GB/T 17626.4-2018 PDF EnglishUS$455.00 · In stock · Download in 9 seconds
GB/T 17626.4-2018: Electromagnetic compatibility -- Testing and measurement techniques -- Electrical fast transient/burst immunity test Delivery: 9 seconds. True-PDF full-copy in English & invoice will be downloaded + auto-delivered via email. See step-by-step procedure Status: Valid GB/T 17626.4: Historical versions
Similar standardsGB/T 17626.4-2018: Electromagnetic compatibility -- Testing and measurement techniques -- Electrical fast transient/burst immunity test---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT17626.4-2018 GB NATIONAL STANDARD OF THE PEOPLE’S REPUBLIC OF CHINA ICS 33.100.20 L 06 GB/T 17626.4-2018 / IEC 61000-4-4.2012 Replacing GB/T 17626.4-2008 Electromagnetic compatibility - Testing and measurement techniques - Electrical fast transient/burst immunity test [IEC 61000-4-4.2012, Electromagnetic compatibility (EMC) - Part 4-4.Testing and measurement techniques - Electrical fast transient/burst immunity test, IDT] Issued on: JUNE 07, 2018 Implemented on: JANUARY 01, 2019 Issued by. State Administration for Market Regulation; Standardization Administration of the People's Republic of China. Table of ContentsForeword... 3 1 Scope... 7 2 Normative references... 8 3 Terms, definitions and abbreviations... 8 3.1 Terms and definitions... 8 3.2 Abbreviations... 11 4 General... 12 5 Test levels... 12 6 Test equipment... 13 6.1 Overview... 13 6.2 Burst generator... 13 6.3 Coupling/decoupling network for a.c./d.c. power port... 18 6.4 Capacitive coupling clamp... 21 7 Test setup... 24 7.1 General... 24 7.2 Test equipment... 24 7.3 Test setup for type tests performed in laboratories... 26 7.4 Test setup for in situ tests... 31 8 Test procedure... 33 8.1 General... 33 8.2 Laboratory reference conditions... 34 8.3 Execution of the test... 34 9 Evaluation of test results... 35 10 Test report... 35 Annex A (informative) Information on the electrical fast transients... 37 Annex B (informative) Selection of the test levels... 39 Annex C (informative) Measurement uncertainty (MU) considerations... 42 Bibliography... 54ForewordGB/T 17626 “Electromagnetic compatibility - Testing and measurement techniques” currently consists of the following parts. - GB/T 17626.1-2006 Electromagnetic compatibility - Testing and measurement techniques - Overview of immunity tests; - GB/T 17626.2-2018 Electromagnetic compatibility - Testing and measurement techniques - Electrostatic discharge immunity test; - GB/T 17626.3-2016 Electromagnetic compatibility - Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test; - GB/T 17626.4-2018 Electromagnetic compatibility - Testing and measurement techniques - Electrical fast transient/burst immunity test; - GB/T 17626.5-2008 Electromagnetic compatibility - Testing and measurement techniques - Surge immunity test; - GB/T 17626.6-2017 Electromagnetic compatibility - Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields; - GB/T 17626.7-2008 Electromagnetic compatibility - Testing and measurement techniques - General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto; - GB/T 17626.8-2006 Electromagnetic compatibility (EMC) - Part 4-8.Testing and measurement techniques - Power frequency magnetic field immunity test; - GB/T 17626.9-2011 Electromagnetic compatibility - Testing and measurement techniques - Pulse magnetic field immunity test; - GB/T 17626.10-2017 Electromagnetic compatibility - Testing and measurement techniques - Damped oscillatory magnetic field immunity test; - GB/T 17626.11-2008 Electromagnetic compatibility - Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests; - GB/T 17626.12-2013 Electromagnetic compatibility - Testing and measurement techniques - Ring wave immunity test; - GB/T 17626.13-2006 Electromagnetic compatibility (EMC) - Testing and measurement techniques - Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity test; - GB/T 17626.14-2005 Electromagnetic compatibility - Testing and measurement techniques - Voltage fluctuation immunity test; - GB/T 17626.15-2011 Electromagnetic compatibility - Testing and measurement techniques - Flickermeter - Functional and design specifications; - GB/T 17626.16-2007 Electromagnetic compatibility - Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz; - GB/T 17626.17-2005 Electromagnetic compatibility - Testing and measurement techniques - Ripple on d.c. input power port immunity test; - GB/T 17626.18-2016 Electromagnetic compatibility - Testing and measurement techniques - Damped oscillatory wave immunity test; - GB/T 17626.20-2014 Electromagnetic compatibility - Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguide; - GB/T 17626.21-2014 Electromagnetic compatibility - Testing and measurement techniques - Reverberation chamber test methods; - GB/T 17626.22-2017 Electromagnetic compatibility (EMC) - Testing and measurement techniques - Radiated emissions and immunity measurements in fully anechoic rooms (FARs); - GB/T 17626.24-2012 Electromagnetic compatibility - Testing and measurement techniques - Test methods for protective devices for HEMP conducted disturbance; - GB/T 17626.27-2006 Electromagnetic compatibility (EMC) - Testing and measurement techniques - Unbalance immunity test; - GB/T 17626.28-2006 Electromagnetic compatibility (EMC) - Testing and measurement techniques - Variation of power frequency, immunity test; - GB/T 17626.29-2006 Electromagnetic compatibility (EMC) - Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests; - GB/T 17626.30-2012 Electromagnetic compatibility - Testing and measurement techniques - Power quality measurement methods; - GB/T 17626.34-2012 Electromagnetic compatibility - Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase. This Part is Part 4 of GB/T 17626. This Part is drafted in accordance with the rules given in GB/T 1.1-2009. This Part replaces GB/T 17626.4-2008 “Electromagnetic compatibility - Testing and measurement techniques - Electrical fast transient/burst immunity test”. Compared with GB/T 17626.4-2008, the main technical changes are as follows. - DELETE the reference standard IEC 60050-300.2001, International Electrotechnical Vocabulary Electrical and Electronic Measurements and Measuring Instruments Part 311.General Terms Relating to Measurements; Part 312.General Terms Relating to Electrical Measurements; Part 313. Types of Electrical Measuring Instruments; Part 314.Specific Terms According to the Type of Instrument (see Clause 2); - ADD 1 term and definition (see 3.1.1); - ADD the abbreviations (see 3.2); - DELETE the main components of the test generator (see 6.2.1); - ADD Figure 3 and the calculation formula of the ideal waveform (see 6.2.2); - DELETE “Figure 3 -- Waveform of a single pulse when connected to a 50 Ω load”; ADD “Figure 3 -- Ideal waveform of a single pulse into a 50 Ω load” (see Figure 3 of 6.2.2); - ADD 6.4.2 Calibration of the capacitive coupling clamp; ADD Figure 7 and Figure 8 (see 6.4.2); - ADD 7.2.2 Verification of the test instrument (see 7.2.2); - ADD the annotation behind the capacitive coupling clamp in Figure 11 (see Figure 11); - MODIFY the test setup for equipment with elevated cable entries; ADD Figure 13 (see 7.2.2, Figure 13); - DELETE Figure 12; ADD Figure 15 (see 7.4.2, Figure 15); - ADD Annex C Measurement uncertainty (MU) considerations (see Annex C); - DELETE 1 in “unit” in Table C.1 and Table C.2 of Annex C (see Table C.1 and Table C.2 of Annex C); - MODIFY A in Table C.1 of Annex C TO α, because there is no A in Annex C (see Table C.1 of Annex C). This Part uses the translation method to be identical to IEC 61000-4-4.2012 “Electromagnetic compatibility (EMC) - Part 4-4.Testing and measurement techniques - Electrical fast transient/burst immunity test”. This Part has made the following editorial changes. - To be consistent with the existing standard series, the name of this Part is changed to “Electromagnetic compatibility - Testing and measurement techniques - Electrical fast transient/burst immunity test”. This Part was proposed by and shall be under the jurisdiction of National Technical Committee on Electromagnetic Compatibility of Standardization Administration of China (SAC/TC 246). Drafting organizations of this Part. Shanghai Institute of Process Automation & Instrumentation Co., Ltd., Shanghai Institute of Measurement and Testing Technology, China Electric Power Research Institute Co., Ltd., Shanghai Inspection and Testing Institute of Instruments and Automation Systems. Main drafters of this Part. Wang Ying, Weng Haifeng, Yu Lei, Zhang Yixiang, Gong Zeng, Li Ni, Zhou Pengcheng, Fei Jie. The previous released versions replaced by this Part are as follows. - GB/T 17626.4-1998, GB/T 17626.4-2008.1 ScopeThis Part of GB/T 17626 relates to the requirements and test methods for the immunity of electrical and electronic equipment to repetitive electrical fast transients. It additionally defines ranges of test levels and establishes test procedures.2 Normative referencesThe following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. GB/T 4365-2003 Electrotechnical terminology - Electromagnetic compatibility [IEC 60050(161).1990, IDT]3 Terms, definitions and abbreviations3.1 Terms and definitions For the purposes of this document, the terms and definitions of GB/T 4365- 2003, as well as the following apply. 3.1.1 auxiliary equipment; AE Equipment necessary to provide the equipment under test (EUT) with the signals required for normal operation and equipment to verify the performance of the EUT.4 GeneralThe repetitive fast transient test is a test with bursts consisting of a number of fast transients, coupled into power, control, signal and earth ports of electrical and electronic equipment.5 Test levelsThe preferred test levels for the electrical fast transient test, applicable to power, control, signal and earth ports of the equipment are given in Table 1.6 Test equipment6.1 Overview The calibration procedures of 6.2.3, 6.3.2 and 6.4.2 ensure the correct operation of the test generator, coupling/decoupling networks, and other items making up the test setup so that the intended waveform is delivered to the EUT. 6.2 Burst generator 6.2.1 General The simplified circuit diagram of the generator is given in Figure 1.The circuit elements Cc, Rs, Rm, and Cd are selected so that the generator delivers a fast transient under open circuit conditions and with a 50 Ω resistive load.7 Test setup7.1 General Different types of tests are defined based on test environments. - type (conformance) tests performed in laboratories; - in situ tests performed on equipment in its final installed condition.8 Test procedure8.1 General This connection shall be as short as possible. 8.2 Laboratory reference conditions 8.2.1 Climatic conditions Unless otherwise specified， the climatic conditions in the laboratory shall be within any limits specified for the operation of the EUT and the test equipment by their respective manufacturers. ......Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al. 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