JJF 1120-2004 English PDF

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JJF 1120-2004: Calibration specification for thermal ionization isotope mass spectrometers
Status: Valid

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Similar standards

GB/T 40219   GB/T 12519   JJG 2060   JJG 1120   

Basic data

Standard ID: JJF 1120-2004 (JJF1120-2004)
Description (Translated English): Calibration specification for thermal ionization isotope mass spectrometers
Sector / Industry: Metrology & Measurement Industry Standard
Classification of Chinese Standard: N54
Word Count Estimation: 17,169
Date of Issue: 2004-06-04
Date of Implementation: 2004-09-01
Quoted Standard: JJF 1001-1998; JJF 1059-1999; GB/T 15481-2000
Issuing agency(ies): State Administration of Quality Supervision, Inspection and Quarantine
Summary: This standard applies to all the different types of thermal ionization mass spectrometer isotope (hereinafter referred to as mass spectrometer) for calibration.

JJF 1120-2004: Calibration specification for thermal ionization isotope mass spectrometers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration specification for thermal ionization isotope mass spectrometers National Metrology Technical Specification of the People's Republic Thermal ionization isotope mass spectrometer calibration specification Released on June.2004 2004-09-01 implementation The General Administration of Quality Supervision, Inspection and Quarantine issued Thermal ionization isotope mass spectrometer calibration specification Ectrometers This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on June 4,.2004, and Implemented on September 1,.2004. Focal Point. National Physical and Chemical Measurement Technical Committee Drafting unit. National Standards Research Center This specification is interpreted by the focal point Drafters of this specification. Zhao Motian (National Reference Materials Research Center) Wang Jun (National Reference Materials Research Center) Bohai (National Reference Materials Research Center)

table of Contents

1 Scope (1) 2 Citations (1) 3 terms and units of measurement (1) 3.1 Isotope abundance (1) 3.2 Isotope abundance ratio (1) 3.3 Quality range (1) 3.4 resolution (1) 3.5 Peak shape factor (1) 3.6 System Stability (1) 3.7 Sensitivity (ion yield) (1) 3.8 Abundance sensitivity (2) 3.9 Measurement repeatability (2) 3.10 Fractionation effect (2) 3.11 Quality Discrimination (2) 3.12 Memory Effect (2) 4 Overview (2) 5 Measurement characteristics (2) 6 Calibration conditions (3) 6.1 Laboratory Environment (3) 6.2 Calibration Equipment (3) 6.3 Isotope Reference Materials (3) 6.4 Inspection and adjustment of calibration objects (3) 7 Calibration items and calibration methods (4) 7.1 Resolution Calibration (4) 7.2 Sensitivity calibration (5) 7.3 Abundance sensitivity calibration (5) 7.4 Peak shape coefficient calibration (5) 7.5 System Stability Calibration (6) 7.6 Internal Repeatability Calibration (6) 7.7 External Repeatability Calibration (7) 8 Expression of calibration results (8) 9 re-study interval (8) Appendix A Calibration Record Format (9) Appendix B Thermal Ionization Isotope Mass Spectrometer Calibration Certificate Format (11) Thermal ionization isotope mass spectrometer calibration specification

1 Scope

This specification applies to the calibration of various types of thermal ionization isotope mass spectrometers (hereinafter referred to as mass spectrometers).

2 Citations

JJF 1001-1998 General measurement terms and definitions JJF 1059-1999 Measurement Uncertainty Evaluation and Representation GB/T 15481-2000 General requirements for testing and calibration laboratory capabilities Use of this specification should be done with the current valid version of the above cited documents.

3 terms and units of measure

3.1 Isotope abundance The atomic share of the various isotopes possessed by an element in the element. Isotope abundance representation There are. (1) atomic fraction. the number of moles of a certain stable isotope and the total number of moles of the element Ratio; (2) atomic percentage. the atomic fraction expressed in percentage. 3.2 Isotope abundance ratio The ratio of the isotopic abundance of an element to the other isotopic abundance of that element. 3.3 Quality range The mass range represents the interval from the smallest to the largest mass of the sample that can be measured by the mass spectrometer. The unit is the atomic mass list. Bit u. 3.4 resolution Resolution Characterization The ability of a mass spectrometer to identify two adjacent mass ion beams, defined as being within the mass range of the mass spectrometer The degree to which a particular mass M position is separated from the two ion beams at the M ΔM position and expressed in M/ΔM The resolution of the meter. Dimensionless. 3.5 peak shape factor The peak shape factor characterizes the ion beam imaging characteristics, it is associated with the entrance and exit slits of the mass spectrometer, and the ion optics field shape It is closely related to the structure of the analyzer. Dimensionless. 3.6 System Stability System stability characterizes the stability of the mass spectrometer power supply system, which is measured by the stability of the ion beam. main Dependent on the ion source's accelerating voltage, magnetic field strength and stability of the sample strip, ionization strap supply current, and mass spectrometer The resolution is closely related and dimensionless. 3.7 Sensitivity (ion yield) Sensitivity characterizes the conversion efficiency of atoms (or molecules) with atomic ions (or molecular ions). Mass spectrometer When the receiver detects an isotope ion of an element, the number of atoms of the isotope to be introduced in the ion source. ......

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