GB/T 42576-2023 English PDFUS$459.00 · In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 42576-2023: Technical requirements and testing methods of BDS/GNSS high precision system on chip (SoC) Status: Valid
Basic dataStandard ID: GB/T 42576-2023 (GB/T42576-2023)Description (Translated English): Technical requirements and testing methods of BDS/GNSS high precision system on chip (SoC) Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: V04 Classification of International Standard: 31.190 Word Count Estimation: 24,294 Date of Issue: 2023-05-23 Date of Implementation: 2023-12-01 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GB/T 42576-2023: Technical requirements and testing methods of BDS/GNSS high precision system on chip (SoC)---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. ICS31:190 CCSV04 National Standards of People's Republic of China Beidou/Global Navigation Satellite System (GNSS) high precision System on Chip (SoC) Technical Requirements and Test Methods system on chip (SoC) 2023-12-01 implementation State Administration for Market Regulation Released by the National Standardization Management Committee table of contentsPreface I 1 Scope 1 2 Normative references 1 3 Terms and Definitions 2 4 Symbols and abbreviations3 4:1 Symbol 3 4:2 Abbreviations 3 5 requirements 4 5:1 General requirements 4 5:2 Composition 4 5:3 Functional requirements 5 5:4 Performance requirements 6 5:5 Electrical characteristics 9 5:6 Environmental Adaptability 9 5:7 Environmental requirements 10 6 Test method 10 6:1 Standard test signals and test equipment 10 6:2 Test site 10 6:3 Function 11 6:4 Performance 11 6:5 Electrical characteristics 16 6:6 Environmental adaptability 16 6:7 Environmental protection18 Reference 19forewordThis document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules for Standardization Documents" drafting: Please note that some contents of this document may refer to patents: The issuing agency of this document assumes no responsibility for identifying patents: This document was proposed by the Equipment Development Department of the Central Military Commission: This document is under the jurisdiction of the National Beidou Satellite Navigation Standardization Technical Committee (SAC/TC544): This document is drafted by: Shanghai Sinan Satellite Navigation Technology Co:, Ltd:, Zhongce National Inspection (Beijing) Technology Co:, Ltd:, China Satellite Navigation Engineering Center, Shanghai Qintian Navigation Technology Co:, Ltd:, Beijing Sinan Beidou Technology Development Co:, Ltd:, Beijing Dongfang Metrology and Testing Research Institute, Shanghai Institute of Metrology and Testing Technology, Hexinxingtong Technology (Beijing) Co:, Ltd:, Beijing Beidouxingtong Navigation Technology Co:, Ltd: Company, Wuhan University, Zhejiang Space-Time Daoyu Technology Co:, Ltd:, Qianxun Location Network (Zhejiang) Co:, Ltd: The main drafters of this document: Wang Liduan, Zhang Rui, Li Zuohu, Min Min, Chen Shu, Zhang Xiangyi, Guo Shuren, Zhai Chuanrun, Zhang Zhenjun, Song Yang, Zhao Yongmao, Peng Ming, Wang Tian, Cai Qing, Zhang Zhengxuan, Zhang Zhaodong, Liu Hui, Zhang Yi, Liu Junning, Yan Jianqiao, Wang Xijiang: Beidou/Global Navigation Satellite System (GNSS) high precision System on Chip (SoC) Technical Requirements and Test Methods1 ScopeThis document specifies the main principles of the Beidou/Global Navigation Satellite System (GNSS) high-precision system-on-chip (SoC) (hereinafter referred to as high-precision SoC): Requirements such as function, performance, electrical characteristics and environmental adaptability and corresponding test methods: This document is applicable to the development, testing and application of high-precision SoC:2 Normative referencesThe contents of the following documents constitute the essential provisions of this document through normative references in the text: Among them, dated references For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to this document: GB/T 2423:1 Environmental testing for electrical and electronic products - Part 2: Test methods Test A: Low temperature GB/T 2423:2 Environmental testing for electric and electronic products - Part 2: Test methods Test B: High temperature GB/T 2423:3 Environmental testing - Part 2: Test methods Test Cab: Constant damp heat test GB/T 2423:5 Environmental testing - Part 2: Test methods Test Ea and guidelines: Shock GB/T 2423:56 Environmental testing - Part 2: Test method Test Fh: Broadband random vibration and guidelines GB/T 26572-2011 Limit requirements for restricted substances in electrical and electronic products GB/T 39267-2020 Terminology of Beidou Satellite Navigation GB/T 39560:4 Determination of Certain Substances in Electrical and Electronic Products Part 4: CV-AAS, CV-AFS, ICP-OES and Determination of Mercury in Polymers, Metals and Electronics by ICP-MS GB/T 39560:5 Determination of Certain Substances in Electrical and Electronic Products Part 5: AAS, AFS, ICP-OES and ICP-MS Methods Determination of cadmium, lead, chromium in polymers and electronic parts, and cadmium and lead in metals GB/T 39560:6 Determination of Certain Substances in Electrical and Electronic Products Part 6: Determination of Polymers by Gas Chromatography-Mass Spectrometry (GC-MS) polybrominated biphenyls and polybrominated diphenyl ethers in GB/T 39560:701 Determination of certain substances in electrical and electronic products - Part 7-1: Colorimetric method for hexavalent chromium Hexavalent chromium [Cr(Ⅵ)] in colored and colored anti-corrosion coatings GB/T 39560:702 Determination of certain substances in electrical and electronic products - Part 7-2: Determination of polymers and Hexavalent Chromium [Cr(Ⅵ)] in Electronic Parts GB/T 39560:8 Determination of certain substances in electrical and electronic products - Part 8: Gas chromatography-mass spectrometry (GC-MS) and equipment Determination of Phthalates in Polymers by Pyrolysis/Thermal Desorption Gas Chromatography-Mass Spectrometry (Py/T D-GC-MS) ANSI/ESDA/JEDECJS-001-2017 Electrostatic Discharge Susceptibility Test Human Body Model (HBM) Component Level [For ANSI/ESDA/JEDECJS-002-2018 Electrostatic Discharge Susceptibility Test Charged Device Model (CDM) Equipment Level biased autoclave) ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 42576-2023_English be delivered?Answer: Upon your order, we will start to translate GB/T 42576-2023_English as soon as possible, and keep you informed of the progress. 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