GB/T 23413-2009 English PDFUS$259.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 23413-2009: Determination of crystallite size and micro-strain of nano-materials -- X-ray diffraction line broadening method Status: Valid
Basic dataStandard ID: GB/T 23413-2009 (GB/T23413-2009)Description (Translated English): Determination of crystallite size and micro-strain of nano-materials -- X-ray diffraction line broadening method Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: N78 Classification of International Standard: 19.100 Word Count Estimation: 11,143 Date of Issue: 2009-04-01 Date of Implementation: 2009-12-01 Quoted Standard: GBW (E)130014; GBW (E)130016 Regulation (derived from): Announcement of Newly Approved National Standards No. 4, 2009 (No. 144 overall) Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China Summary: This standard specifies the use of X-ray diffraction method to determine the width of the grain size of nano-materials and micro- strain approach. This standard is based on calculations are approximate function method. This standard applies to the determination of grain size generally less than 100nm, microscopic strain generally not more than 0. 1% of nanomaterials. GB/T 23413-2009: Determination of crystallite size and micro-strain of nano-materials -- X-ray diffraction line broadening method---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. Determination of crystallite size and micro-strain of nano-materials. X-ray diffraction line broadening method ICS 19.100 N78 National Standards of People's Republic of China Determination of grain size and microstructure of nanomaterials strain X-ray diffraction method was linewidth Posted 2009-04-01 2009-12-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released ForewordAppendix A of this standard is a normative appendix. This standard by the National Standardization Technical Committee microbeam and focal points. This standard was drafted. Iron and Steel Research Institute, Shougang Technology Research Institute. The main drafters of this standard. Fang Jianfeng, Zheng Yi, Li Qi, Zhang Jin away, Liu Chunlan, Zhurui Zhen.IntroductionGrain size and micro-strain of nanocrystalline functional materials with electromagnetic, optical, catalytic and structural properties of the material change enhanced, strong deformation And so toughening performance has a very important impact. Therefore, standardized measurement of these two parameters for the structure of nanocrystalline materials of basic research Studies and product development has important theoretical and practical value. The majority of laboratory testing methods currently not standardized and unified, from And so the same sample a greater difference in different laboratories measured data. Currently more commonly used nanoscale grain size measurement and data processing methods microscopic strain are. approximation function method, Valencia - Ivor Bach (Warren-Averbach) Fourier analysis, variance analysis and Rietveld whole spectrum fitting and so on. According to the current most experiments The test chamber can reach the level of, and methods for determination of current literature in terms of nanocrystalline employed, the approximate function method in the standard Analytical methods as nanoscale grain size and micro-strain. Determination of grain size and microstructure of nanomaterials strain X-ray diffraction method was linewidth1 ScopeThis standard specifies the nanomaterials to determine the grain size and micro-strain line width of X-ray diffraction method approach. This standard is adopted Calculated using an approximate function method. This standard applies to the determination of the grain size is generally not more than 100nm, microscopic strain is generally not more than 0.1% of the nanomaterials.2 Normative referencesThe following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent Amendments (not including errata content) or revisions do not apply to this standard, however, encourage the parties to the agreement are based on research Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard. GB W (E) 130014 X-ray powder diffraction silicon Standards GB W (E) 130016 X-ray diffractometer with α-SiO2 Calibration Standards3 SymbolThe standard formula symbols used have the following meanings. Dhkl. along the crystal face (hkl) in the normal direction of the grain size in nanometers (nm); ε. microscopic strain, with the rms value, which indicates the degree of material within the microscopic lattice distortion; εhkl. microscopic strain along the crystal plane (hkl) in the normal direction; λ. wavelength of the incident X-rays, in units of nanometers (nm); B. hologram linear integral width radians; B0. Kα2 after peeling hologram linear integral width radians; Chou. standard sample linear diffraction integral width radians; Chou 0. standard sample after peeling Kα2 linear diffraction integral width (width of the instrument, also known as geometric or width) radians; β. Due to the physical broadening effect caused by the diffraction line broadening integral width radians; . After peeling Kα2 integrated linear diffraction half-width in radians; M1. due to diffraction line width of the integral width grain refinement caused radians; Appearance. Diffraction line width of the integral width due to the strain caused by microscopic radians; ζ. plot than half, some linear diffraction integral width and half-height width ratio; θ. Bragg (Bragg) angles, in degrees; θhkl. Prague (Bragg) angles, in degrees; M (2θ). grain size refinement by the diffraction effect of widening linear; N (2θ). widening of microscopic strain effect linear diffraction; K. with the grain shape and Miller index (hkl) related constant, and its value is close to 1, this standard is taken as 1. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 23413-2009_English be delivered?Answer: Upon your order, we will start to translate GB/T 23413-2009_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of GB/T 23413-2009_English with my colleagues?Answer: Yes. The purchased PDF of GB/T 23413-2009_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.Question 3: Does the price include tax/VAT?Answer: Yes. 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