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SJZ11352-2006 English PDF

Standard IDUSDBUY PDFLead-DaysStandard Title (Description)Status
SJ/Z 11352-20061519 Add to Cart 6 days Integrated circuit IP core test data interchange formats and guidelines specification Obsolete

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Basic data

Standard ID: SJ/Z 11352-2006 (SJ/Z11352-2006)
Description (Translated English): Integrated circuit IP core test data interchange formats and guidelines specification
Sector / Industry: Electronics Industry Standard
Classification of Chinese Standard: L56
Classification of International Standard: 31.200
Word Count Estimation: 38,334
Date of Issue: 2006-09-26
Date of Implementation: 2006-12-01
Regulation (derived from): Industry Standard Notice 2006 No. 11 (No. 83 overall)
Issuing agency(ies): Ministry of Industry and Information Technology
Summary: This standard specifies the IP providers and IP integration to pass information between the parties and the nature of the format. The specification for the integrated circuit IP cores (Intellectual Property Core, hereinafter referred to as IP) provider has developed test data exchange formats and design for testability (DFT, Design-for-Test) guidelines. In addition, the specification also provides IP providers to develop some guidelines to ensure that IP can be used for SoC designs. Data format for the IP range covers IC create, define, describe switching and integrated.