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Std ID Description (Standard Title)
SJ/T 11460.4-2018 (Liquid gas forging hammer)
SJ/T 11684-2018 (Technical regulations for the design of the surrounding area of ​​the shipbuilding base)
SJ/T 11720-2018 High performance computer. Blade server. Compute blade technical requirement for mechanical
SJ/T 11723-2018 Electrolyte solution used for lithium ion battery
SJ/T 11724-2018 Electrolyte solution used for lithium primary battery
SJ/T 11726-2018 Implementation guidance for brand cultivating management system. Electronics and information industry
SJ/T 11727-2018 (Standard penetration test procedure)
SJ/T 11728-2018 Social responsibility management system of information and communication technology industry
SJ/T 11729-2018 Specifications of product lifecycle management (PLM)
SJ/T 11730-2018 Specification of process data management
SJ/T 11731-2018 Specification of steel supply chain collaboration. Requirements and general framework
SJ/T 11732-2018 (Ultra long bag pulse bag filter)
SJ/T 207.1-2018 Management system for design document--Part 1: Classification and composition of design document
SJ/T 2268-2018 (Nickel-based alloy powder for laser melting in selected area)
SJ 20527/10-2016 (Detailed specification of high-power solid-state amplifier for microwave component WZFD1212-300)
SJ 20527/11-2016 (Detailed specification of high-power solid-state amplifier for microwave component WZFD1516-600)
SJ 20527/12-2016 (Detailed specification of high-power solid-state amplifier for microwave component WZFD1617-300)
SJ 20527/9-2016 (Detailed specification of high-power solid-state amplifier for microwave component WZFD0811-60)
SJ 21150-2016 (Microwave Component Printed Circuit Board Design Guide)
SJ 21151-2016 (Microwave Component Product Design Guide)
SJ 21152-2016 (Microwave component component selection guide)
SJ 21153-2016 (Microwave component chip mounting process technical requirements)
SJ 21154-2016 Technique requirements for installation of microwave assembly
SJ 21155-2016 (Microwave component chip resistors, capacitors, manual soldering process technical requirements)
SJ 21156-2016 (Microwave module Ω bridge fabrication and installation process technical requirements)
SJ 21157-2016 (Microwave component connection installation process technical requirements)
SJ 21158-2016 (Microwave component capping process technical requirements)
SJ 21159-2016 (Technical requirements for laser sealing process of microwave components)
SJ 21160-2016 (Microwave module low pressure leak test method)
SJ 21162-2016 (Microwave filter test method)
SJ 21164-2016 (Technical requirements for MEMS inertial device wafer thinning and polishing process)
SJ 21165-2016 (MEMS inertial device wet etching process technical requirements)
SJ 21166-2016 (MEMS inertial device dicing process technical requirements)
SJ 21167-2016 (MEMS inertial device wafer bonding process technical requirements)
SJ 21168-2016 (MEMS inertial device metal film growth process technical requirements)
SJ 21169-2016 (MEMS inertial device dry etching process technical requirements)
SJ 21170-2016 (MEMS inertial device dielectric film growth process technical requirements)
SJ 21171-2016 (MEMS inertial device lithography process technical requirements)
SJ 21172-2016 (Printed board safety performance evaluation)
SJ 21173-2016 (Rigid printed board design requirements)
SJ 21174-2016 (Method for inspection of appearance and dimensions of rigid substrates for printed circuits)
SJ 21175-2016 (Test method for physical properties of rigid substrates for printed circuits)
SJ 21176-2016 (Test method for chemical properties of rigid substrates for printed circuits)
SJ 21177-2016 (Test method for electrical properties of rigid substrates for printed circuits)
SJ 21178-2016 (Test method for mechanical properties of rigid substrates for printed circuits)
SJ 21179-2016 (Environmental test method for rigid substrates for printed circuits)
SJ 21180-2016 (Method for inspection of appearance and dimensions of flexible substrates for printed circuits)
SJ 21181-2016 (Physical properties test method for flexible substrates for printed circuits)
SJ 21182-2016 (Test method for chemical properties of flexible substrates for printed circuits)
SJ 21183-2016 (Electrical properties test method for flexible substrates for printed circuits)
SJ 21184-2016 (Test method for mechanical properties of flexible substrates for printed circuits)
SJ 21185-2016 (Environmental test method for flexible substrates for printed circuits)
SJ 21186-2016 (Flexible copper clad laminate specification for printed circuits)
SJ 21187-2016 (Cover specification for flexible printed circuits)
SJ 21188-2016 (Specification for bonding materials for flexible printed circuits)
SJ 21189-2016 (Copper clad metal-based laminate specification for printed circuits)
SJ 21190-2016 (Specification for metal foil for printed circuits)
SJ 21191-2016 (Marking ink specification for printed boards)
SJ 21192-2016 (Printed board general specification)
SJ 21193-2016 (Printed board ion migration test methods and requirements)
SJ 21194-2016 (Printed board interconnection stress test methods and requirements)
SJ 21195-2016 (Printed board continuity test method and requirements)
SJ 21196-2016 (Process verification method for low temperature co-fired ceramic degumming sintering furnace)
SJ 21197-2016 (Thick film chain sintering furnace process verification method)
SJ 21198-2016 (Laser trimming machine process verification method)
SJ 21199-2016 (Horizontal plasma enhanced chemical vapor deposition (PECVD) equipment process verification method)
SJ 21200-2016 (General specification for flat plasma enhanced chemical vapor deposition equipment)
SJ 21227-2016 (Aerospace grade tantalum capacitor process validation documentation requirements)
SJ 21228-2016 (Aerospace grade tantalum capacitor manufacturing process control requirements)
SJ 21229-2016 (Aerospace grade tantalum capacitor inconsistent control requirements)
SJ 21230-2016 (Structural Analysis of Tantalum Capacitors)
SJ 21231-2016 (Key material selection and control requirements for aerospace grade tantalum capacitors)
SJ 21232-2016 (Limit test for tantalum capacitors for aerospace)
SJ 21233-2016 (Aerospace grade tantalum capacitor design requirements)
SJ 21234-2016 (Aerospace grade tantalum capacitor production line control requirements)
SJ 21240-2018 (General specification for cantilever plating systems)
SJ 21241-2018 (General specification for electroless plating stations)
SJ 21242-2018 (General specification for wafer bump plating equipment)
SJ 21243-2018 (Lead frame plating system general specification)
SJ 21244-2018 (High-speed automatic plating system general specification)
SJ 21245-2018 (General specification for vacuum soldering equipment)
SJ 21246-2018 (Precision assembly system process verification method)
SJ 21247-2018 (Micro-assembly electroplating system process verification method)
SJ 21248-2018 Technological verification procedures for vacuum soldering equipment
SJ 21256-2018 Technological verification procedures for film sputtering equipment
SJ 21257-2018 (General specification for ion beam sputtering coating equipment)
SJ 21258-2018 (Dry etching equipment process verification method)
SJ 21259-2018 Technological verification procedures for polishing equipment
SJ 21260-2018 Technological verification procedures for metal-organic chemical vapor deposition(MOCVD)equipment
SJ 21303-2018 (General requirements for electronic equipment PBOM and MBOM)
SJ 21304-2018 (Electronic equipment digital technology basic terminology)
SJ 21305-2018 (Manufacturability analysis requirements for electronic equipment printed board assemblies)
SJ 21306-2018 (3D model simplification and lightweight requirements for electronic equipment)
SJ 21307-2018 (Electronic equipment sheet metal craft method graphic symbol)
SJ 21308-2018 (Electronic equipment based on model definition of sheet metal process representation)
SJ 21309-2018 (Electronic equipment assembly process method graphic symbol)
SJ 21310-2018 (Assembly process representation of electronic equipment based on model definition)
SJ 21311-2018 (Electronic equipment three-dimensional machine plus process data set requirements)
SJ 21312-2018 (General requirements for digital measurement of electronic equipment structures)
SJ 21313-2018 (General requirements for simulation analysis of electronic equipment structure dynamics)