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GB/T 42271-2022 English PDF

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US$199.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 42271-2022: Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 42271-2022	199	Add to Cart	3 days	Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement	Valid

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Basic data

Standard ID: GB/T 42271-2022 (GB/T42271-2022)
Description (Translated English): Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: H21
Classification of International Standard: 77.040
Word Count Estimation: 10,170
Date of Issue: 2022-12-30
Date of Implementation: 2023-04-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 42271-2022: Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 77.040 CCSH21 National Standards of People's Republic of China Resistivity of semi-insulating silicon carbide single crystal non-contact testing method Posted on 2022-12-30 2023-04-01 Implementation State Administration for Market Regulation Released by the National Standardization Management Committee

foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for Standardization Work Part 1.Structure and Drafting Rules for Standardization Documents" drafting. Please note that some contents of this document may refer to patents. The issuing agency of this document assumes no responsibility for identifying patents. This document is prepared by the National Semiconductor Equipment and Materials Standardization Technical Committee (SAC/TC203) and the National Semiconductor Equipment and Materials Standard It is jointly proposed and managed by the Materials Subcommittee (SAC/TC203/SC2) of the Chemical Technology Committee. This document was drafted by. Beijing Tianke Heda Semiconductor Co., Ltd., Zhongguancun Tianhe Wide Bandgap Semiconductor Technology Innovation Alliance, An Huichangfei Advanced Semiconductor Co., Ltd., Nonferrous Metal Technology and Economic Research Institute Co., Ltd., China Electronics Technology Group Corporation forty-sixth graduate School. The main drafters of this document. Peng Tonghua, She Zongjing, Wang Dajun, Zhang He, Li Suqing, Wang Bo, Yang Jian, Yuan Song, Liu Lina. Resistivity of semi-insulating silicon carbide single crystal non-contact testing method

1 Scope

This document describes a method for the non-contact measurement of resistivity of semi-insulating silicon carbide single crystals. This document is applicable to the measurement of semi-insulating silicon carbide single wafers with resistivity ranging from 1×105Ω·cm to 1×1012Ω·cm.

2 Normative references

The contents of the following documents constitute the essential provisions of this document through normative references in the text. Among them, dated references For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to this document. GB/T 14264 Terminology of semiconductor materials GB/T 30656 Silicon carbide single crystal polished wafer

3 Terms and Definitions

The terms and definitions defined in GB/T 14264 apply to this document.

4 principles

The non-contact resistivity test uses the principle of capacitive charge and discharge. First charge the sample instantaneously, and then use the instrument to monitor the discharge in real time In order to obtain the relaxation curve of the change, the relaxation time (τ) is obtained by mathematical analysis of the curve, and finally through The relaxation time (τ) was used to calculate the resistivity of semi-insulating SiC single crystals.

5 Test conditions

5.1 The test machine used in the test process should have no vibration, no electromagnetic interference and be well grounded. 5.2 Temperature. (23±3)℃; relative humidity (RH). 60%±20%.

6 Interfering factors

6.1 Different light intensities will affect the test results of resistivity, and the hood of the equipment should be closed during the test. 6.2 Static electricity and vibration test environment will affect the test results of resistivity, and strict shielding measures should be taken during the test. 6.3 Particle contamination on the surface of the sample, the adsorption stage and the test probe will affect the resistivity of the semi-insulating silicon carbide single wafer. Confirm that the surface of the sample, the adsorption stage and the test probe are free of large particles visible to the naked eye. 6.4 Changes in sample thickness will affect the test results of resistivity, and the sample thickness should be uniform before testing. ......

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Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of GB/T 42271-2022_English be delivered?

Answer: Upon your order, we will start to translate GB/T 42271-2022_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of GB/T 42271-2022_English with my colleagues?

Answer: Yes. The purchased PDF of GB/T 42271-2022_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.