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GB/T 41204-2021 English PDF

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GB/T 41204-2021: Nanotechnologies - Measurement technique matrix for the characterization of nano-objects
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Basic data

Standard ID: GB/T 41204-2021 (GB/T41204-2021)
Description (Translated English): Nanotechnologies - Measurement technique matrix for the characterization of nano-objects
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: A020
Word Count Estimation: 53,570
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 41204-2021: Nanotechnologies - Measurement technique matrix for the characterization of nano-objects

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Nanotechnologies -- Measurement technique matrix for the characterization of nano-objects ICS 01:040:07 CCSA020 National Standards of People's Republic of China Nanotechnology Matrix of Measurement Techniques for Characterization of Nanoobjects nano-objects (ISO /T R18196:2016,MOD) Published on 2021-12-31 2022-07-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration directory Preface IX Introduction X 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 3:1 General terms 1 3:2 Nano Object Parameters 2 4 Parameters included in the matrix 3 5 Measurement techniques included in the matrix4 5:1 Overview 4 5:2 Spectrum 4 5:2:1 Description 4 5:2:2 Nano Object Parameters 5 5:2:3 Advantage 5 5:2:4 Limitations 5 5:2:5 Measured 5 5:2:6 Related Standards 5 5:3 Centrifugal Analysis (AC) 5 5:3:1 Description 5 5:3:2 Nano Object Parameters 5 5:3:3 Advantage 5 5:3:4 Limitations 6 5:3:5 Measured 6 5:3:6 Related Standards 6 5:4 Electroacoustic spectrum 6 5:4:1 Description 6 5:4:2 Nano Object Parameters 6 5:4:3 Advantage 6 5:4:4 Limitations 6 5:4:5 Measured 7 5:4:6 Relevant standards 7 5:5 Aerosol particle mass analyzer (AMS) 7 5:5:1 Description 7 5:5:2 Nano Object Parameters 7 5:5:3 Advantage 7 5:5:4 Limitations 7 5:5:5 Measured 7 5:5:6 Relevant standards7 5:6 Auger Electron Spectroscopy (AES) 8 5:6:1 Description 8 5:6:2 Nano Object Parameters 8 5:6:3 Advantage 8 5:6:4 Limitations 8 5:6:5 Measured 8 5:6:6 Related Standards 8 5:7 Determination of specific surface area by physical adsorption (BET) method 9 5:7:1 Description 9 5:7:2 Nanoobject parameters 9 5:7:3 Advantage 9 5:7:4 Limitations 9 5:7:5 Measured 9 5:7:6 Relevant Standards 9 5:8 Condensed Particle Counting (CPC) 10 5:8:1 Description 10 5:8:2 Nanoobject parameters 10 5:8:3 Advantage 10 5:8:4 Limitations 10 5:8:5 Measured 10 5:8:6 Relevant standards 10 5:9 Differential Electromigration Analysis System (DMAS) 10 5:9:1 Description 10 5:9:2 Nanoobject parameters 10 5:9:3 Advantage 11 5:9:4 Limitations 11 5:9:5 Measured 11 5:9:6 Related Standards 11 5:10 Differential Scanning Calorimetry (DSC) 11 5:10:1 Description 11 5:10:2 Nanoobject parameters 11 5:10:3 Advantage 11 5:10:4 Limitations 11 5:10:5 Measured 11 5:10:6 Related Standards 12 5:11 Dynamic Light Scattering (DLS) 12 5:11:1 Description 12 5:11:2 Nanoobject parameters 12 5:11:3 Advantage 12 5:11:4 Limitations 12 5:11:5 Measured 13 5:11:6 Related Standards 13 5:12 Electron Energy Loss Spectroscopy (Transmission EELS) 13 5:12:1 Description 13 5:12:2 Nanoobject parameters 13 5:12:3 Advantage 13 5:12:4 Limitations 13 5:12:5 Measured 13 5:12:6 Related Standards 13 5:13 Electrophoresis/Capillary Electrophoresis 13 5:13:1 Description 13 5:13:2 Nanoobject parameters 14 5:13:3 Advantage 14 5:13:4 Limitations 14 5:13:5 Measured 14 5:13:6 Related Standards 14 5:14 Energy Dispersive X-ray Spectroscopy (EDS/EDX) and Wavelength Dispersive X-ray Spectroscopy (WDS) 14 5:14:1 Description 14 5:14:2 Nano Object Parameters 14 5:14:3 Advantage 14 5:14:4 Limitations 15 5:14:5 Measured 15 5:14:6 Related Standards 15 5:15 Field Flow Classification 15 5:15:1 Description 15 5:15:2 Nanoobject parameters 15 5:15:3 Advantage 15 5:15:4 Limitations 15 5:15:5 Measured 15 5:15:6 Related Standards 16 5:16 Fluorescence Spectroscopy 16 5:16:1 Description 16 5:16:2 Nanoobject parameters 16 5:16:3 Advantage 16 5:16:4 Limitations 16 5:16:5 Measured 16 5:16:6 Related Standards 16 5:17 Fourier Transform Infrared (FT-IR) Spectroscopy and FT-IR Imaging 16 5:17:1 Description 16 5:17:2 Nanoobject parameters 17 5:17:3 Advantage 17 5:17:4 Limitations 17 5:17:5 Measured 17 5:17:6 Related Standards 17 5:18 Induced grating method (IG) 17 5:18:1 Description 17 5:18:2 Nanoobject parameters 17 5:18:3 Advantage 17 5:18:4 Limitations 17 5:18:5 Measured 18 5:18:6 Related Standards 18 5:19 Inductively Coupled Plasma Mass Spectrometry (ICP-MS) and Single Particle Inductively Coupled Plasma Mass Spectrometry (SP-ICP-MS) 18 5:19:1 Description 18 5:19:2 Nanoobject parameters 18 5:19:3 Advantage 18 5:19:4 Limitations 18 5:19:5 Measured 18 5:19:6 Related Standards 19 5:19:7 Nano-coupled ICP-MS technology 19 5:20 Laser Diffraction Technology 19 5:20:1 Description 19 5:20:2 Nanoobject parameters 19 5:20:3 Advantage 19 5:20:4 Limitations 19 5:20:5 Measured 20 5:20:6 Related Standards 20 5:21 Liquid chromatography-mass spectrometry (LC-MS) 20 5:21:1 Description 20 5:21:2 Nanoobject parameters 20 5:21:3 Advantage 20 5:21:4 Limitations 20 5:21:5 Measured 20 5:21:6 Related Standards 20 5:22 Particle Tracking Analysis 20 5:22:1 Description 20 5:22:2 Nanoobject parameters 21 5:22:3 Advantage 21 5:22:4 Limitations 21 5:22:5 Measured 21 5:22:6 Related Standards 21 5:23 Optical absorption spectroscopy (UV/Vis/NIR) 21 5:23:1 Description 21 5:23:2 Nanoobject parameters 22 5:23:3 Advantage 22 5:23:4 Limitations 22 5:23:5 Measured 22 5:23:6 Related Standards 22 5:24 Quartz Crystal Microbalance (QCM) 22 5:24:1 Description 22 5:24:2 Nanoobject parameters 22 5:24:3 Advantage 22 5:24:4 Limitations 23 5:24:5 Measured 23 5:24:6 Related Standards 23 5:25 Raman spectroscopy/Raman imaging 23 5:25:1 Description 23 5:25:2 Nanoobject parameters 23 5:25:3 Advantage 23 5:25:4 Limitations 23 5:25:5 Measured 23 5:25:6 Related Standards 23 5:26 Resonant Mass Measurement (RMM) 24 5:26:1 Description 24 5:26:2 Nanoobject parameters 24 5:26:3 Advantage 24 5:26:4 Limitations 24 5:26:5 Measured 24 5:26:6 Related Standards 24 5:27 Scanning Electron Microscopy (SEM) 24 5:27:1 Description 24 5:27:2 Nanoobject parameters 24 5:27:3 Advantage 25 5:27:4 Limitations 25 5:27:5 Measured 25 5:27:6 Relevant standards 25 5:28 Scanning Probe Microscopy (SPM) 26 5:28:1 Description 26 5:28:2 Nanoobject parameters 26 5:28:3 Advantage 26 5:28:4 Limitations 26 5:28:5 Measured 26 5:28:6 Related Standards 27 5:29 Secondary ion mass spectrometry (SIMS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) 27 5:29:1 Description 27 5:29:2 Nanoobject parameters 27 5:29:3 Advantages 27 5:29:4 Limitations 27 5:29:5 Measured 28 5:29:6 Related Standards 28 5:30 Small-angle X-ray scattering (SAXS) 28 5:30:1 Description 28 5:30:2 Nanoobject parameters 28 5:30:3 Advantages 28 5:30:4 Limitations 28 5:30:5 Measured 28 5:30:6 Related Standards 29 5:31 Static Light Scattering (SLS) and Static Multiple Light Scattering (SMLS) 29 5:31:1 Description 29 5:31:2 Nanoobject parameters 29 5:31:3 Advantages 29 5:31:4 Limitations 29 5:31:5 Measured (SLS) 30 5:31:6 Measured (SMLS) 30 5:31:7 Relevant standards 30 5:32 Single-particle light interferometry 30 5:32:1 Description 30 5:32:2 Nanoobject parameters 30 5:32:3 Advantages 30 5:32:4 Limitations 30 5:32:5 Measured 31 5:32:6 Related Standards 31 5:33 Thermogravimetric Analysis (TGA) 31 5:33:1 Description 31 5:33:2 Nanoobject parameters 31 5:33:3 Advantages 31 5:33:4 Limitations 31 5:33:5 Measured 31 5:33:6 Relevant standards 31 5:33:7 TGA combined technology 31 5:34 Transmission Electron Microscopy (TEM) 31 5:34:1 Description 31 5:34:2 Nanoobject parameters 32 5:34:3 Advantages 32 5:34:4 Limitations 32 5:34:5 Measured 32 5:34:6 Related Standards 32 5:35 X-ray diffraction (XRD) 33 5:35:1 Description 33 5:35:2 Nanoobject parameters 33 5:35:3 Advantages 33 5:35:4 Limitations 33 5:35:5 Measured 33 5:35:6 Related Standards 33 5:36 X-ray Photoelectron Spectroscopy (XPS) 33 5:36:1 Description 33 5:36:2 Nanoobject parameters 33 5:36:3 Advantages 33 5:36:4 Limitations 34 5:36:5 Measured 34 5:36:6 Related Standards 34 Appendix A (Informative) Sample Isolation/Preparation 35 Reference 37

foreword

This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules of Standardization Documents" drafted: This document is modified using ISO /T R18196:2016 "Measurement Technique Matrix for Characterization of Nanoscale Objects in Nanotechnology": file type by The technical report of ISO is adjusted to the national standard of our country: Compared with ISO /T R18196:2016, this document has made the following structural adjustments: --- deleted 5:25:5:2; --- 5:29:3:7:1~5:29:3:7:5, A:2:2:2:1~A:2:2:2 are changed to list items: The technical differences between this document and ISO /T R18196:2016 and their reasons are as follows: --- Chapter 1 adds the description of the scope of application of the standard to meet the specific situation of our country; --- ISO /T S80004-1 and ISO /T S80006-6 referenced normatively in Chapter 3 are replaced with the corresponding Chinese standards and incorporated into Chapter 2 Normative references to suit the specific situation of our country; --- "Size" in 5:24:2 is changed to "object mass" to ensure its scientific nature; --- Delete the content of 5:25:5:2, the technical content is not applicable; --- Modify "9nm" in 5:29:3:7 to "50nm~100nm" to conform to the current state of technology in my country; ---5:36:2 Add "binding energy" to adapt to the specific situation of our country: The following editorial changes have been made to this document: --- Chapter 3 deleted IEC online browsing platform and website and ISO online browsing platform and website; --- 5:22:4:3 To avoid repetition, delete the last sentence "The upper limit of particle size detection is limited by the sedimentation in the liquid, which is about a few microns"; --- The first sentence of 5:28:1 is amended to read "The surface analysis method using the probe to scan the surface to be tested and measuring the accompanying response of the detector"; ---In the note of 5:29:1, "the spectrum for obtaining information about the surface of the sample" is added: Please note that some content of this document may be patented: The issuing agency of this document assumes no responsibility for identifying patents: This document is proposed by the Chinese Academy of Sciences: This document is under the jurisdiction of the National Nanotechnology Standardization Technical Committee (SAC/TC279): This document is drafted by: National Nanoscience Center, China Testing and Certification Group Co:, Ltd:, Beijing Zhongjiao Jinyuan Technology Co:, Ltd: Company, Beijing Powder Technology Association, Beijing Physical and Chemical Analysis and Testing Center, Shenzhen Xianggen Biomedicine Co:, Ltd:, Inner Mongolia Xinyu Rare Earth Function Materials Co:, Ltd: The main drafters of this document: Zhang Donghui, Ge Guanglu, Shentu Xianzhong, Cai Chunshui, Zhou Suhong, Guo Yanjun, Liu Weili, Cai Jin, Wang Xinwei, Chang Huaiqiu, Xu Peng, Zhu Xiaoyang, Gaoxia, Gaoyuan, Tian Guolan, Huang Shenghong, Ji Daiyu, Gao Jie:

Introduction

This document correlates frequently measured nanoobject parameters with the corresponding measurement techniques and is a tool for nanotechnology stakeholders to rapidly determine nanomaterials: Useful tool for measuring information about objects: The measurands of common nano-objects are listed in row 1 of the quick look-up table (see Table 1): If listed in the moment If the measurement technique for the first column of the array is applicable, mark the intersection of the corresponding row and column in the table: If you need to learn about a measurement technique, you can The chapter finds descriptions of the corresponding measurement techniques, their advantages and disadvantages, relevant standards, measurands, and the measurable nanoobject parameters for each technique: With technology As more measurement techniques develop, this document will be regularly reviewed and updated to maintain its applicability: Some of the measurement techniques listed in this document have not been verified by comparative experiments or other measurement methods: This document is intended as a relevant measurement A repository of technical information, but not the final or original repository: Readers can refer to relevant standards after determining a certain measurement technology, and Application for literature research: Other reference materials include instrument instructions and technical literature: Nanotechnology Matrix of Measurement Techniques for Characterization of Nanoobjects

1 Scope

This document provides a matrix of measurement techniques for characterizing common physicochemical parameters of nanoobjects: Some measurement techniques are also applicable to nanostructures Material: This document is applicable to the measurement of common physical and chemical parameters in the field of nanotechnology, and the measurement of physical and chemical parameters in other fields can be referred to: NOTE: Appendix A gives guidelines for sample isolation and preparation:

2 Normative references

The contents of the following documents constitute essential provisions of this document through normative references in the text: Among them, dated citations documents, only the version corresponding to that date applies to this document; for undated references, the latest edition (including all amendments) applies to this document: GB/T 30544:1 Nanotechnology Terminology Part 1: Core Terminology (GB/T 30544:1-2014, ISO /T S80004-1: 2010, IDT) GB/T 30544:6 Nanotechnology Terminology Part 6: Characterization of Nanoscale Objects (GB/T 30544:6-2016, ISO /T S80004-6: 2013, MOD)

3 Terms and Definitions

The terms and definitions defined in GB/T 30544:1 and GB/T 30544:6 and the following terms and definitions apply to this document: 3:1 General terms 3:1:1 dispersion system A heterogeneous system in which finely divided material is dispersed in another substance: [Source: ISO 472:2013, 2:288] 3:1:2 measurand to be measured the quantity being measured: [Source: ISO Guide99:2007, 2:3] 3:1:3 nano-object Discrete materials with external dimensions at the nanoscale in one, two or three dimensions: Note: The second and third dimensions are perpendicular to the first dimension and to each other: [Source: ISO /T S80004-2:2015, 2:2] 3:1:4 nanostructuredmaterial A material whose internal or surface structure is at the nanoscale: ......

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Answer: Upon your order, we will start to translate GB/T 41204-2021_English as soon as possible, and keep you informed of the progress. The lead time is typically 4 ~ 6 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of GB/T 41204-2021_English with my colleagues?

Answer: Yes. The purchased PDF of GB/T 41204-2021_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

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