JJG 768-2005 English PDF

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JJG 768-2005: Verification Regulation of Emission Spectrometer
Status: Valid

JJG 768: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
JJG 768-2005	599	Add to Cart	4 days	Verification Regulation of Emission Spectrometer	Valid
JJG 768-1994	439	Add to Cart	4 days	Verification Regulation of Emission Spectrometer	Obsolete
JJG 768-1992	RFQ	ASK	3 days	(Chinese Industry Standard)	Obsolete

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Basic data

Standard ID: JJG 768-2005 (JJG768-2005)
Description (Translated English): Verification Regulation of Emission Spectrometer
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: A60
Classification of International Standard: 17.180
Word Count Estimation: 23,226
Date of Issue: 2005-09-05
Date of Implementation: 2006-03-05
Older Standard (superseded by this standard): JJG 768-1994
Quoted Standard: JJF 1001-1998; JJF 1059-1999 OIML R116
Regulation (derived from): State Administration of Quality Supervision, Inspection and Quarantine Notice No. 135
Summary: This standard applies to emission spectrometer (hereinafter referred to as the instrument) for initial verification, testing and use of follow-up inspection. Shape identification and prototype instrument for measuring performance test trials can be carried out with reference to the rules.

JJG 768-2005: Verification Regulation of Emission Spectrometer

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Verification Regulation of Emission Spectrometer National Metrology Verification Regulations of the People's Republic Emission spectrometer Released on.2005-09-05 2006-03-05 implementation The General Administration of Quality Supervision, Inspection and Quarantine issued Replace JJG 768-1994 This regulation was approved by the General Administration of Quality Supervision, Inspection and Quarantine on September 5,.2005, and It will take effect on March 5,.2006. Focal Point. National Physical and Chemical Metrology Technical Committee Drafting unit. National Standards Research Center This procedure entrusts the National Physical and Chemical Metrology Technical Committee to explain The main drafters of this procedure. Tian Guanghui (National Reference Materials Research Center) Participate in the drafters. Li Yunqiao (National Reference Materials Research Center) Sinai (National Center for Reference Materials Research)

table of Contents

1 Scope (1) 2 Citations (1) 3 Overview (1) 3.1 Instrument principle and use (1) 3.2 Instrument structure (1) 3.3 Instrument Classification (1) 4 Metrology performance requirements (1) 4.1 ICP spectrometer measurement performance requirements (1) 4.2 (Spark/Arc) Direct Reading Spectrometer Measurement Performance Requirements (1) 4.3 Spectrometer measurement performance requirements (2) 5 General technical requirements (3) 5.1 Appearance (3) 5.2 Security Performance (3) 6 measuring instrument control (3) 6.1 Verification conditions (3) 6.2 Verification project (4) 6.3 Verification method (4) 6.4 Processing of verification results (7) 6.5 verification period (8) Appendix A Standard Solution for ICP Spectrometer Verification (9) Appendix B ICP Spectrometer Verification Record Format (10) Appendix C Direct Reading Spectrometer Verification Record Format (13) Appendix D Spectrograph Verification Record Format (15) Appendix E Certification Certificate Page Format (17) Appendix F Format of the verification result page (18) Emission spectrometer verification procedure

1 Scope

This procedure is applicable to the first verification, subsequent verification and in-use inspection of the emission spectrometer (hereinafter referred to as the instrument). The metering performance test in the identification and prototype test of the instrument can be carried out with reference to this regulation.

2 Citations

This procedure refers to the following documents. JJF1001-1998 General Terms and Definitions JJF1059-1999 "Measurement and Expression of Measurement Uncertainty" OIMLR116 "Inductivetycoupledplasmaatomicemissionspectrometersformeas- "urementofmetalpolutantsinwater" "Plasma emission spectrometer for the determination of contaminated metal ions in water" Use of this procedure should take care to use the current valid version of the above cited documents.

3 Overview

3.1 Instrument principle and use The emission spectrometer is based on the atoms or ions of the element to be measured, and is excited in the light source to generate characteristic radiation. Judging the existence of this characteristic radiation and the magnitude of its intensity, qualitative and quantitative analysis of each element. It is mainly used for Sample analysis in metallurgy, geology, petroleum, environmental protection, chemicals, food, medicine, etc. 3.2 Instrument structure The main structural block diagram of the instrument is shown below. Injection System--- Excitation Source--- Dispersion System--- Control and Detection System--- Output System 3.3 Instrument classification The instrument is divided into three categories according to the excitation light source and the detection system. The first category. inductively coupled plasma emission spectroscopy Instrument (referred to as ICP spectrometer), including sequential scanning type, multi-channel simultaneous type (detector is photomultiplier tube), full spectrum Direct reading type (detector is CCD or CID) and other types; second type. spark/arc direct reading spectrometer (referred to as straight Read spectrometers, including both large and portable types; third category. spectrographs.

4 Metrological performance requirements

4.1 ICP spectrometer measurement performance requirements The measurement performance requirements of ICP spectrometer are shown in Table 1. 4.2 (Spark/Arc) Direct Reading Spectrometer Measurement Performance Requirements The metering performance requirements of the direct reading spectrometer are shown in Table 2. ......

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