YS/T 1160-2016 English PDFUS$249.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. YS/T 1160-2016: Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
Basic dataStandard ID: YS/T 1160-2016 (YS/T1160-2016)Description (Translated English): Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction Sector / Industry: Nonferrous Metallurgy Industry Standard (Recommended) Classification of Chinese Standard: H12 Classification of International Standard: 29.045 Word Count Estimation: 7,736 Date of Issue: 2016-07-11 Date of Implementation: 2017-01-01 Regulation (derived from): Notice of the Ministry of Industry and Information Technology (2016 No. 37) Issuing agency(ies): Ministry of Industry and Information Technology Summary: This standard specifies the method for determining the silica content of industrial silicon powder. YS/T 1160-2016: Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. Silicon powder-quantitative phase analysis.Determination of silicon dioxide content.Value K method of X-ray diffraction ICS 29.045 H12 People's Republic of China Nonferrous Metals Industry Standard Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K-value method ValueK methodofX-raydiffraction Released on.2016-07-11 2017-01-01 implementation Ministry of Industry and Information Technology of the People's Republic of China ForewordThis standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard is proposed and managed by the National Nonferrous Metals Standardization Technical Committee (SAC/TC243). This standard was drafted. Kunming Institute of Metallurgy, Guangzhou Nonferrous Metal Research Institute, National Nonferrous Metals and Electronic Materials Analysis and Testing Center, Yunnan Yongchang Silicon Industry Co., Ltd., Tongbiao Standard Technology Service Co., Ltd. The main drafters of this standard. Li Heping, Hu Yaodong, Yuan Wei, Jin Ziqin, Gao Wei, Yang Lin, Zhang Jing, Wang Shuming, Li Yang, Wang Zhongying, Wang Jianbo. Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K-value method1 ScopeThis standard specifies the method for determining the silica content of industrial silicon powder. This standard applies to the determination of silica content in industrial silicon powder, the measurement range is ≥ 1%.2 Normative referencesThe following documents are indispensable for the application of this document. For dated references, only the dated version applies to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 8170 Numerical Rounding Rules and Representation and Determination of Limit Values3 Principle of the methodWhen X-rays illuminate the crystalline material, diffraction will occur, and each crystalline material has its own specific diffraction characteristics. Under certain conditions, The intensity of diffraction produced by a substance in a mixed substance is proportional to the content. Measuring the intensity of the diffraction line, when the measured substance and the known content are referenced After the intensity of the diffraction line of the substance is determined, the measured substance can be quantitatively analyzed.4 reagents and materials4.1 Anhydrous ethanol, analytically pure. 4.2 Reference substance α-Al2O3, analytically pure. 4.3 SiO2, analytically pure. 4.4 Frosted glass, the thickness of the matte surface is 0.1mm, and the area is not less than 8cm×8cm.5 Instruments and equipment5.1 X-ray diffractometer. 5.2 Analytical balance, the sensitivity is 0.1mg. 5.3 Agate mortar. 5.4 Sample frame.6 sample preparationα-Al2O3, SiO2 and the sample should pass through a 0.0374mm standard sieve. ...... |
