GB/T 17554.1-2025 English PDF

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GB/T 17554.1-2025: Cards and security devices for personal identification - Test methods - Part 1: General characteristics
Status: Valid

GB/T 17554.1: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 17554.1-2025	999	Add to Cart	7 days	Cards and security devices for personal identification - Test methods - Part 1: General characteristics	Valid
GB/T 17554.1-2006	549	Add to Cart	4 days	Identification cards -- Test methods -- Part 1: General characteristics tests	Valid
GB/T 17554-1998	RFQ	ASK	4 days	Identification cards--Test methods	Obsolete

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Basic data

Standard ID: GB/T 17554.1-2025 (GB/T17554.1-2025)
Description (Translated English): Cards and security devices for personal identification - Test methods - Part 1: General characteristics
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L70
Classification of International Standard: 35.240.15
Word Count Estimation: 50,530
Date of Issue: 2025-02-28
Date of Implementation: 2025-09-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 17554.1-2025: Cards and security devices for personal identification - Test methods - Part 1: General characteristics

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
GB/T 17554.1-2025 English version. Cards and security devices for personal identification - Test methods - Part 1.General characteristics ICS 35.240.15 CCSL70 National Standard of the People's Republic of China Replaces GB/T 17554.1-2006 Test methods for cards and identity security devices Part 1.General characteristics Part 1.General characteristics (ISO /IEC 10373-1.2020,MOD) Released on 2025-02-28 2025-09-01 Implementation State Administration for Market Regulation The National Standardization Administration issued

Table of Contents

Preface V Introduction VII 1 Scope 1 2 Normative references 1 3 Terms, definitions and abbreviations 1 3.1 Terms and Definitions 1 3.2 Abbreviations 3 4 Defaults for test methods 3 4.1 Test Environment 3 4.2 Preprocessing 3 4.3 Test method selection 3 4.4 Default Tolerance 3 4.5 Total measurement uncertainty 3 5 Test Method 3 5.1 Card Warping 3 5.2 Card size 4 5.3 Peel strength 5 5.4 Peel strength including card edge 8 5.5 Chemical resistance 13 5.6 Card Dimensional Stability and Warpage under Temperature and Humidity Conditions 15 5.7 Adhesion or block 16 5.8 Flexural toughness 16 5.9 Dynamic bending stress 18 5.10 Dynamic torsional stress 21 5.11 Opacity 23 5.12 Ultraviolet 23 5.13 X-ray 24 5.14 Height of embossed characters 24 5.15 Heat resistance 25 5.16 Surface distortion, raised areas and sunken areas 26 5.17 Toxic and hazardous substances content 26 6 Test methods for IC cards 26 6.1 Electrical Measurement Conventions for IC Cards with Contacts 26 6.2 IC card measurement device with contacts 26 6.3 IC card with contacts, contact size and position 28 6.4 Mechanical strength of contacts 29 6.5 ESD --- Electrostatic Discharge on IC Cards with Contacts 31 6.6 ESS---Electrostatic stress on PICC and VICC 31 6.7 Surface resistance of IC card contacts with contacts 32 6.8 Surface profile of IC card contacts with contacts 33 6.9 IC card---Mechanical strength. Three rounds of test for IC cards with contacts 35 References 39 Figure 1 Warpage measurement device 4 Figure 2 Quadrant Distribution 5 Figure 3 Card preparation 6 Figure 4 Sample preparation for peel test 7 Figure 5 Sample installed in the tensile tester 7 Figure 6 Peel strength graph recording example 8 Figure 7 Stabilizing plate (top and side views) 9 Figure 8 Guide rail (end view) 9 Figure 9 Card preparation 10 Figure 10 Sample preparation for peel test 10 Figure 11 Sample and stabilizing plate installed in the tensile tester Figure 12 Example of adjacent negative and positive spikes 11 Figure 13 Peel strength graph recording example 12 Figure 14.Card 17 in the fixture before loading Figure 15.Card in the fixture during loading 17 Figure 16 Card 18 in the fixture after the load is removed Figure 17 Dynamic bending test equipment 19 Figure 18 Definition of axis 21 Figure 19 Twist test machine 22 Figure 20 Pressure cycle function 22 Figure 21.Each area for measuring light opacity 23 Figure 22 Card 25 in the clamping device before exposure to temperature Figure 23 Card 26 in clamping device after exposure to temperature Figure 24 IC card holder 27 Figure 25 Flat plate 27 Figure 26 The position of the IC card and the flat plate on the fixture 28 Figure 27 Default IC card holder and flat plate 30 with positioning template and steel ball or round tip assembly Figure 28 Positioning template 30 Figure 29 ESD test circuit 31 Figure 30 ESD test area of PICC or VICC 32 Figure 31 Test probe 33 Figure 32 Measuring probe 34 Figure 33 Measurement line 35 from C1 to C5 Figure 34 Three-round test principle 35 Figure 35 The position of the roller and the initial position of the IC card 36 Figure 36 Position of axis A, axis B and axis C 37 Figure 37 Insertion position of IC card 38 Table 1 Short-term effects of reagent 13 Table 2 Long-term effects of reagents 14 Table 3 Bending dimensions around axis A 20 Table 4 Bending dimensions around axis B 20

Foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting. This document is Part 1 of GB/T 17554.GB/T 17554 has been published in the following parts. --- Test methods for cards and identity security devices Part 1.General characteristics; --- Identification card test methods Part 2.Cards with magnetic stripe; --- Identification card test methods Part 3.Integrated circuit cards with contacts and related interface devices; --- Identification card test methods Part 7.Proximity cards. This document replaces GB/T 17554.1-2006 "Identification card test method Part 1.General characteristics test" and Compared with GB/T 17554.1-2006, in addition to structural adjustments and editorial changes, the main technical changes are as follows. --- Added terms and definitions such as "basic standard", "electrostatic discharge" and "electrostatic stress" (see 3.1.12, 3.1.13, 3.1.14); --- Deleted the terms and definitions such as "flammability", "< light> transmittance", "transmittance density" and "normal use" (see 3.12,.2006 edition) 3.13, 3.14, 3.15); --- Deleted "select the test according to the characteristics presented by the card" (see Table 1 of the.2006 edition); --- Changed "total measurement uncertainty" to "total measurement uncertainty" (see 4.5, 4.5 of the.2006 edition); --- Deleted the "flammability" and "static magnetic field" test methods (see 5.10 and 5.14 of the.2006 edition); --- Added "peel strength including card edge", "surface distortion, raised area and recessed area", "toxic and hazardous substance content" tests Methods (see 5.4, 5.16, 5.17); --- Technical improvements have been made to the dynamic bending stress calibration method, and "calibration method" has been added (see 5.9.3, 5.8 of the.2006 edition); --- Changed the "Opacity" spectral measurement range to meet the requirements of the basic standard GB/T 14916-2022 (see 5.11,.2006 Version 5.11); --- Added "Test methods for IC cards" (see Chapter 6). This document is modified to adopt ISO /IEC 10373-1.2020 "Test methods for cards and identity security devices - Part 1.General characteristics" sex". This document has the following structural adjustments compared to ISO /IEC 10373-1.2020. --- Add 5.12 (ultraviolet rays) and 5.17 (toxic and hazardous substances content), delete 3.1.12, 3.1.16, 6.8, Appendix A, Appendix B, Figure 21, Figure 22 and Figure 23; ---3.1.12 corresponds to 3.1.13 in ISO /IEC 10373-1.2020; ---3.1.13 corresponds to 3.1.14 in ISO /IEC 10373-1.2020; ---3.1.14 corresponds to 3.1.15 in ISO /IEC 10373-1.2020; ---5.13 corresponds to 5.12 in ISO /IEC 10373-1.2020; ---5.14 corresponds to 5.13 in ISO /IEC 10373-1.2020; ---5.15 corresponds to 5.14 in ISO /IEC 10373-1.2020; ---5.16 corresponds to 5.15 in ISO /IEC 10373-1.2020; ---6.8 corresponds to 6.9 in ISO /IEC 10373-1.2020; ---6.9 corresponds to 6.10 in ISO /IEC 10373-1.2020. The technical differences between this document and ISO /IEC 10373-1.2020 and their reasons are as follows. --- IEC 60749-26 (see 6.5) was replaced by the normative reference GB/T 4937.26 to adapt to my country's technical conditions; --- ISO 9227 (see 5.5) is replaced by the normative reference GB/T 10125 to adapt to my country's technical conditions; --- ISO /IEC 7810 (see 5.3.1) is replaced by the normative reference GB/T 14916 to adapt to my country's technical conditions; --- ISO /IEC 7816-1 (see 6.4.4) is replaced by the normative reference GB/T 16649.1 to adapt to my country's technical conditions; --- ISO /IEC 7816-2 (see 6.3) is replaced by the normative reference GB/T 16649.2 to adapt to my country's technical conditions; --- ISO /IEC 10373-2 (see 5.16) was replaced by the normative reference GB/T 17554.2 to adapt to my country's technical conditions; --- IEC 61000-4-2 (see 6.6.2) was replaced by the normative reference GB/T 17626.2 to adapt to my country's technical conditions; --- ISO 3696 (see 5.5) was replaced by GB/T 6682 to adapt to my country's technical conditions and included in the references; --- Deleted two terms and definitions such as "dual interface chip card" and "electrostatic discharge conductivity" (see ISO /IEC 10373-1.2020 3.1.12, 3.1.16); --- Added normative references to GB/T 39560 (all parts) to provide test for the added "toxic and hazardous substances content" requirement method; --- Deleted 3.1.2e of ISO /IEC 10373-1.2020), only memory cards have no practical application in China (see 3.1.2); ---The test method of "light blocking" has been changed to meet the requirements of the supporting basic standard GB/T 14916-2022 and meet the current domestic application status (See 5.11, 5.11 of ISO /IEC 10373-1.2020); --- Added two test methods, "ultraviolet rays" (see 5.12) and "toxic and hazardous substances content" (see 5.17), to support the basic standards Requirements for “light” and “toxicity” in GB/T 14916-2022; --- Deleted "Additional test methods for electrostatic effects" (see 6.8 of ISO /IEC 10373-1.2020). The following editorial changes were made to this document. --- Incorporated the amendments to ISO /IEC 10373-1.2020/Amd1.2023, the outer margin positions of the clauses involved It is marked with vertical double lines (‖); --- Deleted the document "ANSI/ESDA/JEDECJS-002" (see ISO /IEC 10373-1.2020) referenced in the informative appendix Chapter 2 of); --- Changed the description of abbreviations in 3.2 to comply with the requirements of national standards (see 3.2 of ISO /IEC 10373-1.2020); --- Changed the duplication of the original index number 2 in Figure 26 (see Figure 28 of ISO /IEC 10373-1.2020); --- Corrected the editorial error in the original text of 6.4.4."ISO /IEC 7810" should be "ISO /IEC 7816-1", and the corresponding national standard should be changed to It is "GB/T 16649.1" (see 6.4.4 of ISO /IEC 10373-1.2020). Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document was proposed and coordinated by the National Information Technology Standardization Technical Committee (SAC/TC28). This document was drafted by. China Electronics Technology Standardization Institute, Shenzhen CESI Technology Co., Ltd., the First Research Institute of the Ministry of Public Security, Yilianzhong Information Technology Co., Ltd., Zhongguancun Xinhai Zeyou Technology Co., Ltd., Unigroup Tongxin Microelectronics Co., Ltd., Zhuhai Hetian Electronic Technology Co., Ltd., Beijing Zhongke Zodik Electronic Technology Development Co., Ltd., Dongxin Heping Technology Co., Ltd., Jinbonda Co., Ltd., Beijing China Electronics HuaDa Electronic Design Co., Ltd., China Mobile Communications Corporation Research Institute, China Unicom Group Co., Ltd., Hong Electronics (Kunshan) Co., Ltd., Beijing Huahong Integrated Circuit Design Co., Ltd., and Zhuhai Global Times Technology Co., Ltd. The main drafters of this document are. Jin Qian, Feng Jing, Xiao Peisen, He Lan, Wang Qingzhi, Lou Shuiyong, Chen Longcong, Zhang Kunbao, Xu Muping, Qiao Shenjie, Li Mengya, Li Zheng, Cao Longtao, Li Chenguang, Shan Zhiwei, Fu Qingqin, You Xiaojun, Lin Boyan, Cheng Wenjie, Han Bo, Ye Xinwen. The previous versions of this document and the documents it replaces are as follows. ---First published as GB/T 17554-1998 in.1998 and first revised in.2006; ---This is the second revision.

Introduction

Cards and security devices for identity recognition include magnetic stripe cards, integrated circuit cards with contacts, contactless proximity cards, Contactless proximity objects, etc. For cards and identity recognition security devices with different implementation technologies, my country has successively formulated and issued relevant national Standards. GB/T 14916 "Physical characteristics of identification cards", GB/T 15120 "Recording technology of identification cards", GB/T 16649 "Collection of identification cards" GB/T 42756 "Contactless proximity objects for cards and identity recognition security devices" and GB/T 22351 "Contactless proximity objects for identification cards" The above standards specify the requirements for different implementation technologies. GB/T 17554 "Test Methods for Cards and Identity Recognition Security Equipment" is a supporting test method standard for the above technical standards. The implementation technology is planned to consist of five parts. --- Part 1.General characteristics. The purpose is to provide a standard conformity test for general characteristics of identification cards that comply with GB/T 14916. Try method. --- Part 2.Cards with magnetic stripes. The purpose is to provide standard compliance test methods for magnetic stripe cards that comply with GB/T 15120. --- Part 3.Integrated circuit cards with contacts and related interface devices. The purpose is to provide integrated circuit cards with contacts that comply with GB/T 16649 Provides standard compliance test methods for integrated circuit cards and related interface devices. --- Part 6.Non-contact proximity objects. The purpose is to provide standards for non-contact proximity objects that comply with GB/T 42756 Compliance test methods. --- Part 7.Proximity card. The purpose is to provide standard compliance test methods for proximity cards that comply with GB/T 22351. Test methods for cards and identity security devices Part 1.General characteristics

1 Scope

This document specifies the requirements for conformity with GB/T 14916 and other standards [such as GB/T 15120 (all parts), GB/T 16649 (all parts) GB/T 42756 (all parts), GB/T 22351 (all parts), etc.] for testing the general characteristics of cards and identity security equipment method. This document applies to the design, manufacture, application and testing of cards and identity security devices. NOTE 1 The criteria for the tests do not form part of this document but can be found in other national standards. NOTE 2 The test methods described in this document are intended to be performed individually. A given card is not required to pass all tests in sequence.

2 Normative references

The contents of the following documents constitute essential clauses of this document through normative references in this document. For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document. GB/T 4937.26 Mechanical and climatic test methods for semiconductor devices Part 26.Electrostatic discharge (ESD) sensitivity test Human Body Model (HBM) (GB/T 4937.26-2021, IEC 60749-26.2018, IDT) GB/T 10125 Artificial atmosphere corrosion test Salt spray test (GB/T 10125-2021, ISO 9227.2017, MOD) GB/T 14916 Physical characteristics of identification cards (GB/T 14916-2022, ISO /IEC 7810.2019, MOD) GB/T 16649.1 Identification cards Integrated circuit cards with contacts Part 1.Physical characteristics (GB/T 16649.1-2006, ISO /IEC 7816-1.1998, MOD) GB/T 16649.2 Identification cards - Integrated circuit cards with contacts - Part 2.Dimensions and positions of contacts (GB/T 16649.2- 2024,ISO /IEC 7816-2.2007,MOD) GB/T 17554.2 Identification card test method Part 2.Cards with magnetic stripe (GB/T 17554.2-2015, ISO /IEC 10373-2.2006,IDT) GB/T 17626.2 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test (GB/T 17626.2-2018, IEC 61000-4-2.2008, IDT) GB/T 39560 (all parts) Determination of certain substances in electrical and electronic products 3 Terms, definitions and abbreviations 3.1 Terms and Definitions The following terms and definitions apply to this document. 3.1.1 testmethod A method of testing the properties of a tag in order to verify that it complies with certain standards. ......

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