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Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 42208-2022: Nanotechnologies - Measurement of nanoparticle size in multiphase system - Image method of transmission electron microscopy Status: Valid
Basic dataStandard ID: GB/T 42208-2022 (GB/T42208-2022)Description (Translated English): Nanotechnologies - Measurement of nanoparticle size in multiphase system - Image method of transmission electron microscopy Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: N33 Classification of International Standard: 17.180.01 Word Count Estimation: 19,187 Date of Issue: 2022-12-30 Date of Implementation: 2023-07-01 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GB/T 42208-2022: Nanotechnologies - Measurement of nanoparticle size in multiphase system - Image method of transmission electron microscopy---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. ICS 17.180.01 CCSN33 National Standards of People's Republic of China Nanoparticle Size Measurement in Multiphase Systems of Nanotechnology TEM imaging Posted on 2022-12-30 2023-07-01 implementation State Administration for Market Regulation Released by the National Standardization Management Committee table of contentsPreface III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 Principle 2 4.1 Overview 2 4.2 Imaging principle of transmission electron microscope 2 4.3 Image processing 2 5 sample 2 5.1 Sample requirements 2 5.2 Sample preparation method 2 6 Test Step 3 6.1 General requirements 3 6.2 Sample loading 3 6.3 Instrument preparation 3 6.4 Image Acquisition 4 7 Particle size measurement 4 7.1 Overview 4 7.2 Image Analysis 4 7.3 Results representation 5 8 Measurement uncertainty5 9 Test report 5 Appendix A (Informative) Solid Metal Multiphase System Example 7 Appendix B (Informative) Nanocomposite Example 10 Reference 13forewordThis document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for Standardization Work Part 1.Structure and Drafting Rules for Standardization Documents" drafting. Please note that some contents of this document may refer to patents. The issuing agency of this document assumes no responsibility for identifying patents. This document was proposed by the Chinese Academy of Sciences. This document is under the jurisdiction of the National Nanotechnology Standardization Technical Committee (SAC/TC279). This document was drafted by. National Nanoscience Center, National Standard (Beijing) Inspection and Certification Co., Ltd., Beijing Academy of Science and Technology Analysis Testing Institute (Beijing Physical and Chemical Analysis and Testing Center), Shenzhen Defang Nano Technology Co., Ltd., China Jiliang University, Beijing Powder technical association. The main drafters of this document. Chang Huaiqiu, Fu Xin, Qi Xiaoying, Li Ting, Du Zhiwei, Bai Lu, Han Xiaolei, Gao Yuan, Zheng Qiang, Sun Yan, Zhang Shuqin.IntroductionDue to the surface effect, quantum size effect, volume effect and quantum tunneling effect of nanomaterials, the material exhibits properties that traditional solids do not have. Some chemical, electrical, magnetic, optical and other specific properties. At the same time, limited by the size, the occasions where nanomaterials are used alone are limited, and there are often In the material matrix, a multiphase system is formed to increase the overall material properties. Due to the small particle size, large specific surface area and large surface energy of nanoparticles, they are easy to agglomerate, which makes it difficult to characterize and evaluate them in multiphase systems. price. Transmission electron microscopy is a characterization device that uses electron beam imaging through thin film samples to reveal the internal morphology and structure of the sample. prepare. It can not only observe the microscopic shape of the sample, but also characterize the internal structure of the observed area. Therefore, the TEM matching diagram Image analysis techniques can be used to measure the particle size of nanoparticles in multiphase systems. The particle size measurement of nanoparticles in the multiphase system has a great role in optimizing the structure of materials and improving the performance of materials. It is of great significance to promote the application and development of nanomaterials. Nanoparticle Size Measurement in Multiphase Systems of Nanotechnology TEM imaging1 ScopeThis document describes the use of transmission electron microscopy image processing and analysis techniques for particle size measurement of nanoparticles dispersed in multiphase systems. Quantitative method. This document is applicable to particle size measurement and particle size distribution of nanoparticles in solid-phase multiphase systems. This document is also applicable to the size of nanoparticles in colloids and biological tissues when the sample preparation meets the requirements of transmission electron microscopy observation. Measurement.2 Normative referencesThe contents of the following documents constitute the essential provisions of this document through normative references in the text. Among them, dated references For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to this document. GB/T 21649.1 Particle Size Analysis Image Analysis Method Part 1.Static Image Analysis Method GB/T 30544.4 Nanotechnology Terminology Part 4.Nanostructured Materials3 Terms and DefinitionsThe following terms and definitions defined in GB/T 30544.4 apply to this document. 3.1 Nanoparticles nanoparticles Solid particles with a particle size ranging from 1nm to 100nm. [Source. GB/T 16418-2008, 2.1.6] 3.2 disperse The process of distributing nanoparticles in a heterogeneous system. 3.3 brightfield imaging; BF A transmission electron microscope technique for electron illumination and imaging in which the electron beam penetrates the sample, using an objective diaphragm located on the back focal plane and selected to Imaging with transmitted waves. [Source. GB/T 30543-2014, 3.3] 3.4 Darkfield like darkfieldimaging; DF A transmission electron microscope technique for electron illumination and imaging in which the electron beam penetrates the sample, using an objective diaphragm located on the back focal plane and selected to Imaging with diffracted waves. [Source. GB/T 30543-2014, 3.4] ...... |
