GB/T 33236-2016 English PDF

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GB/T 33236-2016: Polycrystalline silicon -- Determination of trace elements -- Glow discharge mass spectrometry method
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 33236-2016	279	Add to Cart	3 days	Polycrystalline silicon -- Determination of trace elements -- Glow discharge mass spectrometry method	Valid

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Basic data

Standard ID: GB/T 33236-2016 (GB/T33236-2016)
Description (Translated English): Polycrystalline silicon -- Determination of trace elements -- Glow discharge mass spectrometry method
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: G04
Classification of International Standard: 71.040.40
Word Count Estimation: 14,143
Date of Issue: 2016-12-13
Date of Implementation: 2017-11-01
Regulation (derived from): National Standard Notice No.176 of 2016
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

GB/T 33236-2016: Polycrystalline silicon -- Determination of trace elements -- Glow discharge mass spectrometry method

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Polycrystalline silicon - Determination of trace elements - Glow discharge mass spectrometry method ICS 71.040.40 G04 National Standards of People's Republic of China Chemical Analysis of Trace Elements in Polysilicon Glow discharge mass spectrometry 2016-12-13 released 2017-11-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. This standard is proposed by the National Microparraph Analysis Standardization Technical Committee (SAC/TC38). The drafting of this standard. Shanghai Institute of Ceramics, Chinese Academy of Sciences. The main drafters of this standard. Zhuo Shangjun, Qian Rong, Dong Zhenli, Shen Ruoxiang, Sheng Cheng, Gao Jie, Zheng Wenping. Chemical Analysis of Trace Elements in Polysilicon Glow discharge mass spectrometry

1 Scope

This standard specifies the use of glow discharge mass spectrometry (GD-MS) method for measuring impurity elements in polysilicon. This standard applies to polysilicon materials in addition to hydrogen and inert gas elements other than the determination of impurity element content, the measurement range is the Method of detection limit to 0.1% (mass fraction), the detection limit according to the instrument used and measurement conditions to determine. By correcting the standard sample, It is also possible to measure the impurity element content with a mass fraction greater than 0.1%. Trace impurity elements in monocrystalline silicon materials can also be measured with reference to this standard.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. GB/T 6682 Analytical laboratory water specifications and test methods ISO /T S15338..2009 Surface Chemical Analysis Glow Discharge Mass Spectrometry Introduction (Surfacechemicalanalysis- Glowdischargemassspectrometry (GD-MS) -Introductiontouse)

3 terms and definitions

The following terms and definitions apply to this document. 3.1 Ion strength The total amount of ion current of the specified element recorded by the instrument. 3.2 Needle sample sampleample Cross-section round or square needle-like, rod-like or linear sample, usually 20mm in length, cross-section diameter (round) or diagonal (Square) not more than 10mm. 3.3 Flake sample flatsample Flaky or lumpy specimens, usually circular or square, and at least one side is smooth, smooth surface can form a diameter greater than 10mm Round measuring surface. 3.4 Needle-like battery pincel A sample cell for the analysis of needle samples. 3.5 Chip Discharge Battery Flatcel A sample cell for analyzing a sheet sample. ......

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