GB/T 4589.1-2006 English PDF

US$694.00 · In stock
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GB/T 4589.1-2006: Semiconductor devices -- Part 10: Generic specification for discrete devices and integrated circuits
Status: Valid

GB/T 4589.1: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 4589.1-2006	694	Add to Cart	4 days	Semiconductor devices -- Part 10: Generic specification for discrete devices and integrated circuits	Valid
GB/T 4589.1-1989	839	Add to Cart	4 days	Semiconductor devices!*Generic specification for discrete devices and integrated circuits	Obsolete

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Basic data

Standard ID: GB/T 4589.1-2006 (GB/T4589.1-2006)
Description (Translated English): Semiconductor devices -- Part 10: Generic specification for discrete devices and integrated circuits
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L40
Classification of International Standard: 31.080.01
Word Count Estimation: 35,366
Date of Issue: 2006-10-10
Date of Implementation: 2007-02-01
Older Standard (superseded by this standard): GB/T 4589.1-1989
Adopted Standard: IEC 60747-10-1991, IDT
Regulation (derived from): Announcement of Newly Approved National Standards No. 10 of 2006 (No. 97 overall)
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard applies to semiconductor devices (discrete devices and integrated circuits, including multi-chip integrated circuits, hybrid circuits, but not including) the total specification. This specification defines the IECQ system used within the total quality assessment procedures, and gives the following aspects of the general principle: electrical characteristics side test methods, climatic and mechanical tests, endurance test. This specification constitutes the International Electrotechnical Commission Quality Assessment System for Electronic 7ri devices (IECQ) part.

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