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GB/T 20726-2015: Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis Delivery: 9 seconds. True-PDF full-copy in English & invoice will be downloaded + auto-delivered via email. See step-by-step procedure Status: Valid GB/T 20726: Historical versions
Similar standardsGB/T 20726-2015: Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT20726-2015 GB NATIONAL STANDARD OF THE PEOPLE’S REPUBLIC OF CHINA ICS 71.040.99 G 04 GB/T 20726-2015 / ISO 15632.2012 Replacing GB/T 20726-2006 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632.2012, IDT) Issued on: OCTOBER 9, 2015 Implemented on: SEPTEMBER 1, 2016 Issued by. General Administration of Quality Supervision, Inspection and Quarantine; Standardization Administration Committee. Table of ContentsForeword ... 3 Introduction ... 4 1 Scope ... 5 2 Normative references ... 5 3 Terms and definitions ... 5 4 Requirements ... 8 5 Check of further performance parameters ... 10 Annex A (Normative) Measurement of line widths (FWHMs) to determine the energy resolution of the spectrometer ... 11 Annex B (Normative) Determination of the L/K ratio as a measure for the energy dependence of the instrumental detection efficiency ... 16 Bibliography ... 19ForewordThis Standard was drafted in accordance with the rules given in GB/T 1.1-2009. This Standard replaces GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors. Compared with GB/T 20726-2006, the main changes are as follows. - changed the name in Chinese language to “Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis”; - added some terms and definitions (see 3.2, 3.2.1, 3.2.2, 3.3~3.5, 3.12, 3.13); - modified some terms and definitions (see 3.8~3.11 if this Edition, 2.4~2.7 of 2006 Edition); - deleted the term and definition of instrument background (see 2.8 of 2006 Edition); - added Clause 5 “Verification of other performance parameters” (see Clause 5); - added necessary bibliography which contributes to understanding of this Standard (see Bibliography). The Chinese document which has consistency with the international normative reference in this Standard is as follows. - GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary (ISO 23833.2006, IDT) This Standard was proposed by and shall be under the jurisdiction of National Technical Committee on Microbeam Analysis of Standardization Administration of China. Main drafting organization of this Standard. Institute of Geology and Geophysics of Chinese Academy of Sciences. Main drafters of this Standard. Zeng Rongshu, Xu Wendong, Mao Qian, Ma Yuguang. This Standard was issued on August 1, 2007 for the first time. This is the first revision. Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis1 ScopeThis Standard defines the most important quantities that characterize an energy-dispersive X-ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts. This Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid-state ionization. This Standard specifies minimum requirements and how relevant instrumental performance parameters are to be checked for such spectrometers attached to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA). The procedure used for the actual analysis is outlined in ISO 22309[2] and ASTM E1508[3] and is outside the scope of this Standard.2 Normative referencesThe following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 23833 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary3 Terms and definitionsFor the purposes of this Standard, the terms and definitions given in ISO 23833 and the following apply. NOTE With the exception of 3.1, 3.2, 3.2.1, 3.2.2, 3.11, 3.12 and 3.13, these definitions are given in the same or analogous form in ISO 22309[2], ISO 18115-1[4] and ISO 23833. 3.1 energy-dispersive X-ray spectrometer ......Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al. |
