JB/T 8290-2011 PDF English
US$85.00 · In stock · Download in 9 secondsJB/T 8290-2011: Non-destructive testing instruments - Magnetic particle flaw detectors Delivery: 9 seconds. True-PDF full-copy in English & invoice will be downloaded + auto-delivered via email. See step-by-step procedureStatus: Valid JB/T 8290: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivery | Name of Chinese Standard | Status |
| JB/T 8290-2011 | English | 85 |
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Non-destructive testing instruments - Magnetic particle flaw detectors
| Valid |
| JB/T 8290-1998 | English | 359 |
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Magnetic particle flaw detectors
| Obsolete |
| JB/T 8290-1995 | English | RFQ |
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(Chinese Industry Standard)
| Obsolete |
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JB/T 8290-2011: Non-destructive testing instruments - Magnetic particle flaw detectors---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/JBT8290-2011
JB
MECHANICAL INDUSTRY STANDARD OF
THE PEOPLE’S REPUBLIC OF CHINA
ICS 19.100
N 78
Record No.. 34825-2012
Replacing JB/T 8290-1998
Non-destructive Testing Instruments –
Magnetic Particle Flaw Detectors
Issued on: DECEMBER 20, 2011
Implemented on: APRIL 1, 2012
Issued by. Ministry of Industry and Information Technology of the
People's Republic of China
Table of Contents
Foreword... 4
1 Scope... 6
2 Normative References... 6
3 Terms and Definitions... 7
4 Technical Requirements... 7
4.1 Environmental and Operating Conditions... 7
4.2 Type and Specification... 7
4.3 Magnetizing System... 7
4.4 Holding Device... 8
4.5 Magnetic Ink Transfer System... 9
4.6 Lighting Device... 9
4.7 Demagnetizing Device... 9
4.8 Safety Requirements... 9
4.9 Transportation Bump Resistance Performance... 11
4.10 Other Requirements... 11
5 Quality Assurance... 11
6 Inspection Methods... 12
6.1 Inspection Conditions... 12
6.2 Appliances Used for Inspection... 12
6.3 Inspection on Rated Circumferential Magnetizing Current and Rated
Longitudinal Magnetizing Ampere Turns... 12
6.4 Inspection on Relative Errors of Indicated Values of Rated Circumferential
Magnetizing Current and Rated Longitudinal Magnetizing Ampere Turns... 13
6.5 Inspection on Bypass Current... 14
6.6 Inspection on Tangential Magnetic Field Strength... 14
6.7 Inspection on Safety Voltage of Circular Magnetizing Device and Longitudinal
Magnetizing Device... 14
6.8 Inspection on Remanence Induction Strength... 14
6.9 Inspection on Illumination... 14
6.10 Inspection on Temperature... 14
6.11 Inspection on Continuity of Protective Grounding Circuit... 15
6.12 Inspection on Insulation Resistance... 15
6.13 Inspection on Dielectric Strength... 15
6.14 Inspection on Transportation Bump Resistance Performance... 15
6.15 Visual Inspection... 16
7 Inspection Rules... 16
7.1 Exit-factory Inspection... 16
7.2 Type Inspection... 16
7.3 Judgment Rules... 16
8 Marking and packaging... 17
8.1 Marking... 17
8.2 Packaging... 17
Table 1 Basic Types and Specifications of Magnetic Particle Flaw Detectors... 8
Table 2 Permissible Temperature of the Basic Parts of Magnetic Particle Flaw
Detectors... 10
Table 3 Specified Continuity Value of Protective Grounding Circuit... 10
Table 4 Specified Value of Voltage for Dielectric Strength Test... 11
Foreword
This Standard replaces JB/T 8290-1998 "Magnetic Particle Flaw Detectors".
Compared with JB/T 8290-1998, The main changes of this Standard are as follows.
- The technical requirements and inspection methods for tangential magnetic field
strength of magnetic particle flaw detectors were added (4.3.3 and 6.6 of this
edition);
- The technical requirements and inspection methods for visible light illumination
of magnetic particle flaw detectors were added (4.6 and 6.9.2 of this edition);
- The technical requirements and inspection methods for bypass current of
magnetic particle flaw detectors were added (4.3.4 and 6.5 of this edition);
- The technical requirements and inspection methods for safety voltage of
magnetic particle flaw detectors were added (4.8.2.4 and 6.7 of this edition);
- The technical requirements and inspection methods for continuity of protective
grounding circuit of magnetic particle flaw detectors were added (4.8.2.1 and
6.11 of this edition);
- Quality assurance of magnetic particle flaw detectors was added (Chapter 5 of
this edition);
- Chapters 3 and 4 of 1998-edition were deleted.
The national standards of technical requirements and inspection methods that are
relevant to this Standard are as follows.
GB 5226.1-2008 Electrical Safety of Machinery - Electrical Equipment of
Machines - Part 1.General Requirements;
GB/T 15822.3-2005 /
ISO 9934-3.2002
Non-destructive Testing - Magnetic Particle Testing - Part
3.Equipment.
This Standard was proposed by China Machinery Industry Federation.
This Standard shall be under the jurisdiction of the National Technical Committee on
Testing Machines of Standardization Administration of China (SAC/TC122).
Chief drafting organization of this Standard. Changchun Research Institute for
Mechanical Science Co., Ltd.
Participating drafting organizations of this Standard. Nanjing Dongdian Testing
Equipment Co., Ltd., Jiangsu Sheyang Shengjieda Flaw Detection Equipment
Non-destructive Testing Instruments -
Magnetic Particle Flaw Detectors
1 Scope
This Standard specifies the technical requirements, inspection methods, inspection
rules, marking and packaging of magnetic particle flaw detectors (hereinafter referred
to as "flaw detectors").
This Standard is applicable to alternating current, direct current, half-wave rectified and
full-wave rectified flaw detectors; it is not applicable to the yoke type magnetic particle
flaw detectors.
2 Normative References
The following standards contain provisions which, through reference in this text,
constitute the provisions of this Standard. For dated references, the subsequent
amendments (excluding corrections) or revisions of these publications do not apply.
However, the parties who enter into agreement based on this Standard are encouraged
to investigate the possibility of applying the most recent editions of the standards
indicated below. For undated references, the latest edition of the normative document
referred to applies.
GB/T 2611-2007 General Requirements for Testing Machines
GB/T 5097-2005 Non-destructive Testing - Penetrant Testing and
Magnetic Particle Testing - Viewing Conditions (ISO
3509.2001, IDT)
GB/T 19001 Quality Management Systems - Requirements (GB/T
19001-2008, ISO 9001.2008, IDT)
GB/T 12604.5-2008 Non-destructive Testing - Terminology - Terms Used in
Magnetic Particle Testing
JB/T 6147-2007 Requirements for the Packaging, Packaging Marking
and Handling of Testing Machine Products
JB/T 7406.2-1994 Testing Machine Terminology - Non-destructive Test
Instrument
3 Terms and Definitions
For the purposes of this Standard, the terms and definitions established in GB/T
12604.5 and JB/T 7406.2 apply.
4 Technical Requirements
4.1 Environmental and Operating C...
......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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