GB/T 26827-2011 English PDF

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GB/T 26827-2011: Calibration method for measurement equipment of wave plate phase retardation
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 26827-2011	299	Add to Cart	3 days	Calibration method for measurement equipment of wave plate phase retardation	Valid

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Basic data

Standard ID: GB/T 26827-2011 (GB/T26827-2011)
Description (Translated English): Calibration method for measurement equipment of wave plate phase retardation
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: N30
Classification of International Standard: 37.020
Word Count Estimation: 13,148
Date of Issue: 2011-07-29
Date of Implementation: 2011-12-01
Quoted Standard: GB/T 13962; GB/T 15313
Regulation (derived from): Announcement of Newly Approved National Standards No. 12 of 2011
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard specifies requirements for measuring devices wave plate calibration phase delay of terms and definitions, measurement principle, calibration method and calibration. This standard applies to the various principles of wave plate phase delay calibration precision measuring devices.

GB/T 26827-2011: Calibration method for measurement equipment of wave plate phase retardation

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration method for measurement equipment of wave plate phase retardation ICS 37.020 N30 National Standards of People's Republic of China Waveplate retardation measurement apparatus calibration method Issued on. 2011-07-29 2011-12-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Table of Contents

Introduction Ⅲ 1 Scope 1 2 Normative references 1 3 Terms and definitions 4 measurement principle 2 5 Calibration Method 3 5.1 Overview 3 5.2 Calibration means 3 6 Calibration 3 6.1 absolute calibration method 3 6.2 Comparison Calibration Method 4 6.3 calibration results in the form of 5 Appendix A (informative) Calibration System description 6 A.1 laser frequency splitting theory of wave plate based on the delay reference measurement device 6 A.2 standard wave plate 8 A.3 largest quartz crystal birefringence Δnλ calculated using the table (Δnλ = ne-no calculated values \u200b\u200bat 24.8 ℃ formula obtained by the analysis) 8

Foreword

Appendix A of this standard is an informative annex. The standard proposed by China Machinery Industry Federation. This standard by the National Standardization Technical Committee photon science and optics (SAC/TC103) centralized. This standard drafting unit. Tsinghua University. The main drafters. Zhang Shu-lian, Liu Weixin, Ding Ming. Waveplate retardation measurement apparatus calibration method

1 Scope

This standard provides for the wave plate phase delay measurements for calibration of terms and definitions, measuring principle, calibration method and calibration. This standard applies to various principles of measuring wave plate phase delay means precision calibration.

2 Normative references

The following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent Amendments (not including errata content) or revisions do not apply to this standard. However, according to research encourages the parties to the agreement Study whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard. GB/T 13962 Optical Instrument term GB/T 15313 Laser term

3 Terms and Definitions

GB/T 13962, GB/T 15313 and established in the following terms and definitions apply to this standard. 3.1 Wave plate phase retardation measuring apparatus measurementequipmentofwaveplatephaseretardation The principle of using a variety of wave plate phase delay line or on-line measurement of the optical system. 3.2 Wave plate phase retardation reference measurement device benchmarkmeasurementequipmentofwaveplatephaseretardation Laser frequency splitting principle for measuring wave plate phase delay means for the calibration phase delay wave plate, the measurement result is Laser wavelength can be traced to a reference value. Wave plate phase retardation reference measurement device detailed description see A.1. 3.3 Wave plate phase retardation standard measuring device standardmeasurementequipmentofwaveplatephaseretardation From the reference phase retardation waveplate measuring apparatus calibrated waveplate delay measuring means for measuring the results of which may be delayed waveplate To be used to calibrate other waveplate delay measuring means. 3.4 Standard wave plate standardwaveplate The reference wave plate measuring means measuring the phase retardation of the wave plate. Detailed description of the standard wave plate see A.2. 3.5 Laser frequency splitting laserfrequencysplitting Single-mode standing wave helium-neon laser, since the presence of the resonant cavity birefringence, a longitudinal mode laser is split into two modes with different frequencies Oscillation phenomenon. 3.6 Mode hopping modejumping When there are two laser oscillation mode between the strong competition mode, adjust the laser cavity length, the oscillation mode turned off, Off the oscillation mode to change. 3.7 The tuning frequency difference frequencydifferencetuning Adjusting the length of the laser cavity, the frequency difference between the two periodically varying the laser frequency splitting orthogonal polarization modes generated between arise. ......

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