GA/T 823.3-2018 English PDF

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GA/T 823.3-2018: Examination methods for paint evidence in Forensics -- Part 3: Scanning electron microscope/energy dispersive X-ray analysis(SEM/EDX)
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GA/T 823.3-2018	139	Add to Cart	3 days	Examination methods for paint evidence in Forensics -- Part 3: Scanning electron microscope/energy dispersive X-ray analysis(SEM/EDX)	Valid

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Basic data

Standard ID: GA/T 823.3-2018 (GA/T823.3-2018)
Description (Translated English): Examination methods for paint evidence in Forensics -- Part 3: Scanning electron microscope/energy dispersive X-ray analysis(SEM/EDX)
Sector / Industry: Public Security (Police) Industry Standard (Recommended)
Classification of Chinese Standard: A92
Classification of International Standard: 13.310
Word Count Estimation: 6,692
Date of Issue: 2018-06-25
Date of Implementation: 2018-06-25
Issuing agency(ies): Ministry of Public Security

GA/T 823.3-2018: Examination methods for paint evidence in Forensics -- Part 3: Scanning electron microscope/energy dispersive X-ray analysis(SEM/EDX)

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Examination methods for paint evidence in Forensics -- Part 3. Scanning electron microscope/energy dispersive X-ray analysis (SEM/EDX) ICS 13.310 A92 People's Republic of China Public Safety Industry Standard Forensic science paint certificate test method Part 3. Scanning electron microscopy/X-ray spectroscopy Part 3. Scanningelectronmicroscope/energydispersive X-rayanalysis (SEM/EDX) Published on.2018-06-25 2018-06-25 implementation Ministry of Public Security

Foreword

GA/T 823 "Test Method for Forensic Science Paint Certificate" is divided into four parts. --- Part 1. Color comparison test; ---Part 2. Infrared absorption spectroscopy; --- Part 3. Scanning electron microscopy/X-ray spectroscopy; --- Part 4. Laser Raman spectroscopy. This part is the third part of GA/T 823. This part is drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the contents of this document may involve patents. The issuing organization of this document is not responsible for identifying these patents. This part is proposed by the National Criminal Technology Standardization Technical Committee Technical Committee (SAC/TC179/SC4). Return to the mouth. This section drafted by. Shanghai Municipal Public Security Bureau physical evidence appraisal center, the Ministry of Public Security material certification center. The main drafters of this section. Ding Minju, Ling Youqing, Shi Huixia. Forensic science paint certificate test method Part 3. Scanning electron microscopy/X-ray spectroscopy

1 Scope

This part of GA/T 823 specifies the test methods for the elements contained in the forensic science certificate. This section applies to the examination of the elemental composition of the paint certificate in the forensic science field. It can also be used in other fields.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 19267.6-2008 Physical and chemical testing of trace materials - Part 6. Scanning electron microscope/X-ray energy Spectral method GA/T 242 Physicochemical test terminology for trace evidence

3 Terms and definitions

The terms and definitions defined in GB/T 19267.6-2008 and GA/T 242 apply to this document.

4 Principle

When a sample that is focused and has a certain amount of energy bombards the sample, the bombarded area on the sample emits a characteristic of the element contained in the area. X-rays. According to Mossell's law, the square root of the frequency of the characteristic X-rays is linear with the atomic number. See the expression for the expression. Formula 1). λ=K(ZS)-2 (1) In the formula. λ --- the wavelength of the fluorescent X-ray; K, S --- constant; Z --- The atomic number of the sample element. When bombarding a sample consisting of multiple elements, the sample emits characteristic X-rays of each element, ie X-rays mixed at different frequencies. Using the energy dispersion characteristics of the semiconductor detector, the energy signals of X-rays of different frequencies are converted into electrical signals and amplified, and then pulsed. The processor and multi-channel analyzer process to obtain the energy spectrum of the characteristic X-rays of each element in the sample. According to the position of each peak on the energy spectrum, Qualitative analysis of the elements contained in the sample can be achieved, and quantitative analysis of the sample can be achieved by peak intensity. The paint consists of four major components. film-forming substances, pigments, extender pigments (fillers) and other additives, among which pigments and extender pigments (fillers) The composition of the elements contained in the scanning electron microscope/X-ray energy spectrometer detection range, the application of scanning electron microscope/X-ray energy spectrometer Qualitative and quantitative analysis of the elements in the paint sample.

5 instruments and materials

The required equipment and materials are as follows. ......

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