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Delivery: <= 6 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 21636-2021: Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary Status: Valid GB/T 21636: Historical versions
Basic dataStandard ID: GB/T 21636-2021 (GB/T21636-2021)Description (Translated English): Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: G04 Word Count Estimation: 41,481 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GB/T 21636-2021: Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary ICS 01:040:71;71:040:99 CCSG04 National Standards of People's Republic of China Replacing GB/T 21636-2008 Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology Vocabulary (ISO 23833:2013, IDT) Published on 2021-12-31 2022-07-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration directory Preface III Introduction IV 1 Scope 1 2 Normative references 1 3 Abbreviations 1 4 Definition of general terms for electron probe microanalysis 1 5 DEFINITIONS OF TERMS Describing Electron Probe Microanalysis Instruments 7 6 Definitions of terms used in electron probe microanalysis methods 16 Reference 24 Index 25 forewordThis document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules of Standardization Documents" Drafting: This document replaces GB/T 21636-2008 "Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology", and GB/T 21636- Compared with:2008, Chapter 2 normative reference documents have been added: Except for structural adjustment and editorial changes, the main technical changes are as follows: a) Added some terms and definitions (see 4:5:5 and 5:6:4:5:3); b) Changed the terms and definitions of backscattered electron image, secondary electron image, absorption current image and characteristic X-ray (see 4:4:1, 5:4:2, 5:4:11, 5:4:12, 3:4:1, 4:4:2, 4:4:11, 4:4:12 of the:2008 edition); c) Changed some terms (see 5:4:7, 5:4:8, 5:5:1, 5:6:8, 5:6:14:2, 6:6:8, 4:4:7, 4:4:8, 4:5:1, 4:6:8, 4:6:14:2, 5:6:8) d) Added annotations and contents of some terms (see 4:5:5, 5:1:2, 5:2:2, 5:4:7, 5:6:2): This document is equivalent to ISO 23833:2013 "Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology": This document adds a chapter "Normative References": Please note that some content of this document may be patented: The issuing agency of this document assumes no responsibility for identifying patents: This document is proposed and managed by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38): This document was drafted by: Shanghai Institute of Ceramics, Chinese Academy of Sciences: The main drafters of this document: Zeng Yi, Li Xiangting: This document was first published in:2008 and this is the first revision:IntroductionElectron Probe Microanalysis (EPMA) is a modern technique that is widely used in the field of Microbeam Analysis (MBA): Electron Probe Microscopic analysis enables elemental analysis on the micron scale of solid materials (including metals, alloys, ceramics, glasses, minerals, polymers, powders, etc:) Qualitative, quantitative analysis and microstructural analysis have been widely used in material science, high-tech industry, basic industry, agriculture, metallurgy, geology, biotechnology, etc: materials, medicine and health, environmental protection, commodity inspection and trade, and even criminal courts: The terminology standard for each technical field is the standardization development in the field One of the prerequisites of this document is the terminology related to electron probe microscopic analysis: Electron probe microanalysis is a comprehensive technique, and its terms involve a wide range of disciplines such as physics, chemistry, and electronics: this document Limited to the definition of terms used and directly related to the standardization practice of Electron Probe Microanalysis (EPMA), including: --- Electron probe microanalysis defined in general terms; --- Definitions of terms describing Electron Probe Microanalysis Instruments; --- Definition of terms used in electron probe microanalysis methods: Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology1 ScopeThis document defines the terminology used in the practice of Electron Probe Microanalysis (EPMA), including terms of general concepts and A term for a specific concept of a method classification: This document applies to definitions of common terms in all standard and practice documents in the relevant field (SEM, AEM, EDX, etc:):2 Normative referencesThere are no normative references in this document:3 AbbreviationsThe following abbreviations apply to this document: BSE: backscattered electrons CRM: certified reference material, standard sample (certified reference material) EDS: energy-dispersivespectrometer EDX: energy-dispersiveX-rayspectrometry EPMA: Electron Probe Microanalysis Electron probe microanalyzer (electronprobemicroanalyzer) eV: electron volt (electronvolt) keV: kiloelectronvolt (kiloelectronvolt) SE: secondary electron (secondary electron) SEM: scanning electron microscope (scanning electron microscope) WDS: Wavelength-dispersivespectrometer WDX: Wavelength-dispersiveX-rayspectrometry4 Definition of general terms used in electron probe microanalysis4:1 electron probe microanalysis; EPMA According to the spectroscopic principle of X-ray excitation by the interaction between the focused electron beam and the volume of the sample at the micron to submicron scale, the electron exciter A technique for analyzing elements within a product: 4:1:1 Qualitative Electron Probe Microanalysis qualitativeEPMA Electron probe microanalysis is an electron probe microanalysis method to identify the elemental composition in the electronically excited volume of a sample by identifying the peaks of the X-ray spectrum: ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 21636-2021_English be delivered?Answer: Upon your order, we will start to translate GB/T 21636-2021_English as soon as possible, and keep you informed of the progress. 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