JJG 570-2006 English PDFJJG 570: Historical versions
Basic dataStandard ID: JJG 570-2006 (JJG570-2006)Description (Translated English): Verification Regulation of Capacitance Comparators Sector / Industry: Metrology & Measurement Industry Standard Classification of Chinese Standard: A52 Classification of International Standard: 17.040 Word Count Estimation: 16,14 Date of Issue: 2006-03-08 Date of Implementation: 2006-09-08 Older Standard (superseded by this standard): JJG 570-1988 Quoted Standard: State Administration of Quality Supervision, Inspection and Quarantine Notice 2006 No. 33 Regulation (derived from): State Administration of Quality Supervision, Inspection and Quarantine Notice 2006 No. 33 Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine Summary: This standard applies to range not greater than 2000��m, resolution of 1nm ~ 0. 5��m capacitive micrometer initial verification, testing and use of follow-up inspection. JJG 570-2006: Verification Regulation of Capacitance Comparators---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.Verification Regulation of Capacitance Comparators National Metrology Verification Regulations of the People's Republic Capacitive micrometer Released on.2006-03-08 2006-09-08 implementation The General Administration of Quality Supervision, Inspection and Quarantine issued Capacitance micrometer verification procedure CapacitanceComp Arators Replace JJG 570-1988 This regulation was approved by the General Administration of Quality Supervision, Inspection and Quarantine on March 8,.2006, and since.2006. It will take effect on September 8th. Focal Point. National Geometric Quantity Engineering Measurement Technology Committee Main drafting unit. Henan Institute of Metrology Tianjin University This regulation entrusts the National Geometric Quantity Engineering Parametric Measurement Technical Committee to explain The main drafters of this procedure. Ren Fangping (Henan Institute of Metrology) Huang Yuzhu (Henan Institute of Metrology) Jia Xiaojie (Henan Institute of Metrology) Zheng Yizhong (Tianjin University) Participate in the drafters. Ge Weisan (Henan Institute of Metrology) table of Contents1 Scope (1) 2 Citations (1) 3 Overview (1) 4 Metrological performance requirements (2) 4.1 indication repeatability (2) 4.2 Response time (2) 4.3 indication error (2) 4.4 Discrimination (2) 4.5 Stability (2) 4.6 Zero adjustment range (2) 4.7 Measurement performance requirements of pointer type capacitance micrometer (2) 5 General technical requirements (2) 5.1 Appearance (2) 5.2 Interaction of various parts (2) 6 measuring instrument control (2) 6.1 Verification conditions (2) 6.2 Verification project (3) 6.3 Verification method (3) 6.4 Processing of verification results (5) 6.5 verification period (5) Appendix A Verification Certificate and Verification Result Notice (inside page) format (6) Appendix B Technical requirements for standard baffles (7) Appendix C Verification of Pointer Capacitance Micrometer (8) Appendix D Measurement Uncertainty Analysis of Capacitance Micrometer Indication Error (9) Capacitance micrometer verification procedure1 ScopeThis procedure is applicable to the first time of a capacitive micrometer with a range of not more than.2000μm and a resolution of 1nm~0.5μm. Verification, follow-up verification and in-use inspection.2 CitationsJJF1001-1998 general measurement terms and definitions JJF1059-1999 Measurement Uncertainty Evaluation and Representation JJF1094-2002 technical specifications for measuring instrument characteristics When using this procedure, care should be taken to use the currently valid version of the above cited documents.3 OverviewCapacitive micrometer is a non-contact precision measuring instrument using the principle of capacitance frequency modulation or capacitance calculation. Geometric measurement in the mechanical, plastic and other industries. The appearance of the capacitive micrometer and sensor is shown in Figure 1. Capacitive The micrometer can be equipped with a complete set of sensors. Figure 1 Electrical box of a capacitive micrometer 1-display; 2-zero potentiometer; 3-sensor input Figure 2 Sensor of a capacitive micrometer 1-sensor; 2-cable ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of JJG 570-2006_English be delivered?Answer: Upon your order, we will start to translate JJG 570-2006_English as soon as possible, and keep you informed of the progress. The lead time is typically in 9 seconds (download/delivered in 9 seconds). The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of JJG 570-2006_English with my colleagues?Answer: Yes. The purchased PDF of JJG 570-2006_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.Question 3: Does the price include tax/VAT?Answer: Yes. 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Complying with the latest version means that, by default, it also complies with all the earlier versions, technically. |