YS/T 785-2012 English PDF

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YS/T 785-2012: Determination of relative crystallinity of zeolite sodium A by X-ray diffraction
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
YS/T 785-2012	159	Add to Cart	3 days	Determination of relative crystallinity of zeolite sodium A by X-ray diffraction	Valid

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Basic data

Standard ID: YS/T 785-2012 (YS/T785-2012)
Description (Translated English): Determination of relative crystallinity of zeolite sodium A by X-ray diffraction
Sector / Industry: Nonferrous Metallurgy Industry Standard (Recommended)
Classification of Chinese Standard: H25
Classification of International Standard: 87.060.10
Word Count Estimation: 6,664
Regulation (derived from): Ministry of Industry and Information Technology Bulletin 2012 No. 20; industry standard filing Notice 2012 No. 10 (No. 154 overall)
Issuing agency(ies): Ministry of Industry and Information Technology
Summary: This standard specifies the X-ray diffraction pattern of zeolite NaA method of measuring the relative degree of crystallinity. This standard applies to the relative crystallinity of NaA zeolite determination.

YS/T 785-2012: Determination of relative crystallinity of zeolite sodium A by X-ray diffraction

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Determination of relative crystallinity of zeolite sodium A by X-ray diffraction ICS 87.060.10 H25 People's Republic of China Nonferrous Metals Industry Standard NaA zeolite relative crystallinity determination X-ray diffraction method Issued on. 2012-05-24 2012-11-01 implementation Ministry of Industry and Information Technology of the People's Republic of China released

Foreword

This standard is in accordance with GB/T 1.1-2009 given rules drafted. This standard by the national non-ferrous metals Standardization Technical Committee (SAC/TC243) centralized. This standard was drafted. Aluminum Corporation of China Shandong Branch, China Nonferrous Metals Industry Standards and Metrology Institute for Quality. The main drafters. Zhang Shugui, Han Gang, Shao Jing, Xu Hao-wen, Zhong Yi sister, Pei Yan. NaA zeolite relative crystallinity determination X-ray diffraction method

1 Scope

This standard specifies the method for determination by X-ray diffraction NaA zeolite relative crystallinity. This standard applies to the determination of the relative NaA zeolite crystallinity.

2 Method summary

At the same X-ray diffraction conditions were determined NaA zeolite reference sample and NaA zeolite sample to be tested six facets Integrated intensity of the diffraction line, of the tested samples the reference sample diffraction intensity ratio of the diffraction intensity of the test sample is the relative degree of crystallinity.

3 reference sample

Under laboratory conditions synthesized highly crystalline zeolite NaA, or consultations identified the samples as a relative degree of crystallinity measured by reference sample.

4 instruments and equipment

4.1 agate mortar. 4.2 X-ray diffractometer. 4.3 Oven. 100 ℃ ± 5 ℃. 4.4 dryer. equipped with NH4Cl saturated solution.

5 measurement sample preparation

5.1 The reference sample (3) and the sample ground in dry cleaned agate mortar (4.1), respectively, to an average particle diameter of 5μm or less. 5.2 The reference sample and the test sample was placed in an oven (4.3) for drying at 100 ℃ ± 5 ℃ 2h or more. 5.3 The sample after drying desiccator (4.4), and stable at room temperature for more than 2h. 5.4 Method with sample back pressure, required to measure the surface smooth, crack-free.

6 measurement conditions

6.1 Cukα radiation. 6.2 Scanning speed. 2θ0.25 °/min. 6.3 Step value. 2θ0.002 °. 6.4 divergence slit (DS). 1 °. 6.5 Scattering slit (SS). 1 °. 6.6 receiving slit (RS). 0.3mm. ......

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