GB/T 37983-2019 English PDF

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GB/T 37983-2019: Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 37983-2019	119	Add to Cart	3 days	Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation	Valid

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Basic data

Standard ID: GB/T 37983-2019 (GB/T37983-2019)
Description (Translated English): Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: N50
Classification of International Standard: 71.040.99
Word Count Estimation: 6,641
Date of Issue: 2019-08-30
Date of Implementation: 2020-03-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 37983-2019: Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation ICS 71.040.99 N50 National Standards of People's Republic of China Crystal material X-ray diffractometer rotation orientation testing method Published on.2019-08-30 2020-03-01 implementation State market supervision and administration China National Standardization Administration issued

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard was proposed by the Ministry of Science and Technology of the People's Republic This newspaper is under the jurisdiction of the National Instrument Analysis and Testing Standardization Technical Committee (SAC/TC481). This standard was drafted. Shaanxi Analytical Testing Association, Northwestern Polytechnical University, Xi'an University of Technology, Xi'an Jiaotong University. The main drafters of this standard. Guo Ai, Shi Xuefang, Yan Fuxue, Li Fei, Guo Zhenqi. Crystal material X-ray diffractometer rotation orientation testing method

1 Scope

This standard specifies test methods for determining the orientation of crystalline materials by using an X-ray diffractometer to rotate the sample during the test. This standard applies to the testing of crystal material orientation.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. JB/T 9400-2010 X-ray diffractometer technical conditions

3 Terms and definitions

The following terms and definitions apply to this document. 3.1 Crystal crystal A solid consisting of atoms, ions, or molecules in a periodic pattern in a three-dimensional space. 3.2 Crystal surface Through the planes of the three nodes that are not on the same line in the lattice of the crystal space. 3.3 Crystal face index The smallest integer ratio of the reciprocal of the intercept of the facet on the crystal axis of three unit lengths. 3.4 Crystallographic representation A symbolic system used to indicate the index of crystal faces and crystal orientation in a crystal. Example. crystal face (100); crystal orientation [100]. 3.5 Crystal off angle off-orientationangle The angle between the normal of the sample test surface and the normal to the crystal plane.

4 Principle of the method

4.1 Principle of X-ray diffraction of crystalline materials A crystal material arranged in a three-dimensional periodic lattice, a single crystal grain can be regarded as a parallel of atoms in a three-dimensional space with a plane spacing d Planar arrangement, when a bundle of parallel monochromatic X-rays is incident on the plane, and the optical path difference between the adjacent planes is the wavelength of the X-rays ......

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