GB/T 34612-2017 English PDF

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GB/T 34612-2017: Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 34612-2017	199	Add to Cart	3 days	Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals	Valid

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Basic data

Standard ID: GB/T 34612-2017 (GB/T34612-2017)
Description (Translated English): Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: H21
Classification of International Standard: 77.040
Word Count Estimation: 10,198
Date of Issue: 2017-10-14
Date of Implementation: 2018-05-01
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

GB/T 34612-2017: Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals ICS 77.040 H21 National Standards of People's Republic of China Sapphire crystal X - ray double crystal diffraction rocking curve Measurement methods 2017-10-14 Published 2018-05-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China China National Standardization Administration released

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard by the National Semiconductor Equipment and Materials Standardization Technical Committee (SAC/TC203) and the National Semiconductor Equipment and Materials Standards Technical Committee Sub-Technical Committee on Materials (SAC/TC203/SC2) co-sponsored and centralized. This standard was drafted by the Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai Daheng Optical Precision Machinery Co., Ltd., China Branch Institute of Physics and Technology Xinjiang Institute, Xinjiang Amethyst Optoelectronics Technology Co., Ltd., Jiangsu vast sapphire Technology Co., Ltd., Dandong New Oriental Crystal Body Instrument Co., Ltd. The main drafters of this standard. Hang Yin, Xu Min, Pan Shi Lie, Zhang Fang, Zhao Xingjian, Guo Honghe, Zhao Songbin. Sapphire crystal X - ray double crystal diffraction rocking curve Measurement methods

1 Scope

This standard specifies the sapphire crystal X-ray double crystal diffraction rocking curve measurement method. This standard applies to the measurement of sapphire crystal X-ray double crystal diffraction rocking curve.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version applies to this article Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 14264 semiconductor materials terminology

3 Terms and definitions

GB/T 14264 and defined by the following terms and definitions apply to this document. 3.1 χ axis χaxis The axis of the tilted sample is formed by the intersection of the diffraction plane formed by the incident X-ray and the diffracted X-ray beam with the sample surface. 3.2 χ angle χangle The angle between a sample surface and the sample surface. 3.3 φ angle φangle The sample stage rotates about the normal of the sample surface. 3.4 φ scan φscan Change the angle φ continuously and record the diffraction intensity measurement mode. 3.5 ω angle ωangle The angle between incident X-ray and sample surface. 3.6 ω scan ωscan Change the ω angle continuously and record the diffraction intensity measurement mode.

4 method summary

4.1 The crystal is made up of a series of parallel ions, atoms or molecular planes with a spatial spacing d. When a beam of parallel monochromatic X-rays Diffraction (reflection) takes place when this plane is entered and X-rays have an optical path difference between adjacent planes that is n times their wavelength. When incident ......

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