GB/T 22461.2-2023 English PDFUS$1179.00 · In stock
Delivery: <= 7 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 22461.2-2023: Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning probe microscopy Status: Valid
Basic dataStandard ID: GB/T 22461.2-2023 (GB/T22461.2-2023)Description (Translated English): Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning probe microscopy Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: G04 Classification of International Standard: 71.040.40 Word Count Estimation: 58,556 Date of Issue: 2023-05-23 Date of Implementation: 2023-09-01 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GB/T 22461.2-2023: Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning probe microscopy---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. ICS 71:040:40 CCSG04 National Standards of People's Republic of China Surface Chemical Analysis Glossary Part 2: Terminology for scanning probe microscopy (ISO 18115-2:2021, MOD) Released on 2023-05-23 2023-09-01 Implementation State Administration for Market Regulation Released by the National Standardization Management Committee table of contentsPreface III Introduction IV 1 Scope 1 2 Normative references 1 3 Scanning Probe Microscopy Terminology 1 4 Contact Mechanics Model Terminology 7 5 Scanning Probe Method Terminology 8 6 Scanning Probe Microscopy Supplementary Terminology 27 7 Supplementary terminology for scanning probe method 30 Appendix A (informative) Abbreviations 34 Reference 37 index 38forewordThis document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules for Standardization Documents" drafting: This document is part 2 of GB/T 22461 "Vocabulary for Chemical Analysis of Surfaces": GB/T 22461 has issued the following parts: --- Part 1: General terms and genealogy terms; --- Part 2: Scanning probe microscopy terminology: This document is modified to adopt ISO 18115-2:2021 "Vocabulary for Chemical Analysis of Surfaces Part 2: Terminology for Scanning Probe Microscopy": Compared with ISO 18115-2:2021, this document has made the following structural adjustments: ---Chapter 3 corresponds to 3:1 of ISO 18115-2:2021, and the term entry numbers in Chapter 3 are adjusted in order of mention: The technical differences between this document and ISO 18115-2:2021 and the reasons are as follows: ---Changed the statement of the scope of Chapter 1 and increased the scope of application to meet the drafting requirements of my country's documents: The following editorial changes have been made to this document: --- Deleted the URL information of the ISO /IEC terminology database in Chapter 3; ---Delete the duplicated content in Note 2 of 4:3, Note 2 of 4:4, and Note 2 of 4:5 that overlaps with the definitions of corresponding terms; --- Deleted the definition sources of 5:2, 5:24, 5:48, 5:110, 5:114, 5:132, because the source document ASTME1813-96 has been repeal; --- Changed Note 1 and Note 4 of 7:25, and changed "ISO 4287" to "ISO 21920-2", because the latter has replaced the former; --- Added index: Please note that some contents of this document may refer to patents: The issuing agency of this document assumes no responsibility for identifying patents: This document was proposed and managed by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38): This document is drafted by: Shanghai Institute of Metrology and Testing Technology, Peking University, Shanghai Jiaotong University, Chinese Academy of Sciences Shanghai Applied Physics graduate School: The main drafters of this document: Cai Xiaoyu, Zhu Xing, Shen Yi, Sun Jielin, Hu Jun, Li Yuan:IntroductionSurface chemical analysis is an important field that involves interactions between people from different fields and backgrounds: engage in surface Chemical analysts may be materials scientists, chemists, or physicists, and their background may be experimental or theoretical: use surface chemistry The data included not only the above-mentioned personnel, but also personnel from other disciplines: Through the existing surface chemical analysis technology, the composition information from the area close to the surface (generally within 20nm) can be obtained, when After the surface layer is removed, composition-depth information can also be obtained with this technique: GB/T 22461 "Vocabulary for Surface Chemical Analysis" consists of two parts: --- Part 1: General terms and genealogy terms: Covers terms such as electron spectroscopy, mass spectrometry, and spectroscopy and X-ray analysis: --- Part 2: Scanning probe microscopy terminology: Covers terminology related to scanning probe microscopy: The concepts for the above technologies originate from the broad fields of nuclear physics and radiation science, as well as physical chemistry and optics: A wide range of academic fields has led to With different interpretations of terms, the same concept will be described with different terms: In order to avoid misunderstandings and to facilitate the exchange of information For flow, it is necessary to clarify the concept and adopt the correct terminology to determine its definition: In contact mechanics, the basic theory is usually expressed by an abbreviation: To avoid confusion, Chapter 4 of this document defines these acronyms: No: 4 The model described in Chapter 1 assumes that the contact material is homogeneous and isotropic, with linear elastic properties: For heterogeneous, anisotropic, nonlinear, viscoelastic or other elastoplastic materials for which contact models can be found in the literature: Surface Chemical Analysis Glossary Part 2: Terminology for scanning probe microscopy1 ScopeThis document defines the terms of scanning probe microscopy in the field of surface chemical analysis and gives a list of relevant abbreviations (see Appendix A): This document is applicable to the teaching, scientific research, design, manufacture, preparation of relevant technical documents and documents related to scanning probe microscopy in surface chemical analysis: Books and technical exchanges:2 Normative referencesThis document has no normative references:3 Scanning Probe Microscopy Terminology3:1 < SNOM > Microscopy using a near-field (5:88) light source to obtain Raman spectra: This method illuminates the sample surface with appropriately polarized light, and The metal probe tip (5:120) is placed in the near field area of the sample surface: 3:2 Atomic force microscopy atomic-forcemicroscopy; AFM Surface imaging methods that mechanically scan surface profiles: Install the sharp probe tip (5:120) on the flexible cantilever beam (5:18) to The probe senses the surface force and then detects deflection of the probe: NOTE 1 AFM is capable of highly quantitative imaging of insulating or conducting surfaces (5:69): Note 2: Some atomic force microscopes fix the position of the probe tip and move the sample along the x, y, z directions; others fix the sample position Position and move the probe tip: Note 3: AFM can be used in environments such as vacuum, liquid phase, controlled atmosphere or air: Original images can be obtained on suitable samples with a sharp tip and appropriate imaging sub-resolution: Note 4: A wide variety of forces can be measured, including normal force (5:91), and lateral force (5:77), frictional force (5:62) or shear force: The technical points corresponding to the latter three Also known as lateral force microscopy (3:13), friction microscopy (3:11), shear force microscopy (3:37): AFM is a general term whose scope covers appendices Microscopy of various force measurements in A: Note 5: AFM can be used to measure the surface normal force of each pixel in the imaging area: Note 6: Normally, for an atomic force microscope probe whose tip radius is less than 100nm, the normal force needs to be less than 0:1μN, and the specific value depends on the sample material Otherwise, it will cause irreversible deformation of the surface and excessive wear of the probe tip: 3:3 chemical force microscopy chemical-forcemicroscopy; CFM LFM (3:13) or AFM (3:2) mode, detect the interaction between the functionalized modified sharp probe tip (5:120) and specific molecules resulting deviation: Note: LFM (3:13) is the most commonly used mode: ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 22461.2-2023_English be delivered?Answer: Upon your order, we will start to translate GB/T 22461.2-2023_English as soon as possible, and keep you informed of the progress. The lead time is typically 4 ~ 7 working days. The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of GB/T 22461.2-2023_English with my colleagues?Answer: Yes. The purchased PDF of GB/T 22461.2-2023_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.Question 3: Does the price include tax/VAT?Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countriesQuestion 4: Do you accept my currency other than USD?Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay. |
