced in this Standard are as follows. -- GB/T 5080.1-2012, Reliability testing - Part 1.Test conditions and statistical test principles (IEC 60300-3-5.2001, IDT) This Standard, compared with IEC 62506.2013, makes the following editorial changes. -- “a minimum 30 000 h per year” in the original text 5.2.3.1.3 is wrong; it shall be “a minimum 3 000 h per year”; -- “as the time compression may influence the stress acceleration” in the original text 5.2.3.2.1 is wrong; it shall be “as the event compression may influence the stress acceleration”; -- “Equation (3) presents a rather accurate way of expressing the overall item failure rate with applied stresses” in the original text 5.5 is wrong; it shall be “Equation (4) presents a rather accurate way of expressing the overall item failure rate with applied stresses"; -- “n1/N1”, “l1/L1” and “αi is the time at the ith stress level” in the original text 5.6.3.2 are wrong; they shall be “ni/Ni”, “li/Li” and “αi is the ratio of the time at the ith stress level to the life under applied loads”; -- S in equation (B.22) in the original Annex B shall be NS; -- “One in this group failed after 700 cycles and 10 after 1000 cycles.” and “In this second test group B, 4 failed after 300 cycles, 10 after 400 cycles, and additional 5 after 500 cycles” in Annex F of the original text are wrong; they shall be “One in this group failed after 700 cycles and 3 after 1 000 cycles.” and “In this second test group B, 5 failed after 300 cycles, 10 after 400 cycles, and additional 5 after 500 cycles.”; -- “265V” in Figure G.1 of Annex G of the original text is wrong; it shall be “25V”; the curve fitting equation, equation (G.1) and equation (G.2) in Figure G.2 are wrong and corrected. This Standard was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This Standard shall be under the jurisdiction of National Technical Committee 24 on Electric and Electronic Reliability and Maintainability of Standardization Administration of China (SAC/TC 24). The drafting organizations of this Standard. The Fifth Institute of Electronics, Ministry of Industry and Information Technology, Wuhu Saibao Information Industry Technology Research Institute Co., Ltd., Institute of Electronic Engineering, Chinese Academy of Engineering Physics, The 60th Research Institute of the General Staff, The 29th Research Institute of China Electronics Technology Group Corporation, Zhongxing Telecommunication Equipment Corporation, Shenzhen TCL New Technology Ltd., Hisense Group Co., Ltd., Chongqing Electric Power Research Institute, The 28th Research Institute of China Electronics Technology Group Corporation, Shanghai Institute of Process Automation & Instrumentation, AVIC 301 Institute. The drafters of this Standard. Wang Xuekong, Hu Xianghong, Li Kai, Cheng Debin, Gao Jun, Li Jing, Xie Limei, Liu Yazhi, Zhu Liang, Jiang Nianchao, Li Yan, You Rongxian, Fan Weiqi, Liu Fenglei, Ji Jing, Zhang Ying, Li Jiajia, Wu Yueqin.1 ScopeThis standard provides guidance on the application of various accelerated test techniques for measurement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product/item and their mitigation is instrumental to ensure dependability of an item.2 Normative referencesThe following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.3 Terms, definitions, symbols and abbreviationsratio between the item failure distribution characteristics or reliability measures (e.g., failure intensities) of an item when it is subject to stresses in expected use and those the item acquires when the higher-level stresses are applied for achieving a shorter test duration4 General description of the accelerated test methodsType C tests are mostly used for estimation of the life time of components where wear out in active use is the dominating failure mode; for example, switches, keyboards, relays, connectors or bearings. The data from these tests are often analyzed using the Weibull distribution, and often in the form of the so-called “sudden death test” (see IEC 60605-2).5 Accelerated test modelsThe goal in accelerated testing is to measure the reliability and verify acceptable reliability performance of the product within a short period of time. The advantage of the Type C2 test is that in a short time, by speeding up the stress repetition, the cumulative damage can be reproduced within a much shorter time than in regular use.6 Accelerated testing strategy in product developmentAssemblies are often tested for each stress type separately. But since there are more interactions possible in an assembly than in a component, combined stresses are more important for assemblies. Often assemblies have a size and a function suitable for a HALT test since HALT test often do not work well with small items (components) or large items (systems).7 Limitations of accelerated testing methodologyThere are several major limitations of accelerated reliability testing methodologies shown in the following list (which is not exhaustive). ......Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al. Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of English version of GB/T 34986-2017 be delivered?Answer: The full copy PDF of English version of GB/T 34986-2017 can be downloaded in 9 seconds, and it will also be emailed to you in 9 seconds (double mechanisms to ensure the delivery reliably), with PDF-invoice.Question 2: Can I share the purchased PDF of GB/T 34986-2017_English with my colleagues?Answer: Yes. 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