GB/T 16594-2008 English PDFUS$419.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 16594-2008: General rules for measurement of length in micron scale by SEM Status: Valid GB/T 16594: Historical versions
Basic dataStandard ID: GB/T 16594-2008 (GB/T16594-2008)Description (Translated English): General rules for measurement of length in micron scale by SEM Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: N53 Classification of International Standard: 71.040.99 Word Count Estimation: 18,176 Date of Issue: 2008-09-18 Date of Implementation: 2009-05-01 Older Standard (superseded by this standard): GB/T 16594-1996 Quoted Standard: JJF 1001-1998; JJF 550-1998; JJF 1059-1999; BIPM IEC IFCC ISO IUPAP OIML-1993 Regulation (derived from): Announcements of national standards in 2008 No. 16 (No. 129 overall) Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China Summary: This standard specifies the SEM measurement micron length of general principles. Suitable for measuring (0. 5-10) ��m in length. GB/T 16594-2008: General rules for measurement of length in micron scale by SEM---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.General rules for measurement of length in micron scale by SEM ICS 71.040.99 N53 National Standards of People's Republic of China Replacing GB/T 16594-1996 SEM measurement micron length General Posted 2008-09-18 2009-05-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released ForewordThis standard replaces GB/T 16594-1996 "SEM measurement micron length." This standard and GB/T 16594-1996 compared to the main changes are as follows. --- The "measuring method" to "measurement Law"; --- The "Error Analysis" to "Uncertainty Assessment"; --- Increased uncertainty generated by the sample deformation evaluation; --- Use experimental methods aimed at obtaining image measurement uncertainty values; --- Increase "Adjusting the measured length direction" Appendix. Appendix A of this standard is a normative appendix, Appendix B ~ Appendix D is an informative annex. This standard by the National Standardization Technical Committee microbeam analysis made. This standard by the National Standardization Technical Committee microbeam analysis. Drafting of this standard. Shanghai ingot Energy Technology Co., Ltd., Shanghai Polytechnic University, Shanghai Institute of Measurement and Testing Technology, with Tongji University, China Shipbuilding Industry Corporation No. 725 Institute. The main drafters of this standard. Xun Zhang Biao, Lu Desheng, Deng Baoqing, Ding Zhen Min, Liu Yue, Gao Hua, according to Xu. This standard replaces the standards previously issued as follows. --- GB/T 16594-1996. SEM measurement micron length General1 ScopeThis standard specifies the measuring SEM micron length of general principles. For measuring (0.5 ~ 10) μm in length.2 Normative referencesThe following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent Amendments (not including errata content) or revisions do not apply this standard, however, encourage the parties to reach an agreement on this standard is Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard. JJF1001-1998 common measurement terms and definitions JJG550-1988 scanning electron microscope national verification procedures JJF1059-1999 Evaluation and Expression of Uncertainty in Measurement BIPMIEC IFCCISO IUPACIUPAPOIML-1993 Guide to the Expression of Uncertainty in Measurement (GuidetotheEx- pressionofUncertaintyinMeasurement) 3 Terms and definitions, symbols, abbreviations 3.1 Terms and Definitions JJF1001-1998 determined and the following terms and definitions apply to this standard. 3.1.1 Value is sufficiently stable, precisely calibrated to obtain the measured value and its uncertainty, issued by the approval authority exists objectively length. 3.1.2 Obtain its objective existence length measured by value and uncertainty of measurement. 3.1.3 Measured the length of the carrier substance. 3.1.4 SEM magnification display itself. 3.1.5 When measuring the enlarged image, aiming uncertainty of the measured length of the marker is present. 3.1.6 Since the deformation of the material, resulting in the measured length value changes, bringing uncertainty component of measurement results. 3.1.7 Given the magnitude of reference material. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 16594-2008_English be delivered?Answer: Upon your order, we will start to translate GB/T 16594-2008_English as soon as possible, and keep you informed of the progress. 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Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.Question 5: Should I purchase the latest version GB/T 16594-2008?Answer: Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version GB/T 16594-2008 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically. |
