GB/T 41064-2021 English PDF

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GB/T 41064-2021: Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 41064-2021	344	Add to Cart	4 days	Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films	Valid

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Basic data

Standard ID: GB/T 41064-2021 (GB/T41064-2021)
Description (Translated English): Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: G04
Word Count Estimation: 18,121
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 41064-2021: Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Surface chemical analysis -- Depth profiling -- Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films ICS 71:040:40 CCSG04 National Standards of People's Republic of China Monolayer and Depth Profiling for Surface Chemical Analysis Determination of X-ray Photoelectron Spectroscopy, Auger Depth Profiling in Electron Spectroscopy and Secondary Ion Mass Spectrometry method of sputtering rate (ISO 17109:2015, IDT) 2021-12-31 Released 2022-07-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration directory Preface III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 Requirements for single-layer and multilayer thin-film reference substances 1 5 Determination of sputtering rate 2 Appendix A (Informative) International Comparison Experiment Report 5 Appendix B (Informative) Estimation of Sputtering Rates for Other Materials Using Tabulated Sputtering Yield Values11 Reference 12

foreword

This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules of Standardization Documents" drafted: This document is identical to ISO 17109:2015 "Determination of X-ray Photoelectricity of Monolayer and Multilayer Thin Films for Depth Profiling of Surface Chemical Analysis Methods for Depth Profiling of Sputtering Rates in Electron Spectroscopy, Auger Electron Spectroscopy and Secondary Ion Mass Spectrometry: Please note that some content of this document may be patented: The issuing agency of this document assumes no responsibility for identifying patents: This document is proposed and managed by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38): This document was drafted by: Tsinghua University, China University of Petroleum (Beijing): The main drafters of this document: Yao Wenqing, Duan Jianxia, Yang Liping, Wang Yajun, Li Zhanping, Xu Tongguang, Wang Yanhua:

Introduction

The sputtering rate for surface chemical analysis is usually the ratio of the sputtering depth measured by the profilometer to the sputtering time, however this method can only The average sputtering rate of the multi-layer film was measured, but the sputtering rate of the multi-layer film composed of materials with different sputtering rates could not be measured: and sputtering rate The rate is also affected by various material preparation parameters, making it difficult to tabulate and use for sputter depth calibration: To improve accuracy Degree, it is important to measure the sputtering rate under the specific experimental conditions of each laboratory: The sputtering rate should be higher than the sputtering ion range It is determined by surrounding a thicker monolayer so that surface transient effects can be ignored: Or use a multilayer film, which can exclude surface transients impact and minimize interface transients: This document utilizes Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and secondary ions Mass spectrometry (SIMS) was used for depth profiling of monolayer and multilayer films, and sputtering depth was calibrated by measuring sputtering rate: Measured sputtering rate rate can be used to predict sputtering rates for a variety of other materials to allow depth estimation in conventional samples from tabular values of sputter yield and bulk density scale or sputtering time: Monolayer and Depth Profiling for Surface Chemical Analysis Determination of X-ray Photoelectron Spectroscopy, Auger Depth Profiling in Electron Spectroscopy and Secondary Ion Mass Spectrometry method of sputtering rate

1 Scope

This document specifies a method for calibrating the sputtering depth of a material by measuring the sputtering rate, that is, under certain sputtering conditions There are sputtering rates of reference materials for monolayer or multilayer films, used as depth calibration for films of the same material: When using Auger Electron Spectroscopy (AES), When X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) are used for in-depth analysis, this method is suitable for thicknesses between 20nm and:200nm: The layers in between have an accuracy of 5% to 10%: The sputtering rate is determined by the film thickness between the reference material-related interfaces and the sputtering time: Certainly: Using the known sputtering rate combined with the sputtering time, the film thickness of the tested sample can be obtained: Measured ion sputtering rates are available It is useful for predicting the ion sputtering rate of various other materials, so that the depth of these materials can be estimated from the table values of sputtering yield and atomic density: Degree scale and sputtering time:

2 Normative references

The contents of the following documents constitute essential provisions of this document through normative references in the text: Among them, dated citations documents, only the version corresponding to that date applies to this document; for undated references, the latest edition (including all amendments) applies to this document: ISO 14606 Surface chemical analysis—Optimized method of layered films for sputtering depth profiling as reference materials (Surfacechemical analysis-Sputterdepthprofiling-Optimizationusinglayeredsystemsasreferencematerials) Note: GB/T 20175-2006 Surface chemical analysis—Optimized method for layered films used for sputtering depth profiling as reference materials (ISO 14606:2000, IDT)

3 Terms and Definitions

The following terms and definitions apply to this document: 3:1 On the platform upperplateau The intensity exceeds 95% of the maximum intensity of the layer's characteristic signal and covers more than half the layer's thickness: 3:2 Lower platform lowerplateau The intensity is lower than the sum of the minimum intensity and 5% of the maximum intensity of the characteristic signal of the layer and covers an area more than half of the thickness of the layer:

4 Requirements for monolayer and multilayer film reference substances

4:1 The thickness of each layer and the thickness of the single-layer film in the multi-layer film should be much larger than the total range of ion sputtering and the depth information value measured by this method: Therefore, an upper platform and a lower platform can appear on each layer when performing in-depth analysis: Projection range can be used from http://www:srim:org[7] The obtained SRIM code is simply calculated: ......

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