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GB/T 33352-2024 English PDF

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GB/T 33352-2024: General rules of screening application of restricted substances in electrical and electronic products - X-Ray fluorescence spectrometry
Status: Valid

GB/T 33352: Historical versions

Standard IDUSDBUY PDFLead-DaysStandard Title (Description)Status
GB/T 33352-2024519 Add to Cart 5 days General rules of screening application of restricted substances in electrical and electronic products - X-Ray fluorescence spectrometry Valid
GB/T 33352-20161039 Add to Cart 5 days General rules of screening application of restricted substances in electrical and electronic products -- X-Ray fluorescence spectrometry Obsolete

Similar standards

GB/T 31274   GB/T 32883   GB/T 33345   GB/T 33351.2   GB/T 33344   

Basic data

Standard ID: GB/T 33352-2024 (GB/T33352-2024)
Description (Translated English): General rules of screening application of restricted substances in electrical and electronic products - X-Ray fluorescence spectrometry
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L10
Classification of International Standard: 13.020.01; 43.040.10
Word Count Estimation: 26,293
Date of Issue: 2024-04-25
Date of Implementation: 2024-08-01
Older Standard (superseded by this standard): GB/T 33352-2016
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 33352-2024: General rules of screening application of restricted substances in electrical and electronic products - X-Ray fluorescence spectrometry


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 13:020:01;43:040:10 CCSL10 National Standards of People's Republic of China Replaces GB/T 33352-2016 General Rules for the Screening of Restricted Substances in Electrical and Electronic Products X-ray fluorescence spectrometry Released on 2024-04-25 2024-08-01 Implementation State Administration for Market Regulation The National Standardization Administration issued

Table of Contents

Preface III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 Reagents and Materials 4 5 XRF spectrometer 4 5:1 General Requirements 4 5:2 Software Requirements 4 5:3 X-ray protection requirements 4 5:4 Other Hardware Configuration 5 5:5 XRF spectrometer performance requirements and test methods 5 6 Technical competence requirements for XRF personnel 9 6:1 XRF sample preparation personnel 9 6:2 XRF Operator 9 6:3 XRF Technical Supervisor 9 7 Working conditions 9 8 Startup maintenance 10 9 Testing Procedure 10 9:1 Sample preparation 10 9:2 Screening Test 10 9:3 Analysis and judgment of test results 12 10 Quality Control14 10:1 Calibration Accuracy 14 10:2 Quality Control Samples 14 11 Documentation 15 Appendix A (Informative) Commonly used certified reference materials and reference materials for XRF screening of restricted substances in electronic and electrical products 16 References 20

Foreword

This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for standardization work Part 1: Structure and drafting rules for standardization documents" Drafting: This document replaces GB/T 33352-2016 "General Rules for Application of Screening of Restricted Substances in Electronic and Electrical Products - X-ray Fluorescence Spectrometry" and Compared with GB/T 33352-2016, in addition to structural adjustments and editorial changes, the main technical changes are as follows: --- Added the definition, requirements and verification methods of correctness (see 3:16 and 5:5:5); --- Changed the verification test method of the detection limit indicator, directly citing the relevant method in GB/T 31364-2015 (see 5:5:4,:2016 Version A:2:2); --- Changed the verification test method of energy resolution index, directly citing the relevant method in GB/T 31364-2015 (see 5:5:6, 5:5 of the:2016 edition); --- Added the spot position requirement of X-ray spot less than 3mm [see 5:5:9b)]; --- Deleted the normative appendix A, and put the two performance index requirements of precision and detection limit and the relevant contents of verification method into the main text (see 5:5:3 and 5:5:4): Please note that some of the contents of this document may involve patents: The issuing organization of this document does not assume the responsibility for identifying patents: This document was proposed and coordinated by the National Technical Committee for Environmental Standardization of Electrical and Electronic Products and Systems (SAC/TC297): This document was drafted by: China Electronics Technology Standardization Institute, Shenzhen CESI Information Technology Co:, Ltd:, Jiangsu Weinuo Testing Technology Co:, Ltd: Co:, Ltd:, Jiangsu Tianrui Instrument Co:, Ltd:, Jiapu Instrument (Suzhou) Co:, Ltd:, GEM Co:, Ltd:, ZTE Corporation Co:, Ltd:, Guangzhou Jingu Scientific Instrument Co:, Ltd:, Xiamen University, AVIC Lithium Battery (Luoyang) Co:, Ltd:, Beijing Green Zhihui Energy Technology Research Institute, Shenzhen Presaisi Testing Technology Co:, Ltd:, Guangdong Midea Refrigeration Equipment Co:, Ltd:, Chongqing Daming Automotive Electrical Co:, Ltd:, Shenzhen Hongsheng Instrument Equipment Co:, Ltd:, Jiangxi Zichen Technology Co:, Ltd:, China Quality Certification Center South China Laboratory, Shimadzu Enterprise Management (China) Co:, Ltd:, Nayou Technology (Beijing) Co:, Ltd:, AMETEK Trading (Shanghai) Co:, Ltd:, Zhongren Yingtai Testing Technology Co:, Ltd: Co:, Ltd:, Guangzhou Customs Technical Center, China Institute of Testing and Certification (Beijing) Co:, Ltd:, Qingdao Customs Technical Center: The main drafters of this document are: Gao Jian, Xing Weibing, Wei Shengji, Wu Min, Han Yechun, Wei Qiong, Wang Xian, Jiang Lijun, Zhang Xianhua, Cao Yong, Wang Xiaochao, Fan Yafei, Tao Yun, Zhang Ni, Zhang Yafu, Liu Dongren, Lu Xiaoming, Wu Jing, Yang Lifeng, Pan Li, Song Xiyu, Song Wuyuan, Hu Xiaotong, Ye Xiwen: This document was first published in:2016 and this is the first revision:

Introduction

The widespread use of electronic and electrical products has made people more concerned about their impact on the environment: Many countries or regions in the world have enacted special laws and regulations: Regulations restrict the use of certain hazardous substances in electrical and electronic products: In order to ensure that restricted substances comply with regulatory requirements, manufacturers of electronic and electrical products need to test the materials of their products: Fluorescence spectroscopy (hereinafter referred to as XRF) is a fast, low-cost, easy-to-operate and even non-destructive method for quantitative or semi-quantitative analysis of electronic and electrical products: The test method for screening restricted substances in products is widely used by relevant enterprises and third-party testing institutions, and its test results are widely used in Nevertheless, stakeholders should still pay attention to: a) Since XRF cannot obtain the valence state and molecular information of the elements in the sample, it is not possible to obtain the valence state and molecular information of the elements in the sample through XRF: Ether can only be tested for its total chromium and total bromine content; b) The detection accuracy provided by XRF can at least reach the level of semi-quantitative analysis, that is, at the specified 68% confidence level, the measurement results The relative uncertainty of the analysis is typically 30% or better, but this is still relatively low compared to wet chemical analysis: Too big: Considering the large performance differences between different XRF spectrometers, some XRF spectrometers have obvious differences in element selectivity and sensitivity: In order to ensure that XRF spectrometers with different designs, different complexities and different performances can be used in electronic and electrical products, the The screening test of substances, and considering the influence of laboratory operators, environment, and management on the test results, it is necessary to use XRF spectrometer Necessary regulations are implemented to screen and test restricted substances in electrical and electronic products: General Rules for the Screening of Restricted Substances in Electrical and Electronic Products X-ray fluorescence spectrometry Warning 1---X-rays are harmful to the human body: XRF users should receive training on the operation of XRF spectrometers and have the operating skills: The manufacturer's safety instructions and national health and occupational safety regulations should be followed: Operate with caution: Warning 2---This document does not address all possible safety issues: XRF users are responsible for taking appropriate safety and health measures: and ensure that the conditions stipulated by relevant national laws and regulations are met:

1 Scope

This document specifies the energy dispersive X-ray fluorescence spectroscopy screening test for lead (Pb), mercury (Hg), cadmium (Cd), total chromium (Cd) and other trace elements in electrical and electronic products: Requirements for instruments, personnel technical capabilities, test procedures, quality control, documentation, etc: for elements such as chromium (Cr) and total bromine (Br): This document applies to X-ray fluorescence of lead (Pb), mercury (Hg), cadmium (Cd), total chromium (Cr) and total bromine (Br) in electrical and electronic products: Optical spectral screening test: This document is not suitable for testing gas samples: The wavelength dispersive X-ray fluorescence spectroscopy screening application can be implemented as a reference: Note: For wavelength dispersive X-ray fluorescence spectroscopy, refer to relevant standards or instrument manuals for sample preparation:

2 Normative references

The contents of the following documents constitute the essential clauses of this document through normative references in this document: For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document: GB 4793:1-2007 Safety requirements for electrical equipment for measurement, control and laboratory use Part 1: General requirements GB 18871 Basic Standard for Ionizing Radiation Protection and Radiation Source Safety GB/T 26572 Limit requirements for restricted substances in electronic and electrical products GB/T 31364-2015 Energy dispersive X-ray fluorescence spectrometer main performance test method GB/T 39560:1-2020 Determination of certain substances in electrical and electronic products Part 1: Introduction and overview GB/T 39560:2 Determination of certain substances in electrical and electronic products Part 2: Disassembly, splitting and mechanical sample preparation GB/T 39560:301-2020 Determination of certain substances in electrical and electronic products Part 3-1: Screening by X-ray fluorescence spectrometry Lead, mercury, cadmium, total chromium and total bromine

3 Terms and definitions

GB/T 39560:1-2020 and GB/T 39560:301-2020 definitions and the following terms and definitions apply to this document: 3:1 screening An analytical method to determine whether a representative part or component of a product contains a restricted substance by comparing the test results with the established limit values: The substances are compared with the corresponding element limits to determine the presence, absence or need for further analysis and testing of restricted substances: Note: If the value measured by the screening method cannot determine whether the substance to be tested is present, further confirmatory analysis or other procedures may be required to make a final determination: Determination of existence or non-existence:
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