GB/T 33929-2017 English PDF

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GB/T 33929-2017: Test methods of the performance for MEMS high g accelerometer
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 33929-2017	279	Add to Cart	3 days	Test methods of the performance for MEMS high g accelerometer	Valid

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Basic data

Standard ID: GB/T 33929-2017 (GB/T33929-2017)
Description (Translated English): Test methods of the performance for MEMS high g accelerometer
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L55
Classification of International Standard: 31.200
Word Count Estimation: 14,120
Date of Issue: 2017-07-12
Date of Implementation: 2018-02-01
Quoted Standard: GB/T 2421.1; GB/T 7665; GB/T 26111; JJF 1156
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard specifies the terms and definitions of electrical and basic properties of MEMS high g-value accelerometers, test conditions, general regulations, test items and methods. This standard is applicable to the performance test of MEMS high g value accelerometer (hereinafter referred to as acceleration sensor) in the range of 1X10 ^ (4) g ~ 2X10 ^ (5) g.

GB/T 33929-2017: Test methods of the performance for MEMS high g accelerometer

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test methods of the performance for MEMS high g accelerometer ICS 31.200 L55 National Standards of People's Republic of China MEMS high g acceleration sensor performance test method 2017-07-12 Posted 2018-02-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China China National Standardization Administration released

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard by the National Microelectromechanical Technology Standardization Technical Committee (SAC/TC336) and focal point. This standard was drafted. North Central University, China Machine Productivity Promotion Center. The main drafters of this standard. Shi Yunbo, Cheng Hongbing, Tang Jun, Li Haibin, Ma Zongmin, Zhu Yue. MEMS high g acceleration sensor performance test method

1 Scope

This standard specifies the MEMS g-value acceleration sensor electrical properties and basic properties of the terms and definitions, test conditions, test General Provisions, Test Items and Methods. This standard applies to the range of 1 × 104g ~ 2 × 105g MEMS high g-value acceleration sensor (hereinafter referred to as acceleration Sensor) performance test.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version applies to this article Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 2421.1 Electrical and Electronic Products Environmental Testing Overview and Guidelines GB/T 7665 General Terms for Sensors GB/T 26111 Microelectromechanical System (MEMS) technology terminology Vibration impact measurement terms and definitions

3 Terms and definitions

GB/T 7665, GB/T 26111 and JJF1156 define the following terms and definitions apply to this document. 3.1 Hopkinson Rod Hopkinsonrod An impact device that uses impact waves to propagate in an elongated rod with elastic waves.

4 test conditions

4.1 Environmental conditions 4.1.1 Standard atmospheric conditions Unless otherwise specified in the detail specification, all tests shall be performed under the standard atmospheric conditions of the test specified in GB/T 2421.1. 4.1.2 Electromagnetic conditions Except as otherwise provided in the product technical conditions, the test site shall have no other external electromagnetic fields except the earth magnetic field. 4.1.3 Vibration conditions Unless otherwise specified in the product technical conditions, the test site test station should be no mechanical vibration. ......

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