JJG 101-2010 English PDFJJG 101: Historical versions
Basic dataStandard ID: JJG 101-2010 (JJG101-2010)Description (Translated English): Retroreflective Standard Sector / Industry: Metrology & Measurement Industry Standard Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine JJG 101-2004: Verification Regulation of Contact-type Interferometers---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.Verification Regulation of Contact-type Interferometers National Metrology Verification Regulations of the People's Republic Contact interferometer Released on.2004-09-21 2005-03-21 implementation The General Administration of Quality Supervision, Inspection and Quarantine issued Contact interferometer verification procedure Contact-typ Replacing JJG 101-1981 This regulation was approved by the General Administration of Quality Supervision, Inspection and Quarantine on September 21,.2004, and It will take effect on March 21,.2005. Focal Point. National Geometric Length Measurement Technical Committee Drafting unit. Shanghai Institute of Metrology and Testing Technology This regulation entrusts the National Geometric Length Measurement Technical Committee to explain Drafters of this procedure. Yin Dehua (Shanghai Institute of Metrology and Testing Technology) Zhang Hongshun (Shanghai Institute of Metrology and Testing Technology) table of Contents1 Scope (1) 2 Citations (1) 3 Overview (1) 4 Metrological performance requirements (2) 4.1 Characteristics of interference filters (2) 4.2 Plane degree of plane workbench, ribbed workbench, and ball workbench (2) 4.3 The height of the intermediate ribs of the ribbed table and the probe of the ball slab (2) 4.4 Adjustability of the plane table (2) 4.5 Verticality of the ribbed table and the measuring axis (2) 4.6 Roughness of work surface of workbench (2) 4.7 Relative position of the ribbed workbench, the ball workbench and the auxiliary workbench (3) 4.8 Measuring force and its adjustment range (3) 4.9 Change in indication value when measuring rod radial force (3) 4.10 Imaging quality and adjustment reliability of interference bands (3) 4.11 Symmetry of the interference zone (3) 4.12 Measurement repeatability (3) 4.13 Instrument indication error (3) 4.14 Flatness and parallelism of parallel flat crystals (3) 5 General technical requirements (3) 5.1 Appearance and interaction of various parts (3) 5.2 Identification (4) 6 measuring instrument control (4) 6.1 Verification conditions (4) 6.2 Verification project (4) 6.3 Verification method (5) 6.4 Processing of verification results (8) 6.5 verification period (8) Appendix A Technical Requirements and Verification Methods for Measuring Caps (9) Appendix B Main supporting verification tools and their technical requirements (10) Appendix C Format of verification certificate and verification result page (12) Contact interferometer verification procedure1 ScopeThis procedure applies to the first verification, subsequent verification and in-use inspection of contact interferometers.2 CitationsThis procedure refers to the following documents. JJF1001-1998 General measurement terms and definitions JJF1059-1999 Measurement Uncertainty Evaluation and Representation JB/T 8233-1999 Vertical Contact Interferometer JB/T 9342-1999 Measuring Cap for Optical Measuring Instruments When using this procedure, care should be taken to use the current valid version of the above cited documents.3 OverviewThe contact interferometer is an instrument that uses the principle of light wave interference to measure the length using a comparative method. Mainly used for verification Precision measurement of gauge blocks and other workpieces up to 150 mm. The shape of the instrument is shown in Figure 1. figure 1 1-light source; 2-light tube; 3-heat shield; 4-arm frame; 5-work table; 6-table lifting screw; 7-table fastening screw; 8-base The optical system of the instrument is shown in Figure 2. 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